"E. Mranda,Takamasa Kawanago,Kuniyuki KAKUSHIMA,J. Sune,HIROSHI IWAI","Analysis and modeling of the gate leakage current in advanced nMOSFET devices with severe gate?to-drain dielectric breakdown","ESREF2012","[588]	E. Miranda, T. Kawanago, K. Kakushima, J. Sune, H. Iwai, gAnalysis and modeling of the gate leakage current in advanced nMOSFET devices with severe gate?to-drain dielectric breakdownh,  ESREF2012, October, 2012, Cagliari, Italy",,,,,2012,