"Yang Zhao,マイマイティ マイマイティレャアティ,Kuniyuki KAKUSHIMA,パールハットアヘメト,KAZUO TSUTSUI,Akira Nishiyama,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Separation of bulk and interface traps of La-silicate on Si(100) surface","Workshop and IEEE EDS Mini-colloquium on Nanometer CMOS Technology (WIMNACT 37)",,,,,,2013,
"Yang Zhao,マイマイティ マイマイティレャアティ,Kuniyuki KAKUSHIMA,パールハットアヘメト,KAZUO TSUTSUI,Akira Nishiyama,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Separation of bulk and interface traps of La-silicate on Si(100) surface","Workshop and IEEE EDS Mini-colloquium on Nanometer CMOS Technology (WIMNACT 37)",,,,,,2013,
"Yang Zhao,マイマイティ マイマイティレャアティ,Kuniyuki KAKUSHIMA,パールハットアヘメト,KAZUO TSUTSUI,Akira Nishiyama,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Separation of bulk and interface traps of La-silicate on Si(100) surface","Workshop and IEEE EDS Mini-colloquium on Nanometer CMOS Technology (WIMNACT 37)",,,,,,2013,
"マイマイティ マイマイティレャアティ,関拓也,Kuniyuki KAKUSHIMA,Ahmet Parhat,西山彰,Nobuyuki Sugii,KAZUO TSUTSUI,Kenji Natori,takeo hattori,HIROSHI IWAI","Evaluation of oxide traps in La based oxides for direct high-k/Si capacitor","G-COE PICE International Symposium and IEEE EDS Minicolloquium on Advanced Hybrid Nano Devices: Prospects by World’s Leading Scientists",,,,,,2013,
"マイマイティ マイマイティレャアティ,久保田透,関拓也,Kuniyuki KAKUSHIMA,Ahmet Parhat,KAZUO TSUTSUI,片岡好則,西山彰,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Oxide and interface trap densities estimation in ultrathin W/ La2O3/Si MOS capacitors",,"Microelectronics Reliability",,"Vol. 52","No. 6","pp. 1039-1042",2012,June
"マイマイティ マイマイティレャアティ,Miyuki Kouda,Kuniyuki KAKUSHIMA,Hiroshi Nohira,Ahmet Parhat,片岡好則,西山彰,KAZUO TSUTSUI,Nobuyuki Sugii,KENJI NATORI,takeo hattori,HIROSHI IWAI","Valance number transition and silicate formation of cerrium oxide on Si(100)",,"Vacuum",,"Vol. 86","No. 10","pp. 1513-1516",2012,Apr.
"マイマイティ マイマイティレャアティ,Miyuki Kouda,Takamasa Kawanago,Kuniyuki KAKUSHIMA,Ahmet Parhat,KAZUO TSUTSUI,片岡 好則,西山彰,Nobuyuki Sugii,KENJI NATORI,takeo hattori,HIROSHI IWAI","The effect of remote Coulomb scattering on electron mobility in La2O3 gate stacked MOSFETs",,"Semiconductor Science and Technology",,"Vol. 27","No. 4",,2012,Mar.
"マイマイティ マイマイティレャアティ,関拓也,Kuniyuki KAKUSHIMA,パールハットアヘメト,西山彰,Nobuyuki Sugii,KAZUO TSUTSUI,Kenji Natori,takeo hattori,HIROSHI IWAI","Evaluation of oxide traps in La based oxides for direct high-k/Si capacitor","IEEE EDS MQ WIMNACT 32 C0-sponsored by EDS Japan Chapter and TIT",,,,,,2012,
"K. Tuokedaerhan,Tasuku Kaneda,マイマイティ マイマイティレャアティ,Kuniyuki KAKUSHIMA,パールハットアヘメト,KAZUO TSUTSUI,Akira Nishiyama,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Impact of Annealing Ambient for La2O3/Si Capacitor","IEEE EDS MQ WIMNACT 32 C0-sponsored by EDS Japan Chapter and TIT",,,,,,2012,
"Ahmet Parhat,来山大祐,金田翼,鈴木 拓也,Tomotsune Koyanagi,Miyuki Kouda,マイマイティ マイマイティレャアティ,Takamasa Kawanago,Kuniyuki KAKUSHIMA,KAZUO TSUTSUI,西山彰,Nobuyuki Sugii,KENJI NATORI,takeo hattori,HIROSHI IWAI","Effects of Metal Layer Insertion on EOT scaling in TiN/Metal/ La2O3 Si High ?k Gate Stacks",",219th ECS Meeting",,,,,,2011,
"Kamale Tuokedaerhan,金田翼,マイマイティ マイマイティレャアティ,角嶋邦之,パールハットアヘメト,筒井一生,西山彰,杉井信之,名取研二,服部健雄,岩井洋","La2O3/n-Si 構造に対するPost Deposition Annealの電気特性への影響","第72回応用物理学会学術講演会",,,,,,2011,
"マイマイティ マイマイティレャアティ,Kuniyuki KAKUSHIMA,Ahmet Parhat,KAZUO TSUTSUI,西山彰,Nobuyuki Sugii,KENJI NATORI,HIROSHI IWAI","Remote-surface-roughness scattering-limited electron, mobility in ultrathin high-k gate stacked MOSFETs","Taiwan-Japan Workshop on “Nano Devices”",,,,,,2011,
"Ahmet Parhat,来山大祐,金田翼,鈴木 拓也,Tomotsune Koyanagi,Miyuki Kouda,マイマイティ マイマイティレャアティ,Takamasa Kawanago,Kuniyuki KAKUSHIMA,KAZUO TSUTSUI,西山彰,Nobuyuki Sugii,KENJI NATORI,takeo hattori,HIROSHI IWAI","TiN/W/La2O3 /Si High-k Gate Stack for EOT below o.5nm","CSTIC2011",,,,,,2011,
"マイマイティ マイマイティレャアティ,角嶋邦之,パールハットアヘメト,筒井一生,西山彰,杉井信之,名取研二,服部健雄,岩井洋","High-kゲートスタックMOSFETにおける電子移動度のリモート界面ラフネス散乱依存性","第７１回応用物理学会学術講演会",,,,,,2010,Sept.
"竇 春萌,マイマイティ  マイマイティレャアティ,ダリューシュザデ,佐藤創志,角嶋邦之,パールハットアヘメト,筒井一生,西山彰,杉井信之,名取研二,服部健雄,岩井洋","希土類(Ce,Eu)酸化物MIM構造の抵抗スイッチング特性","第７１回応用物理学会学術講演会",,,,,,2010,Sept.
"マイマイティ マイマイティレャアティ,角嶋邦之,パールハットアヘメト,筒井一生,西山彰,杉井信之,名取研二,岩井洋","Remote Coulomb and roughness scatterings in gate oxide scaling","複合創造領域シンポジウム",,,,,,2010,