"Miranda Enrique,Takamasa Kawanago,Kuniyuki KAKUSHIMA,J. Sune,HIROSHI IWAI","Analysis and Simulation of the Postbreakdown I-V Characteristics of n-MOS Transistors in the Linear Response Regime",,"IEEE ELECTRON DEVICE LETTERS",,"Vol. 34","No. 6","pp. 798-800",2013,June