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研究業績一覧 (1件)
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国際会議発表 (査読有り)
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Kiyohisa Funamizu,
Y.C. Lin,
Kuniyuki KAKUSHIMA,
Ahmet Parhat,
KAZUO TSUTSUI,
Nobuyuki Sugii,
E.Y. Chang,
takeo hattori,
HIROSHI IWAI.
Electrical Characteristics of HfO2 and La2O3 Gate Dielectrics for In0.53Ga0.47As MOS Structure,
ECS 216th Meeting,
vol. 25,
No. 6,
pp. 265-270,
Oct. 2009.
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