@article{CTT100621276,
  author = {K. Shubhakar and K.L. Pey and S.S. Kushvaha and S.J. O'Shea and N. Raghavan and M. Bosman and Miyuki Kouda and Kuniyuki KAKUSHIMA and HIROSHI IWAI},
  title = {Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy},
  journal = {Applied Physics Letters},
  year = 2011,
}