The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low Temperatures
著者
和文:
S. Okazaki,
N. Okazaki,
H. Sugaya,
X. Zhao,
K. Hasegawa,
P.Ahmet,
T.Chikyow,
J.Nishimura,
T.Fukumura,
M.Kawasaki,
M.Murakami,
Y.Mastumoto,
H.Koinuma,
T.Hasegawa.
英文:
S. Okazaki,
N. Okazaki,
H. Sugaya,
X. Zhao,
K. Hasegawa,
P.Ahmet,
T.Chikyow,
J.Nishimura,
T.Fukumura,
M.Kawasaki,
M.Murakami,
Y.Mastumoto,
H.Koinuma,
T.Hasegawa.
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