@article{CTT100769659, author = {Seiji Nakashima and Osami Sakata and Hiroshi Funakubo and Takao Shimizu and Daichi Ichinose and Kota Takayama and Yasuhiko Imai and Hironori Fujisawa and Masaru Shimizu}, title = {Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction}, journal = {Appl. Phys. Lett.}, year = 2017, } @article{CTT100649056, author = {Seiji Nakashima and Hironori Fujisawa and M. Shimizu and OSAMI SAKATA and Tomoaki Yamada and HIROSHI FUNAKUBO and Jung Min Park and Takeshi Kanashima and Masanori Okuyama}, title = {X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperatures by Using Synchrotron Radiation}, journal = {J. Korean Phys. Soc.}, year = 2011, } @inproceedings{CTT100771698, author = {中嶋誠二 and 藤沢浩訓 and 坂田修身 and 舟窪浩 and 清水荘雄 and 一ノ瀬大地 and 今井康彦 and 清水勝}, title = {エピタキシャルBiFeO3薄膜における電場印加下の格子歪}, booktitle = {}, year = 2017, }