"Takayuki Iwasaki,Taisuke Suwa,Junya Yaita,Hiromitsu Kato,Toshiharu Makino,Masahiko Ogura,Daisuke Takeuchi,Satoshi Yamasaki,Mutsuko Hatano","Observation of Interface Defects in Diamond Lateral p-n-Junction Diodes and Their Effect on Reverse Leakage Current",,"IEEE TRANSACTIONS ON ELECTRON DEVICES",,"Vol. 64","No. 8","pp. 3298-3302",2017,July
"�z–K ‘׉î,Šâ�è �F”V,‰Á“¡ ’ˆŒõ,–q–ì �r�°,�¬‘q �­•F,’|“à ‘å•ã,ŽR? ‘�,”g‘½–ì –rŽq","�cŒ^ƒ_ƒCƒ„ƒ‚ƒ“ƒhJFET‚Ì�ì�»","‘æ63‰ñ‰ž—p•¨—�Šw‰ï�t‹GŠw�p�u‰‰‰ï",,,,,,2016,Mar.
"T. Suwa,T. Iwasaki,K. Sato,H. Kato,T Makino,M. Ogura,D. Takeuchi,S. Yamasaki,M. Hatano","Normally-Off Diamond Junction Field-Effect Transistors with Submicron Channel",,"IEEE Electron Device Lett.",,,"No. 37","pp. 209",2016,Feb.
"�z–K ‘׉î,Šâ�è �F”V,�²“¡ ˆêŽ÷,‰Á“¡ ’ˆŒõ,–q–ì �r�°,�¬‘q �­•F,’|“à‘å•ã,ŽR�è ‘�,”g‘½–ì –rŽq","ƒ_ƒCƒ„ƒ‚ƒ“ƒhJFET‚̃m�[ƒ}ƒŠ�[ƒIƒt“®�ì","‘æ62‰ñ‰ž—p•¨—�Šw‰ï�t‹GŠw�p�u‰‰‰ï",,,,,,2015,Mar.
"T. Suwa,T. Iwasaki,K. Sato,H. Kato,T. Makino,M. Ogura,D. Takeuchi,S. Yamasaki,M. Hatano","Normally-off operation of diamond junction FETs","Hasselt Diamond Workshop 2015",,,,,,2014,Feb.