@article{CTT100582521,
  author = {Kazuya Masu and Noboru Ishihara and Noriaki Nakayama and Takashi Sato and Shuhei  Amakawa},
  title = {Physical design challenges to nano-CMOS circuits},
  journal = {IEICE Electronics Express (ELEX)},
  year = 2009,
}

@article{CTT100575058,
  author = {Shiho Hagiwara and Takashi Sato and Kazuya Masu},
  title = {Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2009,
}

@article{CTT100575061,
  author = {Koh Yamanaga and Takashi Sato and Kazuya Masu},
  title = {2-Port Modeling Technique for Surface-Mount Passive Components Using Partial Inductance Concept},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2009,
}

@article{CTT100575059,
  author = {Takumi Uezono and Takashi Sato and Kazuya Masu},
  title = {One-Shot Voltage-Measurement Circuit Utilizing Process Variation},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2009,
}

@article{CTT100570703,
  author = {Kenta Yamada and Takashi Sato and Noriaki Nakayama and Shuhei Amakawa and Kazuya Masu},
  title = {Layout-aware compact model of MOSFET characteristics variations induced by STI stress},
  journal = {IEICE Transactions on Electronics},
  year = 2008,
}

@article{CTT100564771,
  author = {Shiho Hagiwara and Takumi Uezono and Takashi Sato and Kazuya Masu},
  title = {Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2008,
}

@article{CTT100570704,
  author = {Masanori Imai and Takashi Sato and Noriaki Nakayama and Kazuya Masu},
  title = {An evaluation method for the number of Monte Carlo STA trials},
  journal = {IEICE Transactions on Fundamentals},
  year = 2008,
}

@inproceedings{CTT100589434,
  author = {K. Yamanaga and S. Amakawa and T. Sato and K. Masu},
  title = {Two-Dimentional Moment Method for Analyzing Current Distribution of a Ceramic Capacitor},
  booktitle = {2009 International Symposium on Electromagnetic Comptibility},
  year = 2009,
}

@inproceedings{CTT100577064,
  author = {伊達貴徳 and 萩原 汐 and 上薗 巧 and 佐藤高史 and 益 一哉},
  title = {SRAM回路の構造的対称性を考慮した2段階学習型重点的サンプリング},
  booktitle = {VLSI設計技術研究会 システム設計及び一般，信学技報},
  year = 2009,
}

@inproceedings{CTT100575048,
  author = {S. Amakawa and K. Yamanaga and H. Ito and T. Sato and N. Ishihara and K. Masu},
  title = {S-parameter-based modal decomposition of multiconductor transmission lines and its application to de-embedding},
  booktitle = {International Conference on Microelectronic Test Structures (ICMTS)},
  year = 2009,
}

@inproceedings{CTT100590959,
  author = {上薗 巧 and 高橋 知之 and 植山 寛之 and 新谷 道広 and 佐藤 高史 and 益 一哉},
  title = {適応型テストにおけるクリティカルパスのクラスタリング手法},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100590958,
  author = {新谷 道広 and 高橋 知之 and 植山 寛之 and 上薗 巧 and 佐藤 高史 and 畠山 一実 and 相京 隆 and 益 一哉},
  title = {統計的タイミング情報に基づく適応型テスト},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100590951,
  author = {山長 功 and 高橋 亮 and 萩原 汐 and 佐藤 高史 and 益 一哉},
  title = {状態依存性解析のための電源間容量のテーブルルックアップ計算},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100590950,
  author = {萩原 汐 and 高橋 亮 and 山長 功 and 佐藤 高史 and 益 一哉},
  title = {状態依存性を考慮した論理回路の電源間容量モデルの検討},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100575054,
  author = {山田健太 and 庄 俊之 and 國清辰也 and 庄 俊之 and 益 一哉 and 中山範明 and 佐藤高史 and 天川修平 and 吉村尚郎 and 伊藤 優 and 熊代成孝},
  title = {STIストレスによるMOSFET特性変動のコンパクトモデル},
  booktitle = {2009年（平成21年）第56回応用物理学関係連合講演会},
  year = 2009,
}

@inproceedings{CTT100570705,
  author = {Takashi Sato and Koh Yamanaga and Kazuya Masu},
  title = {Non-invasive direct probing for on-chip voltage measurement},
  booktitle = {International SoC design conference (ISOCC)},
  year = 2008,
}

@inproceedings{CTT100575055,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation},
  booktitle = {IEEE Asian solid-state circuit conference (ASSCC)},
  year = 2008,
}

