"H.D. Trinh,Yueh-Chin Lin,H.C. Wang,C.H. Chang,Kuniyuki KAKUSHIMA,HIROSHI IWAI,Takamasa Kawanago,Y.G. Lin,C.M. Chen,Y.Y.Wong,G.N. Huang,M. Hudait,E.Y. Chang","Effect of Postdeposition, Annealing Temperatures on Electrical Characteristics of Molecular-Beam-Deposited HfO2 on n-InAs/InGaAs Metal-Oxide-Semiconductor Capacitors",,"Applied Physics Express",,"Vol. 5","No. 2","pp. .021104-1-3",2012,Feb.
"‘D…΄‰i,Yueh-Chin Lin,Šp“ˆ–M”V,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,“›ˆδˆκΆ,™ˆδM”V,Edward Yi Chang,•ž•”Œ’—Y,Šβˆδ—m","High-k ƒQ[ƒgβ‰–Œ‚π—p‚’‚½InxGa1-xAs MOS\‘’‚ΜŒ€‹†","‘ζ56‰ρ‰ž—p•¨—ŠwŠΦŒW˜A‡u‰‰‰ο","‘ζ56‰ρ‰ž—p•¨—ŠwŠΦŒW˜A‡u‰‰‰ο—\eW","‰ž—p•¨—Šw‰ο",,"No. 2","pp. 837",2009,July