@article{CTT100658744,
  author = {Miranda Enrique and Takamasa Kawanago and Kuniyuki KAKUSHIMA and J.Sune and HIROSHI IWAI},
  title = {Modeling of the output characteristics of advanced n-MOSFETs after a severe gate-to-channel dielectric breakdown},
  journal = {[Microelectronic Engineering},
  year = 2013,
}