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細川史生 研究業績一覧 (10件)
論文
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Soyeon Lee,
Yoshifumi Oshima,
Hidetaka Sawada,
Fumio Hosokawa,
Eiji Okunishi,
Toshikatsu Kaneyama,
Yukihito Kondo,
Yasumasa Tanishiro,
Kunio Takayanagi.
Surface Imaging by ABF-STEM: Lithium Ions in Diffusion Channel of LIB Electrode Materials,
e-J. Surf. Sci. and Nanotech.,
Vol. 10,
pp. 454-458,
2013.
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K. Takayanagi,
S. Kim,
S. Lee,
Y. Oshima,
T. Tanaka,
Y. Tanishiro,
H. Sawada,
F. Hosokawa,
T. Tomita,
T. Kaneyama,
Yukihito Kondo.
Electron microscopy at a sub-50 pm resolution,
J. Electron Microsc.,
Oxford Journals,
Vol. 60,
No. suppl 1,
pp. S239 - S244,
Aug. 2011.
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Soyeon Lee,
Yoshifumi Oshima,
Hidetaka Sawada,
Fumio Hosokawa,
Eiji Okunishi,
Toshikatsu Kaneyama,
Yukihito Kondo,
Seiji Niitaka,
Hidenori Takagi,
Yasumasa Tanishiro,
Kunio Takayanagi.
Counting lithium ions in the diffusion channel of an LiV2O4 crystal,
J. Appl. Phys.,
American Institute of Physics,
Vol. 109,
No. 11,
p. 113530,
June 2011.
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H. Sawada,
T. Sannomiya,
F. Hosokawa,
T. Nakamichi,
T. Kaneyama,
T. Tomita,
Y. Kondo,
T. Tanaka,
Y. Oshima,
Y. Tanishiro,
K. Takayanagi.
Measurement method of aberration from Ronchigram by autocorrelation function,
ULTRAMICROSCOPY,
Vol. 108,
No. 11,
pp. 1467-1475,
Nov. 2008.
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H. Sawada,
F. Hosokawa,
T. Kaneyama,
T. Ishizawa,
M. Terao,
M. Kawazoe,
T. Sannomiya,
T. Tomita,
Y. Kondo,
T. Tanaka,
Y. Oshima,
Y. Tanishiro,
N. Yamamoto,
K. Takayanagi.
Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector,
Japanese Journal of Applied Physics,
Vol. 46,
No. 20-24,
pp. L568-L570,
June 2007.
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H. Sawada,
T. Sannomiya,
F. Hosokawa.
Spherical Aberration Corrected TEM and STEM,
Ceramics Japan,
40,
11,
908-913,
2005.
国際会議発表 (査読有り)
国内会議発表 (査読なし・不明)
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三宮工,
沢田英敬,
中道智寛,
細川史生,
中村吉男,
谷城康眞.
STEMロンチグラムの収差中心決定法の実装,
May 2013.
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三宮工,
沢田英敬,
中道 智寛,
細川 史生,
中村 吉男,
谷城 康眞,
高柳邦夫.
STEM 完全自動収差補正に向けたロンチグラム上の収差中心の見つけ方,
顕微鏡学会,
2012.
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