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沢田英敬 研究業績一覧 (9件)
- 2024
- 2023
- 2022
- 2021
- 2020
  - 全件表示
論文
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T. Harumoto,
T. Sannomiya,
Y. Matsukawa,
S. Muraishi,
Ji Shi,
Y. Nakamura,
H. Sawada,
T. Tanaka,
Y. Tanishiro,
K. Takayanagi.
Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy,
J. Appl. Phys.,
Vol. 113,
No. 8,
p. 084306,
Feb. 2013.
公式リンク
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Soyeon Lee,
Yoshifumi Oshima,
Hidetaka Sawada,
Fumio Hosokawa,
Eiji Okunishi,
Toshikatsu Kaneyama,
Yukihito Kondo,
Yasumasa Tanishiro,
Kunio Takayanagi.
Surface Imaging by ABF-STEM: Lithium Ions in Diffusion Channel of LIB Electrode Materials,
e-J. Surf. Sci. and Nanotech.,
Vol. 10,
pp. 454-458,
2013.
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K. Takayanagi,
S. Kim,
S. Lee,
Y. Oshima,
T. Tanaka,
Y. Tanishiro,
H. Sawada,
F. Hosokawa,
T. Tomita,
T. Kaneyama,
Yukihito Kondo.
Electron microscopy at a sub-50 pm resolution,
J. Electron Microsc.,
Oxford Journals,
Vol. 60,
No. suppl 1,
pp. S239 - S244,
Aug. 2011.
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Soyeon Lee,
Yoshifumi Oshima,
Hidetaka Sawada,
Fumio Hosokawa,
Eiji Okunishi,
Toshikatsu Kaneyama,
Yukihito Kondo,
Seiji Niitaka,
Hidenori Takagi,
Yasumasa Tanishiro,
Kunio Takayanagi.
Counting lithium ions in the diffusion channel of an LiV2O4 crystal,
J. Appl. Phys.,
American Institute of Physics,
Vol. 109,
No. 11,
p. 113530,
June 2011.
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S. Kim,
Y. Oshima,
H. Sawada,
T. Kaneyama,
Y. Kondo,
M. Takeguchi,
Yoshiko Nakayama,
Y. Tanishiro,
K. Takayanagi.
Quantitative Annular Dark-field STEM Images of a Silicon Crystal Using a Large-angle Convergent Electron Probe with a 300-kV Cold Field-emission Gun,
J. Electron Microsc.,
Oxford Journals,
Vol. 60,
No. 2,
pp. 109-116,
Jan. 2011.
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H. Sawada,
T. Sannomiya,
F. Hosokawa,
T. Nakamichi,
T. Kaneyama,
T. Tomita,
Y. Kondo,
T. Tanaka,
Y. Oshima,
Y. Tanishiro,
K. Takayanagi.
Measurement method of aberration from Ronchigram by autocorrelation function,
ULTRAMICROSCOPY,
Vol. 108,
No. 11,
pp. 1467-1475,
Nov. 2008.
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H. Sawada,
F. Hosokawa,
T. Kaneyama,
T. Ishizawa,
M. Terao,
M. Kawazoe,
T. Sannomiya,
T. Tomita,
Y. Kondo,
T. Tanaka,
Y. Oshima,
Y. Tanishiro,
N. Yamamoto,
K. Takayanagi.
Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector,
Japanese Journal of Applied Physics,
Vol. 46,
No. 20-24,
pp. L568-L570,
June 2007.
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H. Sawada,
T. Sannomiya,
F. Hosokawa.
Spherical Aberration Corrected TEM and STEM,
Ceramics Japan,
40,
11,
908-913,
2005.
国際会議発表 (査読有り)
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