"K. Shubhakar,K.L. Pey,S.S. Kushvaha,S.J. O'Shea,N. Raghavan,M. Bosman,Miyuki Kouda,Kuniyuki KAKUSHIMA,HIROSHI IWAI","Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy",,"Applied Physics Letters",,"Vol. 98","No. 072902",,2011,Feb.