論文

• Takahisa Shiraishi, Hiro Einishi, Takao Shimizu, Hiroshi Funakubo, Minoru Kurosawa, Hiroshi Uchida, Nobuhiro Kumada, Takanori Kiguchi, Toyohiko J. Konno. Crystal Structure and Compositional Analysis of Epitaxial (K0.56Na0.44)NbO3 Films Prepared by Hydrothermal Method, J. Mater. Res., Vol. 31, pp. 693-701, Mar. 2016.
• Junichi Kimura, Mohamed-Tahar Chentir, Takao Shimizu, Hiroshi Uchida, Hiroshi Funakubo. Simultaneous achievement of high dielectric constant and low temperature dependence of capacitance in (111)-oriented BaTiO3-Bi(Mg0.5Ti0.5)O3-BiFeO3 solid solution thin films, AIP ADVANCES, Vol. 6, pp. 015304-1-7, Jan. 2016.
• Hidenori Tanaka, Mohamed-Tahar Chentir, Tomoaki Yamada, Shintaro Yasui, Yoshitaka Ehara, Keisuke Yamato, Yuta Kashiwagi, Chua Ngeah Theng, Junling Wang, Soichiro Okamura, Hiroshi Uchida, Takashi Iijima, Satoshi Wada, Hiroshi Funakubo. Growth of (111)-oriented BaTiO3-Bi(Mg0.5Ti0.5)O3 epitaxial films and their crystal structure and electrical property characterizations, J. Appl. Phys., Vol. 111, pp. 084108, 2012.
• Takahisa Shiraishi, Hiro Einishi, Shintaro Yasui, Mutsuo Ishikawa, Tomohito Hasegawa, Minoru Kurosawa, Hiroshi Uchida, Yukio Sakashita, Hiroshi Funakubo. Growth of Epitaxial {100}-Oriented KNbO3–NaNbO3 Solid Solution Films on (100)cSrRuO3// (100)SrTiO3 by Hydrothermal Method and Their Characterization, Jpn. J. Appl. Phys., vol. 50, no. 9, pp. 09ND11-1-4, Sept. 2011.
• Yuki Mizutani, Junichi Kimura, Itaru Takuwa, Tomoaki Yamada, Hiroshi Funakubo, Hiroshi Uchida. Dielectric Proeprties of Bisumth Layer-Structured Oxide Thin Films with Preferential Crystal Orientation at High temperature, Key Eng. Mater., Vol. 485, pp. 191-194, 2011.
• M. Hayashi, S. Yasui, H. Funakubo, H. Uchida. Preferential Crystal Growth of (100)-oriented BiFeO3 Films on Si Substrate, Materials Science and Engineering, Vol. 18, pp. 092033-1-4, 2011.
• Y. Kamimura, B.-Y. Lee, K. Yazawa, H. Funakubo, T.Iijima, H. Uchida. Fabrication and Evaluation of Mn-Substituted Ba(Cu1/3Nb2/3)O3 Ceramics, Materials Science and Engineering, Vol. 18, pp. 092038-1-4, 2011.
• Yohta Kondoh, Keiichi Sasajima, Mari Hayashi, Junichi Kimura, Itaru Takuwa, Yoshitaka Ehara, Hiroshi Funakubo, Hiroshi Uchida. Crystal Orientation Control of Bismuth Layer-Structured Dielectric Films Using Interface Layers of Perovskite-Type Oxides, Jpn. J. Appl. Phys., Vol. 50, pp. 09NA04-1-5, 2011.
• Yuki Mizutani, Takanori Kiguchi, Toyohiko J. Konno, Hiroshi Funakubo, Hiroshi Uchida. Crystal Structure and Dielectric Property of Bismuth Layer-Structured Dielectric Films with c-axis Preferential Crystal Orientation, Jpn. J. Appl. Phys., Vol. 499(9), pp. 09MA02-1-6, 2010.
