@article{CTT100592704,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Accurate array-based measurement for subthreshold-current of MOS},
  journal = {IEEE Journal of Solid-State Circuits},
  year = 2009,
}

@article{CTT100582521,
  author = {Kazuya Masu and Noboru Ishihara and Noriaki Nakayama and Takashi Sato and Shuhei  Amakawa},
  title = {Physical design challenges to nano-CMOS circuits},
  journal = {IEICE Electronics Express (ELEX)},
  year = 2009,
}

@article{CTT100570703,
  author = {Kenta Yamada and Takashi Sato and Noriaki Nakayama and Shuhei Amakawa and Kazuya Masu},
  title = {Layout-aware compact model of MOSFET characteristics variations induced by STI stress},
  journal = {IEICE Transactions on Electronics},
  year = 2008,
}

@article{CTT100570704,
  author = {Masanori Imai and Takashi Sato and Noriaki Nakayama and Kazuya Masu},
  title = {An evaluation method for the number of Monte Carlo STA trials},
  journal = {IEICE Transactions on Fundamentals},
  year = 2008,
}

@article{CTT100609531,
  author = {Shin-ichi Nishimura and Shogo Hayase and Ryoji Kanno and Masatomo Yashima and Noriaki Nakayama and Atsuo Yamada},
  title = {Structure of Li2FeSiO4},
  journal = {J. Am. Chem. Soc.},
  year = 2008,
}

@inproceedings{CTT100607561,
  author = {Takashi Sato and Takumi Uezono and Noriaki Nakayama and Kazuya Masu},
  title = {Decomposition of Drain-Current Variation Into Gain-Factor and Threshold Voltage Variations},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}

@inproceedings{CTT100612252,
  author = {Shin-ichi NISHIMURA and Shogo HAYASE and Ryoji KANNO and Masatomo YASHIMA and Noriaki NAKAYAMA and Atsuo YAMADA},
  title = {Crystal Structure of Li2MSiO4 (M = Fe, Mn)},
  booktitle = {},
  year = 2009,
}

@inproceedings{CTT100575054,
  author = {山田健太 and 庄 俊之 and 國清辰也 and 庄 俊之 and 益 一哉 and 中山範明 and 佐藤高史 and 天川修平 and 吉村尚郎 and 伊藤 優 and 熊代成孝},
  title = {STIストレスによるMOSFET特性変動のコンパクトモデル},
  booktitle = {2009年（平成21年）第56回応用物理学関係連合講演会},
  year = 2009,
}

@inproceedings{CTT100570706,
  author = {Noriaki Nakayama and Takashi Sato and Hiroyuki Ueyama and Kazuya Masu},
  title = {An efficient extraction of random and systematic gate-length variation through poly-Si resistor measurement},
  booktitle = {Workshop on test structure design for variability characterization},
  year = 2008,
}

@inproceedings{CTT100575055,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation},
  booktitle = {IEEE Asian solid-state circuit conference (ASSCC)},
  year = 2008,
}

@inproceedings{CTT100570734,
  author = {伊達貴徳 and 萩原 汐 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {回路特性ばらつき解析に対する重点的サンプリングの適用検討},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570732,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {抵抗測定法によるトランジスタアレイ回路の測定時間短縮化},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570716,
  author = {Masanori Imai and Takashi Sato and Noriaki Nakayama and Kazuya Masu},
  title = {Non-Parametric StatisticalStatic TimingAnalysis: An SSTA Framework for Arbitrary Distribution},
  booktitle = {45th Design Automation Conference (DAC)},
  year = 2008,
}

@inproceedings{CTT100554527,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {リーク電流測定用トランジスタアレイ回路の測定},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100570748,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {リーク電流測定用トランジスタアレイ回路の測定},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100570723,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Determination of optimal polynomial regression function to decompose on-die systematic and random variations},
  booktitle = {ACM/IEEE Asia South Pacific Design Automation Conference (ASPDAC)},
  year = 2008,
}

@inproceedings{CTT100544509,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {大域ばらつきの近似次数が回路遅延ばらつきに与える影響},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544498,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {閾値電圧の大域ばらつきが回路遅延ばらつきに与える影響},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544495,
  author = {今井 正紀 and 佐藤 高史 and 中山 範明 and 益 一哉},
  title = {ノンパラメトリック統計的タイミング解析 (SSTA) の実現手法の検討},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544492,
  author = {今井正紀 and 佐藤 高史 and 中山 範明 and 益 一哉},
  title = {統計的パス遅延解析のためのMonte Carlo STA実行数評価の一手法},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544457,
  author = {Takashi Sato and Takumi Uezono and Shiho Hagiwara and Kenichi Okada and Shuhei Amakawa and Noriaki Nakayama and Kazuya Masu},
  title = {A MOS transistor-array for accurate measurement of subthreshold leakage variation},
  booktitle = {},
  year = 2007,
}