@article{CTT100685383,
  author = {T. Harumoto and T. Sannomiya and Y. Matsukawa and S. Muraishi and Ji Shi and Y. Nakamura and H. Sawada and T. Tanaka and Y. Tanishiro and K. Takayanagi},
  title = {Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy},
  journal = {J. Appl. Phys.},
  year = 2013,
}

@article{CTT100652189,
  author = {Soyeon Lee and Yoshifumi Oshima and Hidetaka Sawada and Fumio Hosokawa and Eiji Okunishi and Toshikatsu Kaneyama and Yukihito Kondo and Yasumasa Tanishiro and Kunio Takayanagi},
  title = {Surface Imaging by ABF-STEM: Lithium Ions in Diffusion Channel of LIB Electrode Materials},
  journal = {e-J. Surf. Sci. and Nanotech.},
  year = 2013,
}

@article{CTT100652164,
  author = {K. Takayanagi and S. Kim and S. Lee and Y. Oshima and T. Tanaka and Y. Tanishiro and H. Sawada and F. Hosokawa and T. Tomita and T. Kaneyama and Yukihito Kondo},
  title = {Electron microscopy at a sub-50 pm resolution},
  journal = {J. Electron Microsc.},
  year = 2011,
}

@article{CTT100652171,
  author = {Soyeon Lee and Yoshifumi Oshima and Hidetaka Sawada and Fumio Hosokawa and Eiji Okunishi and Toshikatsu Kaneyama and Yukihito Kondo and Seiji Niitaka and Hidenori Takagi and Yasumasa Tanishiro and Kunio Takayanagi},
  title = {Counting lithium ions in the diffusion channel of an LiV2O4 crystal},
  journal = {J. Appl. Phys.},
  year = 2011,
}

@article{CTT100652177,
  author = {S. Kim and Y. Oshima and H. Sawada and T. Kaneyama and Y. Kondo and M. Takeguchi and Yoshiko Nakayama and Y. Tanishiro and K. Takayanagi},
  title = {Quantitative Annular Dark-field STEM Images of a Silicon Crystal Using a Large-angle Convergent Electron Probe with a 300-kV Cold Field-emission Gun},
  journal = {J. Electron Microsc.},
  year = 2011,
}

@article{CTT100788632,
  author = {H. Sawada and T. Sannomiya and F. Hosokawa and T. Nakamichi and T. Kaneyama and T. Tomita and Y. Kondo and T. Tanaka and Y. Oshima and Y. Tanishiro and K. Takayanagi},
  title = {Measurement method of aberration from Ronchigram by autocorrelation function},
  journal = {ULTRAMICROSCOPY},
  year = 2008,
}

@article{CTT100788635,
  author = {H. Sawada and F. Hosokawa and T. Kaneyama and T. Ishizawa and M. Terao and M. Kawazoe and T. Sannomiya and T. Tomita and Y. Kondo and T. Tanaka and Y. Oshima and Y. Tanishiro and N. Yamamoto and K. Takayanagi},
  title = {Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector},
  journal = {Japanese Journal of Applied Physics},
  year = 2007,
}

@article{CTT100788638,
  author = {H. Sawada and T. Sannomiya and F. Hosokawa},
  title = {Spherical Aberration Corrected TEM and STEM},
  journal = {Ceramics Japan},
  year = 2005,
}

@inproceedings{CTT100662236,
  author = {T. Sannomiya and H. Sawada and T. Nakamichi and F. Hosokawa and YOSHIO NAKAMURA and Y. Tanishiro and K. Takayanagi},
  title = {Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors},
  booktitle = {},
  year = 2013,
}