"àV–ì �G,ˆ»“c ãÄ,‹g‰ª —E�l,�V–ì �GŒ›","’á—Z“_�‡‹à‚ð—p‚¢‚½�‚‘¬‰ñ“]ŽåŽ²—pƒI�[ƒgƒoƒ‰ƒ“ƒT","‘æ9‰ñ�¶ŽY‰Á�H�E�H�ì‹@ŠB•”–å�u‰‰‰ï","‘æ9‰ñ�¶ŽY‰Á�H�E�H�ì‹@ŠB•”–å�u‰‰‰ï�u‰‰‘O�ü�W","“ú–{‹@ŠBŠw‰ï",,,"pp. 43-44",2012,Oct.
"ˆ»“c ãÄ,àV–ì �G,‹g‰ª —E�l,�V–ì �GŒ›","‚`‚e‚lƒvƒ��[ƒu‚ð—p‚¢‚½ŽOŽŸŒ³Œ`�óŒv‘ªƒVƒXƒeƒ€",,"“ú–{‹@ŠBŠw‰ï˜_•¶�W�i‚b•Ò�j","“ú–{‹@ŠBŠw‰ï","Vol. 77","No. 782","pp. 3597-3607",2011,Oct.
"Hiroshi SAWANO,Sho AYADA,Hayato YOSHIOKA,Hidenori SHINNO","A Newly Developed AFM-based Three Dimensional Profile Measuring System","11th International Conference of the European Society for Precision Engineering and Nanotechnology","Proceedings of the 11th International Conference of the European Society for Precision Engineering and Nanotechnology",,"Vol. 1",,"pp. 108-112",2011,May
"ˆ»“c ãÄ,àV–ì �G,‹g‰ª —E�l,�V–ì �GŒ›","AFMƒvƒ��[ƒu‚ð—p‚¢‚½ŽOŽŸŒ³Œ`�óŒv‘ªƒVƒXƒeƒ€","‘æ8‰ñ�¶ŽY‰Á�H�E�H�ì‹@ŠB•”–å�u‰‰‰ï","‘æ8‰ñ�¶ŽY‰Á�H�E�H�ì‹@ŠB•”–å�u‰‰‰ï�u‰‰‘O�ü�W","“ú–{‹@ŠBŠw‰ï",,,"pp. 171-172",2010,Nov.