論文

• M. Nishizawa, T. Hoshii, H. Wakabayashi, K. Tsutsui, Yoshiaki Daigo, Ichiro Mizushima, T. Yoda, K. Kakushima. Minority carrier lifetime extraction methodology based on parallel pn diodes with a field plate, Japanese Journal of Applied Physics, Vol. 61, SH1011, June 2022.

国際会議発表 (査読有り)

• Mitsuki Nishizawa, T. Hoshii, H. Wakabayashi, K. Tsutsui, I. Mizushima, T. Yoda, K. Kakushima. Introduction of surface field-plate for accurate minority carrier lifetime estimation of 4H-SiC epitaxial layer, International Workshop on Dielectric Thin Films for Futre Electron Devices -Science and Technology-, Nov. 2021.

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