@article{CTT100652189, author = {Soyeon Lee and Yoshifumi Oshima and Hidetaka Sawada and Fumio Hosokawa and Eiji Okunishi and Toshikatsu Kaneyama and Yukihito Kondo and Yasumasa Tanishiro and Kunio Takayanagi}, title = {Surface Imaging by ABF-STEM: Lithium Ions in Diffusion Channel of LIB Electrode Materials}, journal = {e-J. Surf. Sci. and Nanotech.}, year = 2013, } @article{CTT100652164, author = {K. Takayanagi and S. Kim and S. Lee and Y. Oshima and T. Tanaka and Y. Tanishiro and H. Sawada and F. Hosokawa and T. Tomita and T. Kaneyama and Yukihito Kondo}, title = {Electron microscopy at a sub-50 pm resolution}, journal = {J. Electron Microsc.}, year = 2011, } @article{CTT100652171, author = {Soyeon Lee and Yoshifumi Oshima and Hidetaka Sawada and Fumio Hosokawa and Eiji Okunishi and Toshikatsu Kaneyama and Yukihito Kondo and Seiji Niitaka and Hidenori Takagi and Yasumasa Tanishiro and Kunio Takayanagi}, title = {Counting lithium ions in the diffusion channel of an LiV2O4 crystal}, journal = {J. Appl. Phys.}, year = 2011, } @article{CTT100788632, author = {H. Sawada and T. Sannomiya and F. Hosokawa and T. Nakamichi and T. Kaneyama and T. Tomita and Y. Kondo and T. Tanaka and Y. Oshima and Y. Tanishiro and K. Takayanagi}, title = {Measurement method of aberration from Ronchigram by autocorrelation function}, journal = {ULTRAMICROSCOPY}, year = 2008, } @article{CTT100788635, author = {H. Sawada and F. Hosokawa and T. Kaneyama and T. Ishizawa and M. Terao and M. Kawazoe and T. Sannomiya and T. Tomita and Y. Kondo and T. Tanaka and Y. Oshima and Y. Tanishiro and N. Yamamoto and K. Takayanagi}, title = {Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector}, journal = {Japanese Journal of Applied Physics}, year = 2007, } @article{CTT100788638, author = {H. Sawada and T. Sannomiya and F. Hosokawa}, title = {Spherical Aberration Corrected TEM and STEM}, journal = {Ceramics Japan}, year = 2005, } @inproceedings{CTT100662236, author = {T. Sannomiya and H. Sawada and T. Nakamichi and F. Hosokawa and YOSHIO NAKAMURA and Y. Tanishiro and K. Takayanagi}, title = {Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors}, booktitle = {}, year = 2013, } @inproceedings{CTT100662229, author = {三宮工 and 沢田英敬 and 中道智寛 and 細川史生 and 中村吉男 and 谷城康眞}, title = {STEMロンチグラムの収差中心決定法の実装}, booktitle = {}, year = 2013, } @inproceedings{CTT100662222, author = {三宮工 and 沢田英敬 and 中道 智寛 and 細川 史生 and 中村 吉男 and 谷城 康眞 and 高柳邦夫}, title = {STEM 完全自動収差補正に向けたロンチグラム上の収差中心の見つけ方}, booktitle = {}, year = 2012, } @misc{CTT100884490, author = {三宮 工 and 細川史生}, title = {電子線によるイメージング:透過電子顕微鏡}, year = 2022, }