"M.  Mito,H. Matsui,T. Yoshida,T. Anami,K. Tsuruta,H. Deguchi,T. Iwamoto,Daisuke Terada,Y. Miyajima,N. Tsuji","Contactless electrical conductivity measurement of metallic submicron-grain material: Application to the study of aluminum with severe plastic deformation",,"Review of Scientific Instruments","AIP publishing","Volume 87","Number 5",,2016,May