@inproceedings{CTT100607559,
  author = {Takumi Uezono and Tomoyuki Takahashi and Michihiro Shintani and Kazumi Hatayama and Kazuya Masu and Hiroyuki Ochi and Takashi Sato},
  title = {Scan Based Process Parameter Estimation Through Path-Delay Inequalities},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}

@inproceedings{CTT100592695,
  author = {Tomoyuki Takahashi and Takumi Uezono and Michihiro Shintani and Kazuya Masu and Takashi Sato},
  title = {On-die parameter extraction from path-delay measurements},
  booktitle = {2009 IEEE Asian Solid-State Circuits Conference},
  year = 2009,
}

@inproceedings{CTT100604868,
  author = {Michihiro Shintani and Takumi Uezono and Tomoyuki Takahashi and Hiroyuki Ueyama and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu},
  title = {An Adaptive Test for Parametric Faults Based on Statistical Timing Information},
  booktitle = {IEEE Asian Test Symposium},
  year = 2009,
}

@inproceedings{CTT100604892,
  author = {高橋知之 and 上薗巧 and 越智裕之 and 益一哉 and 佐藤高史},
  title = {パス遅延測定によるチップ特性の推定手法},
  booktitle = {DAシンポジウム},
  year = 2009,
}

@inproceedings{CTT100590958,
  author = {新谷 道広 and 高橋 知之 and 植山 寛之 and 上薗 巧 and 佐藤 高史 and 畠山 一実 and 相京 隆 and 益 一哉},
  title = {統計的タイミング情報に基づく適応型テスト},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100590959,
  author = {上薗 巧 and 高橋 知之 and 植山 寛之 and 新谷 道広 and 佐藤 高史 and 益 一哉},
  title = {適応型テストにおけるクリティカルパスのクラスタリング手法},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100570735,
  author = {高橋知之 and 植山寛之 and 萩原 汐 and 佐藤高史 and 益 一哉},
  title = {論理セル遅延の電圧・プロセスばらつき感度の検討},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}