"Takashi Kanda,ダリューシュザデ,Y. C. Lin,Kuniyuki KAKUSHIMA,Ahmet Parhat,KAZUO TSUTSUI,西山彰,Nobuyuki Sugii,E.Y. Chang,KENJI NATORI,takeo hattori,HIROSHI IWAI","Annealing Effect on the Electrical Properties of La2O3/InGaAs MOS Capacitors","CSTIC2011",,,,,,2011,