"‘º�ã�W�_,�‚ çé—´,˜e’J�®Ž÷,–ØŒûŒ«‹I,Cross Jeffrey,ŸNˆä �C,ŽÂ�è˜a•v","PLD –@‚Å�»–Œ‚µ‚½Œu�ÎŒ^Ž_‰»•¨‚ÌŽc—¯‰ž—Í‚Ì‘ª’è‚Æ�§Œä","‘æ22‰ñ“ú–{ƒZƒ‰ƒ~ƒbƒNƒX‹¦‰ï �H‹GƒVƒ“ƒ|ƒWƒEƒ€","‘æ22‰ñ“ú–{ƒZƒ‰ƒ~ƒbƒNƒX‹¦‰ï �H‹GƒVƒ“ƒ|ƒWƒEƒ€�u‰‰—\�e�W",,,"No. 1PE03","pp. 136",2009,Sept.
"A. Murakami,H.-Y. Go,N. Wakiya,T. Kiguchi,Jeffrey Cross,O. Sakurai,K. Shinozaki","Evaluation and Control of Residual Stress in Epitaxial Fluorite-Type-Oxide Thin Films Deposited on Si Substrates by PLD","The 3rd International Conference on Science and Technology for Advanced Ceramics (STAC3).","The 3rd International Conference on Science and Technology for Advanced Ceramics (STAC3).",,,"No. 16pP045",,2009,June
"‘º�ã�W�_,˜e’J�®Ž÷,‹g‰ª•ü•F,“c’†�‡ŽO,ŽÂ�è˜a•v","SiŠî”Â�ã‚É�»–Œ‚µ‚½(001)ƒGƒsƒ^ƒLƒVƒƒƒ‹YSZ”––Œ‚ÌŽc—¯‰ž—Í‚Ì‘ª’è‚Æ�§Œä","“ú–{ƒZƒ‰ƒ~ƒbƒNƒX‹¦‰ï 2009”N”N‰ï","“ú–{ƒZƒ‰ƒ~ƒbƒNƒX‹¦‰ï 2009”N”N‰ï�u‰‰—\�e�W",,,"No. 3C17","pp. 266",2009,Mar.