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研究業績一覧 (1件)
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論文
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K. Shubhakar,
K.L. Pey,
S.S. Kushvaha,
S.J. O'Shea,
N. Raghavan,
M. Bosman,
Miyuki Kouda,
Kuniyuki KAKUSHIMA,
HIROSHI IWAI.
Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy,
Applied Physics Letters,
Vol. 98,
No. 072902,
Feb. 2011.
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