Investigation of Effects of Applied Voltage on Effective Young’s modulus of Ti/Au Multi-Layered Micro-Cantilevers” New Method of Damage and Failure Analysis of Structural Part

Publication Information

Title

Japanese:
English:	Investigation of Effects of Applied Voltage on Effective Young’s modulus of Ti/Au Multi-Layered Micro-Cantilevers” New Method of Damage and Failure Analysis of Structural Part

Author

Japanese:	渡邉春海, 栗岡智行, 陳君怡, Chang Tso-Fu Mark, TENNETI DEVI, 町田克之, 伊藤浩之, 三宅美博, 曽根正人.
English:	Shunkai Watanabe, Tomoyuki Kurioka, Chun-Yi Chen, Tso-Fu Mark Chang, Tenneti Devi Srujana, Katsuyuki Machida, Hiroyuki Ito, Yoshihiro Miyake, Masato Sone.

Language

English

Journal/Book name

Japanese:
English:	New Method of Damage and Failure Analysis of Structural Part

Volume, Number, Page

Published date

Oct. 14, 2024

Publisher

Japanese:
English:	CPIT2024, New Method of Damage and Failure Analysis of Structural Part

Conference name

Japanese:
English:	CPIT2024, New Method of Damage and Failure Analysis of Structural Part

Conference site

Japanese:
English:	OSTRAVA,