"Jian Wang,Shinji Muraishi,Ji Shi,Nakamura Yoshio","Antiferromagnetic layer thickness dependence of exchange bias in sputter-deposited Co/CoO/Co trilayer","7th International Forum on Advance Materials","Abstract of the 7th International Forum on Advanced material Science and Technology","Dalian Institue of Technology, Chinese Materials Reserch Society in Japan",,,,2010,June