@inproceedings{CTT100570706,
  author = {Noriaki Nakayama and Takashi Sato and Hiroyuki Ueyama and Kazuya Masu},
  title = {An efficient extraction of random and systematic gate-length variation through poly-Si resistor measurement},
  booktitle = {Workshop on test structure design for variability characterization},
  year = 2008,
}

@inproceedings{CTT100570708,
  author = {Koh Yamanaga and Takashi Sato and Kazuya Masu},
  title = {Accurate parasitic inductance determination of a ceramic capacitor through 2-port measurements},
  booktitle = {17th Conference on Electrical Performance of Electronic Packaging (EPEP)},
  year = 2008,
}

@inproceedings{CTT100570733,
  author = {高橋亮 and 山長功 and 佐藤高史 and 益一哉},
  title = {CMOS論理回路における電源網容量の入力状態依存性についての検討},
  booktitle = {電子情報通信学会ソサエティ大会},
  year = 2008,
}

@inproceedings{CTT100570732,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {抵抗測定法によるトランジスタアレイ回路の測定時間短縮化},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570734,
  author = {伊達貴徳 and 萩原 汐 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {回路特性ばらつき解析に対する重点的サンプリングの適用検討},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570735,
  author = {高橋知之 and 植山寛之 and 萩原 汐 and 佐藤高史 and 益 一哉},
  title = {論理セル遅延の電圧・プロセスばらつき感度の検討},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570716,
  author = {Masanori Imai and Takashi Sato and Noriaki Nakayama and Kazuya Masu},
  title = {Non-Parametric StatisticalStatic TimingAnalysis: An SSTA Framework for Arbitrary Distribution},
  booktitle = {45th Design Automation Conference (DAC)},
  year = 2008,
}

@inproceedings{CTT100570720,
  author = {Koh Yamanaga and Takashi Sato and Masu Kazuya},
  title = {On-chip differential and common mode voltage measurement using off-chip referenced twin probing},
  booktitle = {12th SPI},
  year = 2008,
}

@inproceedings{CTT100570719,
  author = {Koh Yamanaga and Takashi Sato and Masu Kazuya},
  title = {Substrate-geometry aware 2-port modeling for surface-mount passive components},
  booktitle = {Asia-Pacific EMC Week 2008},
  year = 2008,
}

@inproceedings{CTT100575040,
  author = {萩原汐 and 佐藤高史 and 益 一哉},
  title = {電源遮断回路におけるパス遅延時間ばらつきの計算},
  booktitle = {第21回 回路とシステム軽井沢ワークショップ},
  year = 2008,
}

@inproceedings{CTT100570737,
  author = {上薗巧 and 佐藤高史 and 益 一哉},
  title = {プロセスばらつきの積極的活用による非繰返し電圧波形の測定},
  booktitle = {第21回 回路とシステム軽井沢ワークショップ},
  year = 2008,
}

@inproceedings{CTT100570739,
  author = {山長功 and 佐藤高史 and 益 一哉},
  title = {基板実装状態を考慮可能な表面実装型受動部品の2ポートモデリング手法},
  booktitle = {第21回 回路とシステム軽井沢ワークショップ},
  year = 2008,
}

@inproceedings{CTT100554527,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {リーク電流測定用トランジスタアレイ回路の測定},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100570749,
  author = {益一哉 and 萩原 汐 and 佐藤 高史},
  title = {電源遮断回路におけるインバータ列遅延時間ばらつきの計算},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100570748,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {リーク電流測定用トランジスタアレイ回路の測定},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100570743,
  author = {山長功 and 佐藤高史 and 益 一哉},
  title = {測定系の侵襲性を定量化可能なオンチップ電源電圧変動の直接測定手法},
  booktitle = {電子情報通信学会総合大会},
  year = 2008,
}

@inproceedings{CTT100570723,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Determination of optimal polynomial regression function to decompose on-die systematic and random variations},
  booktitle = {ACM/IEEE Asia South Pacific Design Automation Conference (ASPDAC)},
  year = 2008,
}

