"K. Takeda,Y. Fukuoka,T. Obata,J. Sailer,A. Wild,T. Kodera,K. Sawano,S. Oda,D. Bougeard,G. Abstreiter,S. Tarucha,Y Shiraki","Charge noise characterization and reduction in Si/SiGe quantum devices","31st International Conference on the Physics of Semiconductor (ICPS2012)",,,,,,2012,Aug.