"‹{“c “ÄŠó,âV“¡ ‘åŽ÷,�¯ˆä ‘ñ–ç,Žá—Ñ �®,“›ˆä ˆê�¶,Šp“ˆ –M”V","4H-SiCƒGƒsƒ^ƒLƒVƒƒƒ‹‘w‚É‚æ‚éX�üŒŸ�o‚ÉŠÖ‚·‚錟“¢","‘æ80‰ñ‰ž—p•¨—�Šw‰ï�H‹GŠw�p�u‰‰‰ï",,,,,,2019,Sept.
"D. Saito,I. Muneta,T. Hoshii,H. Wakabayashi,K. Tsutsui,H. Iwai,K. Kakushima","Reliability of SiC Schottky Diodes with Mo2C Electrode","ECS Meeting",,,,,,2018,May