@inproceedings{CTT100544514,
  author = {萩原汐 and 佐藤高史 and 益一哉},
  title = {パワーゲーティング技術における製造ばらつきの回路特性への影響},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544511,
  author = {上薗巧 and 佐藤高史 and 益一哉},
  title = {電源電圧降下の時間的・空間的広がり可視化回路},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544509,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {大域ばらつきの近似次数が回路遅延ばらつきに与える影響},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544499,
  author = {上薗巧 and 佐藤高史 and 益一哉},
  title = {電源電圧降下の時間的・空間的広がり可視化手法},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544498,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {閾値電圧の大域ばらつきが回路遅延ばらつきに与える影響},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544462,
  author = {Takashi Sato and Shiho Hagiwara and Takumi Uezono and Kazuya Masu},
  title = {Weakness identification for effective repair of power distribution network},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544495,
  author = {今井 正紀 and 佐藤 高史 and 中山 範明 and 益 一哉},
  title = {ノンパラメトリック統計的タイミング解析 (SSTA) の実現手法の検討},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544490,
  author = {萩原汐 and 上薗巧 and 佐藤高史 and 益 一哉},
  title = {相関係数にもとづく回帰分析の電源改善への適用},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544492,
  author = {今井正紀 and 佐藤 高史 and 中山 範明 and 益 一哉},
  title = {統計的パス遅延解析のためのMonte Carlo STA実行数評価の一手法},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544480,
  author = {萩原 汐 and 上薗 巧 and 佐藤 高史 and 益 一哉},
  title = {電源電圧降下の相関を用いる電源網の定量的評価},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544457,
  author = {Takashi Sato and Takumi Uezono and Shiho Hagiwara and Kenichi Okada and Shuhei Amakawa and Noriaki Nakayama and Kazuya Masu},
  title = {A MOS transistor-array for accurate measurement of subthreshold leakage variation},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544455,
  author = {Shuhei Amakawa and Takumi Uezono and Takashi Sato and Kenichi Okada and Kazuya Masu},
  title = {Adaptable wire-length distribution with tunable occupation probability},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544454,
  author = {Shiho Hagiwara and Takumi Uezono and Takashi Sato and Kazuya Masu},
  title = {Improvement of power distribution network using correlation-based regression analysis},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544481,
  author = {天川 修平 and 上薗 巧 and 佐藤 高史 and 益 一哉},
  title = {セル間接続方向限定性とセル配置粗密性を考慮した配線長分布},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544453,
  author = {Junki Seita and Hiroyuki Ito and Kenichi Okada and Takashi Sato and Kazuya Masu},
  title = {A Multi-Drop Transmission-Line Interconnect in Si LSI},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100508205,
  author = {Jang-Gu Kim and Kenichi Okada and Tackya Yammouch and Takashi Sato and Kazuya Masu},
  title = {An Left Handed Material on Si CMOS Chip with Wafer Level Package Process},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508222,
  author = {藤久 雄己 and 岡田 健一 and 佐藤 高史 and 中山 範明 and 益 一哉},
  title = {MOSFETのサブスレッショルド電流ばらつき測定のための回路検討},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508216,
  author = {Takashi Sato and Yu Matsumoto and Koji Hirakimoto and Michio Komoda and Junichi Mano},
  title = {A Time-Slicing Ring Oscillator for Capturing Instantaneous Delay Degradation and Power Supply Voltage Drop},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508239,
  author = {萩原汐 and 佐藤高史 and 益一哉},
  title = {高精度デバイスばらつき測定のための電源構造の設計},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508236,
  author = {上薗巧 and 佐藤高史 and 益一哉},
  title = {リングオシレータを用いる瞬時電圧降下測定手法の精度改善},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508231,
  author = {金 章九 and 山内拓弥 and 岡田健一 and 佐藤高史 and 益 一哉},
  title = {Si CMOSチップにおける右手・左手系伝送線路の検討},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508230,
  author = {藤久 雄己 and 上薗 巧 and 萩原汐 and 岡田健一 and 佐藤高史 and 中山範明},
  title = {MOSFETのリーク電流ばらつき測定のための回路検討},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508229,
  author = {清田 淳紀 and 伊藤 浩之 and 岡田 健一 and 佐藤 高史 and 益 一哉},
  title = {伝送線路を用いたオンチップ高速信号伝送回路の研究},
  booktitle = {},
  year = 2006,
}

@inproceedings{CTT100508228,
  author = {萩原汐 and 佐藤高史 and 益一哉},
  title = {デバイスばらつき測定用電源構造の改善},
  booktitle = {},
  year = 2006,
}

@misc{CTT100596506,
  author = {Takashi Sato},
  title = {},
  year = ,
}



@phdthesis{CTT100596506,
  author = {Takashi Sato},
  title = {},
  school = {京都大学},
  year = ,
}