@article{CTT100675005,
  author = {Kay Domen and Takaya Miyase and Katsumi Abe and Hideo Hosono and Toshio Kamiya},
  title = {Positive Gate Bias Instability Induced by Diffusion of Neutral Hydrogen in Amorphous In–Ga–Zn–O Thin-Film Transistor},
  journal = {IEEE Electron Dev. Lett.},
  year = 2014,
}

@article{CTT100677104,
  author = {Takaya Miyase and Ken Watanabe and Isao Sakaguchi and Naoki Ohashi and Kay Domen and Kenji Nomura and Hidenori Hiramatsu and Hideya Kumomi and Hideo Hosono and Toshio Kamiya},
  title = {Roles of Hydrogen in Amorphous Oxide Semiconductor In-Ga-Zn-O: Comparison of Conventional and Ultra-High-Vacuum Sputtering},
  journal = {ECS J. Solid State Sci. Technol.},
  year = 2014,
}

@article{CTT100680966,
  author = {K. Domen and T. Miyase and K. Abe and H. Hosono and T. Kamiya},
  title = {Positive-Bias Stress Test on Amorphous In–Ga–Zn–O Thin Film Transistor: Annealing-Temperature Dependence},
  journal = {J. Displ. Technol.},
  year = 2014,
}