""Chunmeng Dou","Tomoya Shoji","Kazuhiro Nakajima","Kuniyuki Kakushima","Parhat Ahmet","Yoshinori Kataoka","Akira Nishiyama","Nobuyuki Sugii","Hitoshi Wakabayashi","Kazuo Tsutsui","Kenji Natori","Hiroshi Iwai"","Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement",,"Microelectronics Reliability",,"Vol. 54",,"pp. 725-729",2014,Apr.
"Chunmeng Dou","A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction",,,,,,,2014,Mar.
"Chunmeng Dou","A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction",,,,,,,2014,Mar.
"Chunmeng Dou","A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction",,,,,,,2014,Mar.
"Chunmeng Dou,Kakushima,Y. Kataoka,A. Nishiyama,N. Sugii,H. Wakabayashi,K. Tsutsui,K. Natori,H. Iwai","Determination of oxide traps distribution in high-k/InGaAs MOS capacitor by capacitance-voltage measurement","The Workshop on Future Trend of Nanoelectronics: WIMNACT 39",,,,,,2014,Feb.
"S. Kano,C. Dou,M. Hadi,K. Kakushima,P. Ahmet,A. Nishiyama,N. Sugii,K. Tsutsui,Y. Kataoka,K. Natori,E. Miranda,T. Hattori,H. Iwai","Influence of Electrode Material for CaOx Based Resistive Switching","China Semiconductor Technology International Conference (CSTIC)",,,,,,2012,Mar.