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"Yiming Lei,Hitoshi Wakabayashi,Kazuo Tsutsui,Hiroshi Iwai,Masayuki Furuhashi,Shingo Tomohisa,Satoshi Yamakaw,Kuniyuki Kakushima","Improvement of SiO2/4H-SiC Interface properties by post-metallization annealing",,"Microelectronics Reliability",,"vol. 84",,"pp. 226-229",2018,May
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