"H. Nishida,T. Hoshii,H. Wakabayashi,K. Tsutsui,K. Kakushima","A simulation study on the transient leakage current analysis of a GaN epitaxial layer","Electrochemical Society (ECS) PRIME 2020",,,,,,2020,Oct.
"�¼“c �@Žj,�¯ˆä ‘ñ–ç,•Ð‰ª Š°–¾,“›ˆä ˆê�¶,Šp“ˆ –M”V,Žá—Ñ �®","ƒXƒeƒbƒv“dˆ³ˆó‰ÁŽž‚̉ߓn“d—¬‘ª’è‚É‚æ‚éGaN’†‚̃gƒ‰ƒbƒv–§“x•]‰¿","‘æ80‰ñ‰ž—p•¨—�Šw‰ï�H‹GŠw�p�u‰‰‰ï",,,,,,2019,Sept.