"���R����,M. Casse,R. Coquand,S. Barraud,G. Ghibaudo,HIROSHI IWAI,G. Reimbold","Influence of Technological and Geometrical Parameters on Low-frequency Noise in SOI Omega-gate Nanowire MOSFETs","2014 International Symposium on VLSI Technology, Systems and Applications(2014 VLSI-TSA)",,,,,,2014,