@article{CTT100615257,
  author = {Kanetake Takasaki and Kiyoshi Irino and Takayuki Aoyama and Youichi Momiyama and Toshiro Nakanishi and Yasuyuki Tamura and Takashi Ito},
  title = {Impact of Nitrogen Profile in Gate Nitrided-Oxide on Deep-Submicron CMOS Performance and Reliability},
  journal = {Fujitsu Sci. and Tech. Jour.},
  year = 2003,
}

@article{CTT100634586,
  author = {Kanetake Takasaki and Kiyoshi Irino and Takayuki Aoyama and Youichi Momiyama and Toshiro Nakanishi and Yasuyuki Tamura and Takashi Ito},
  title = {Impact of Nitrogen Profile in Gate Nitrided-Oxide on Deep-Submicron CMOS Performance and Reliability},
  journal = {FUJITSU SCIENTIFIC & TECHNICAL JOURNAL},
  year = 2003,
}