@article{CTT100621288,
  author = {Kiichi Tachi and S. Barraud and Kuniyuki KAKUSHIMA and HIROSHI IWAI and S. Cristoloveanu and T. Ernst},
  title = {Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs},
  journal = {Microelectronics Reliability},
  year = 2011,
}