Direct measurement of blunt end stacking between DNA layers by atomic force microscopy: For understanding mechanisms underlying self-assembly process of DNA molecules

論文・著書情報

タイトル

和文:	Direct measurement of blunt end stacking between DNA layers by atomic force microscopy: For understanding mechanisms underlying self-assembly process of DNA molecules
英文:	Direct measurement of blunt end stacking between DNA layers by atomic force microscopy: For understanding mechanisms underlying self-assembly process of DNA molecules

著者

和文:	Taito Sekine, Naoki Kanayama, Kazunari Ozasa, Takashi Nyu, Tomohiro Hayashi, Mizuo Maeda.
英文:	Taito Sekine, Naoki Kanayama, Kazunari Ozasa, Takashi Nyu, Tomohiro Hayashi, Mizuo Maeda.

言語

English

掲載誌/書名

和文:	IUMRS-ICAM2017
英文:	IUMRS-ICAM2017

巻, 号, ページ

出版年月

2017年8月31日

出版者

和文:
英文:

会議名称

和文:
英文:	IUMRS-ICAM2017

開催地

和文:	京都市
英文:	Kyoto city