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研究業績一覧 (1件)
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論文
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DARYOUSH ZADEH,
Soshi Sato,
Kuniyuki KAKUSHIMA,
A. Srivastava,
Ahmet Parhat,
KAZUO TSUTSUI,
西山彰,
Nobuyuki Sugii,
KENJI NATORI,
takeo hattori,
C.K. Sarkar,
HIROSHI IWAI.
Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise,
Microelectronics Reliability,
Vol. 51,
pp. 746-750,
Apr. 2011.
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