"H.D. Trinh,G. Brammertz,E.Y. Chang,C.I. Kuo,C.Y. Lu,Y.C. Lin,H. Q. Nguyen,Y. Y. Wong,B.T. Tran,Kuniyuki KAKUSHIMA,HIROSHI IWAI","Electrical Characterization of Al2O3 /n-InAs Metal-Oxide-Semiconductor Capacitors With Various Surface Treatments",,"IEEE ELECTRON DEVICE LETTERS",,"Vol. 32","No. 6",,2011,June