• Yuki Mizutani, Hiroshi Uchida, Hiroshi Funakubo, Seiichiro Koda. Dielectric Properties of Highly (001)-plane Oriented SrBi4Ti4O15 Thin Films, Key Eng. Mater., Vol. 445, pp. 131-134, 2010.
• Yuki Mizutani, Hiroshi Uchida, Hiroshi Funakubo, Seiichiro Koda. One-axis Oriented CaBi4Ti4O15 and SrBi4Ti4O15 Films Prepared on Silicon Wafer by Chemical Solution Deposition Technique, Mater. Res. Soc. Symp. Proc., Vol. 1199, pp. 1199-F03-14, 2010.
• Keisuke Yazawa, Shintaro Yasui, Hitoshi Morioka, Tomoaki Yamada, Hiroshi Uchida, Alexei Gruverman, Hiroshi Funakubo. Composition dependence of crystal structure and electrical properties for epitaxial films of Bi(Zn1/2Ti1/2)O3 - BiFeO3 solid solution system, J. Ceram. Soc. Jpn., Vol. 118, No. 8, pp. 659 - 663, 2010.
• Satoru Utsugi, Yoshitaka Ehara, Hidenori Tanaka, Tomoaki Yamada, Hiroshi Funakubo, Hiroshi Uchida. Growth of polar axis -oriented tetragonal Pb(Zr,Ti)O3 films on CaF2 substrates with transparent (La0.07Sr0.93)SnO3, J.Crystal Growth, Vol. 312, pp. 3127-3130, 2010.
• Keisuke Yazawa, Shintaro Yasui, Masaaki Matsushima, Hiroshi Uchida, Hiroshi Funakubo. MOCVD growth and characterization of BiFeO3-Bi(Zn 1/2Ti1/2)O3 ferroelectric films, Mater. Sci. Eng. B: Solid-State Mater. Adv. Tech., Vol. 173(1-3), pp. 14 – 17, 2010.
• Shintaro Yasui, Keisuke Yazawa, Tomoaki Yamada, Ken Nishida, Hiroshi Uchida, Masaki Azuma, Hiroshi Funakubo. Effect of film thickness and crystal orientation on the constituent phase in epitaxial BiFeO3-BiCoO3 films grown on SrTiO3 substrates, Jpn. J. Appl. Phys., Vol. 49(9), pp. 09MB04-1-5, 2010.
• Yuki Mizutani, Hiroshi Uchida, Hiroshi Funakubo, Seiichiro Koda. Preparation of (001)-Oriented CaBi4Ti4O15 and SrBi4Ti4O15 Films Using LaNiO3 Nucleation Layer on Pt-passivated Si Wafer, Jpn. J. Appl. Phys., Vol. 48, pp. 09KA10-1-4, 2009.
• Hiroshi Funakubo, Shingo Okaura, Muneyasu Suzuki, Hiroshi Uchida, Seiichiro Koda. Effect of the Annealing Temperature on Dielectric Properties of Bi1.5Zn1.0Nb1.5O7 Films Prepared by MOCVD, Key Eng. Mater., Vol. 388, pp. 175-178, 2009.
• Takayuki Watanabe, Hiroshi Funakubo, Minoru Osada, Hiroshi Uchida, Isao Okada, Brian J. Rodriguez, Alexei Gruverman. “Probing intrinsic polarization properties in bismuth-layered ferroelectric films”, Appl. Phys. Lett., Vol. 90, pp. 112914-1-1-3, 2007.
• Shintaro Yasui, Hiroshi Uchida, Hiroshi Nakaki, Ken Nishida, Hiroshi Funakubo, Seiichiro Koda. “Analysis for crystal structure of Bi(Fe,Sc)O3 thin films and their electrical properties”, Appl. Phys. Lett., Vol. 91, pp. 022906-1-3., 2007.
• Hiroshi Uchida, Katsumi Onofuji, Hiroshi Funakubo, Seiichiro Koda. “Characterization of zinc-modified lithium tantalate thin films fabricated by chemical solution deposition method”, J Sol-Gel Sci Techn,, Vol. 42, pp. 265–269., 2007.

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