"Hiroshi Shimomura,Kuniyuki KAKUSHIMA,HIROSHI IWAI","Equivalent Noise Temperature Representation for Scaled MOSFETs",,"IEICE TRANSACTIONS on Electronics",,"Vol. E93-C","No. 10","pp. 1550-1552",2010,Oct.
"Hiroshi Shimomura,Kuniyuki KAKUSHIMA,HIROSHI IWAI","Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs",,"IEICE TRANSACTIONS on Electronics",,"Vol. E93-C","No. 5","pp. 678-684",2010,May