@article{CTT100609884,
  author = {Koh Yamanaga and Shuhei Amakawa and Kazuya Masu and Takashi Sato},
  title = {A Universal Equivalent Circuit Model for Ceramic Capacitors},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2010,
}

@article{CTT100604865,
  author = {Takumi Uezono and Kazuya Masu and Takashi Sato},
  title = {A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation},
  journal = {IEICE Transactions on Fundamentals of Electronics},
  year = 2010,
}

@article{CTT100592704,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Accurate array-based measurement for subthreshold-current of MOS},
  journal = {IEEE Journal of Solid-State Circuits},
  year = 2009,
}

@inproceedings{CTT100607559,
  author = {Takumi Uezono and Tomoyuki Takahashi and Michihiro Shintani and Kazumi Hatayama and Kazuya Masu and Hiroyuki Ochi and Takashi Sato},
  title = {Scan Based Process Parameter Estimation Through Path-Delay Inequalities},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}

@inproceedings{CTT100607561,
  author = {Takashi Sato and Takumi Uezono and Noriaki Nakayama and Kazuya Masu},
  title = {Decomposition of Drain-Current Variation Into Gain-Factor and Threshold Voltage Variations},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}

@inproceedings{CTT100605086,
  author = {Takanori Date and Shiho Hagiwara and Kazuya Masu and Takashi Sato},
  title = {Robust importance sampling for efficient SRAM yield analysis},
  booktitle = {International Symposium on Quality Electronic Design (ISQED)},
  year = 2010,
}

@inproceedings{CTT100605089,
  author = {伊達貴徳 and 萩原 汐 and 益 一哉 and 佐藤高史},
  title = {超球の一部を用いた歩留り推定における不良領域の効率的探索手法},
  booktitle = {VLSI設計技術研究会，電子情報通信学会技術研究報告},
  year = 2010,
}

@inproceedings{CTT100605093,
  author = {Shiho Hagiwara and Koh Yamanaga and Ryo Takahashi and Kazuya Masu and Takashi Sato},
  title = {Linear Time Calculation of State-Dependent Power Distribution Network Capacitance.},
  booktitle = {International Symposium on Quality Electronic Design (ISQED)},
  year = 2010,
}

@inproceedings{CTT100592695,
  author = {Tomoyuki Takahashi and Takumi Uezono and Michihiro Shintani and Kazuya Masu and Takashi Sato},
  title = {On-die parameter extraction from path-delay measurements},
  booktitle = {2009 IEEE Asian Solid-State Circuits Conference},
  year = 2009,
}

@inproceedings{CTT100604868,
  author = {Michihiro Shintani and Takumi Uezono and Tomoyuki Takahashi and Hiroyuki Ueyama and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu},
  title = {An Adaptive Test for Parametric Faults Based on Statistical Timing Information},
  booktitle = {IEEE Asian Test Symposium},
  year = 2009,
}

@inproceedings{CTT100604892,
  author = {高橋知之 and 上薗巧 and 越智裕之 and 益一哉 and 佐藤高史},
  title = {パス遅延測定によるチップ特性の推定手法},
  booktitle = {DAシンポジウム},
  year = 2009,
}