"K. Tsutsui,K. Natori,T. Ogawa,T. Muro,T. Matsuishita,Y. Morikawa,T. Hoshii,K. Kakushima,H. Wakabayashi,K. Hayashi,F. Matsui,T. Kinoshita","Analyses of 3D Atomic Arrangements of Dopants in Si Crystal Using Spectro-photoelectron Holography","Material Resarch Meeing 2019 (MRM2019)",,,,,,2019,Dec.
"T. Kinoshita,T. Matsushita,T. Muro,T. Ohkochi,H. Osawa,K. Hayashi,F. Matsui,K.Tsutsui,K. Natori,Y. Morikawa,T. Hoshii,K. Kakushima,H. Wakabayashi,A. Takeda,K. Terashima,W. Hosoda,T. Fukura,Y. Yano,H. Fujiwara,M. Sunagawa,H. Kato,T. Oguchi,T. Wakita,Y. Muraoka,T. Yokoya","Status of Photoelectron Holography at SPring-8: Experimental Setup for Time- and Space-Resolved Technique and Application to Individual Atomic Imaging of Multiple Dopant Sites","T. Kinoshita, T. Matsushita, T. Muro, T. Ohkochi, H. Osawa, K. Hayashi, F. Matsui, K.Tsutsui, K. Natori, Y. Morikawa, T. Hoshii, K. Kakushima, H. Wakabayashi, A. Takeda, K. Terashima, W. Hosoda, T. Fukura, Y. Yano, H. Fujiwara, M. Sunagawa, H. Kato, T. Oguchi, T. Wakita, Y. Muraoka and T. Yokoya",,,,,,2019,Nov.
"Kazuo Tsutsui,Tomohiro Matsushita,Takayuki Muro,Yoshitada Morikawa,Kotaro Natori,Takuya Hoshii,Kuniyuki Kakushima,Hitoshi Wakabayashi,Kouichi Hayashi,Fumihiko Matsui,Toyohiko Kinoshita","3D Atomic Imaging of As Doped in Si by Spectro-Photoelectron Holography","8th International Symposium on Control of Semiconductor Interfaces (ISCSI-8)",,,,,,2019,Nov.
"筒井一生,松下智裕,室隆桂之,森川良忠,名取鼓太郎,小川達博,星井拓也,角嶋邦之,若林整,林好一,松井文彦,木下豊彦","光電子ホログラフィー法によるシリコン中にドープされた不純物の三次元原子配列構造の解析","応用物理学会シリコンテクノロジー分科会第216回研究集会",,,,,,2019,Feb.
"Toyohiko Kinoshita,Tomohiro Matsushita,Takayuki Muro,Takuo Ohkochi,Hitoshi Osawa,Kouichi Hayashi,Fumihiko Matsui,Kazuo Tsutsui,Kotaro Natori,Yoshitada Morikawa,Takuya Hoshii,Kuniyuki Kakushima,Hitoshi Wakabayashi,Aya Taked,Kensei Terashim,Wataru Hosoda,Tetsuji Fukura,Yuukou Yano,Hirohkazu Fujiwara,Masanori Sunagawa,Hiromitsu Kato,Tamio Oguchi,Takanori Wakita,Yuuji Muraoka,Takayoshi Yokoya","Status of photoelectron holography at SPring-8:Experimental setup for time- and space-resolved technique and application to individual atomic imaging of multiple dopant sites","14th Int. Conf. on Electron Spectroscopy and Structure (ICEESS-14)",,,,,,2018,Oct.
"Kazuo Tsutsui,Tomohiro Matsushita,Takayuki Muro,Yoshitada Morikawa,Kotaro Natori,Takuya Hoshii,Kuniyuki Kakushima,Hitoshi Wakabayashi,Kouichi Hayashi,Fumihiko Matsui,Toyohiko Kinoshita","Atomic Sites of Dopants in Si Visualized by Spectro-Photoelectron Holography","International Conference on Solid-State Devices and Materials (SSDM2018)",,,,,,2018,Sept.
"小川 達博,名取 鼓太郎,星井 拓也,仲武 昌史,渡辺 義夫,永山 勉,樋口 隆弘,加藤 慎一,谷村 英昭,角嶋 邦之,若林 整,筒井 一生","フラッシュランプアニールおよびポストアニールで活性/不活性化したSi中Asの軟X線光電子分光による評価","第79回応用物理学会秋季学術講演会",,,,,,2018,Sept.
"Kazuo Tsutsui,Tomohiro Matsushita,Takayuki Muro,Yoshitada Morikawa,Kotaro Natori,Takuya Hoshii,Kuniyuki Kakushima,Hitoshi Wakabayashi,Kouichi Hayashi,Fumihiko Matsui,Toyohiko Kinoshita","Analyses of 3D Atomic Arrangements of Impurity Atoms Doped in Silicon by Spectro-Photoelectron Holography Technique","Intnational Workshop on Junction Technology (IWJT2018)",,,,,,2018,Mar.
"Kotaro Natori,Tatsuhiro Ogawa,Takuya Hoshii,Tomohiro Matsushia,Takayuki Muro,Toyohiko Kinoshita,Yoshitada Morikawa,Kuniyuki Kakushima,Fumihiko Matsui,Kouichi Hayashi,Hitoshi Wakabayashi,Kazuo Tsutsui","Atomic scale analyses of As doped in Si by soft X-ray photoelectron spectroscopy and spectro-photoelectron holography","11th Int. Symp. on Atomic Level Characterization (ALC'17)",,,,,,2017,Dec.
"Kazuo Tsutsui,Tomohiro Matsushita,Kotaro Natori,Takayuki Muro,Yoshitada Morikawa,Takuya Hoshii,Kuniyuki Kakushima,Hitoshi Wakabayashi,Kouichi Hayashi,Fumihiko Matsui,Toyohiko Kinoshita","Individual Atomic Imaging of Multiple Dopant Sites in As-Doped Si Using Spectro-Photoelectron Holography",,"Nano Letters",,"Vol. 17",,"pp. 7533-7538",2017,Nov.