"Takanori Mimura,Yuma Takahashi,Takahisa Shiraishi,Masanori Kodera,Reijiro Shimura,Keisuke Ishihama,Kazuki Okamoto,Hiroki Moriwake,Ayako Taguchi,Takao Shimizu,Yasuhiro Fujii,Akitoshi Koreeda,Hiroshi Funakubo","Phase identification of 850-nm-thick 7%YO1.5-93%HfO2 films by surface and cross-sectional Raman spectroscopies",,"ACS Applied Electronic Materials",,"Vol. 6","No. 4","pp. 2500-2506",2024,Mar.