論文

• Takayanagi, K., Oshima, Y., Lee, S., Tanaka, T., YASUMASA TANISHIRO. Nanocycles of materials' transport studied by in-situ electron microscopy and diffraction, Journal of Physics: Conference Series, Vol. 522, No. 1, 2014.
• T. Harumoto, T. Sannomiya, Y. Matsukawa, S. Muraishi, Ji Shi, Y. Nakamura, H. Sawada, T. Tanaka, Y. Tanishiro, K. Takayanagi. Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy, J. Appl. Phys., Vol. 113, No. 8, p. 084306, Feb. 2013.  公式リンク  
  
• Soyeon Lee, Yoshifumi Oshima, Hidetaka Sawada, Fumio Hosokawa, Eiji Okunishi, Toshikatsu Kaneyama, Yukihito Kondo, Yasumasa Tanishiro, Kunio Takayanagi. Surface Imaging by ABF-STEM: Lithium Ions in Diffusion Channel of LIB Electrode Materials, e-J. Surf. Sci. and Nanotech., Vol. 10, pp. 454-458, 2013.
• Suhyun Kim, Yoshifumi Oshima, Yasumasa Tanishiro, Kunio Takayanagi. Study on probe current dependence of the intensity distribution in annular dark field images, ULTRAMICROSCOPY, Vol. 121, pp. 38-41, June 2012.
• Soyeon Lee, Yoshifumi Oshima, Seiji Niitaka, Hidenori Takagi, Yasumasa Tanishiro, Kunio Takayanagi. In-situ Annular Bright-Field Imaging of Structural Transformation of Spinel LiV2O4 Crystals into Defective LixV2O4, JPN. J. APPL. PHYS., Vol. 51, p. 020202, Jan. 2012.
• Mitome, M., Sawada, H., Kondo, Y., YASUMASA TANISHIRO, Takayanagi, K.. Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopy, Ultramicroscopy, Vol. 122, pp. 6-11, 2012.
• K. Takayanagi, S. Kim, S. Lee, Y. Oshima, T. Tanaka, Y. Tanishiro, H. Sawada, F. Hosokawa, T. Tomita, T. Kaneyama, Yukihito Kondo. Electron microscopy at a sub-50 pm resolution, J. Electron Microsc., Oxford Journals, Vol. 60, No. suppl 1, pp. S239 - S244, Aug. 2011.
• Soyeon Lee, Yoshifumi Oshima, Hidetaka Sawada, Fumio Hosokawa, Eiji Okunishi, Toshikatsu Kaneyama, Yukihito Kondo, Seiji Niitaka, Hidenori Takagi, Yasumasa Tanishiro, Kunio Takayanagi. Counting lithium ions in the diffusion channel of an LiV2O4 crystal, J. Appl. Phys., American Institute of Physics, Vol. 109, No. 11, p. 113530, June 2011.
• S. Kim, Y. Oshima, H. Sawada, T. Kaneyama, Y. Kondo, M. Takeguchi, Yoshiko Nakayama, Y. Tanishiro, K. Takayanagi. Quantitative Annular Dark-field STEM Images of a Silicon Crystal Using a Large-angle Convergent Electron Probe with a 300-kV Cold Field-emission Gun, J. Electron Microsc., Oxford Journals, Vol. 60, No. 2, pp. 109-116, Jan. 2011.
• Suhyun Kim, Yoshifumi Oshima, Hidetaka Sawada, Naoto Hashikawa, Kyoichiro Asayama, Tosikatu Kaneyama, Yukihito Kondo, Yasumasa Tanishiro, Kunio Takayanagi. A Dopant Culster in a Highly Antimony Doped Silicon Crystal, Applied Physics Express, The Japan Society of Applied Physics, Vol. 3, No. 8, p. 081301, July 2010.  公式リンク  
  
• Yoshifumi Oshima, Hidetaka Sawada, Fumio Hosokawa, Eiji Okunishi, Toshikatsu Kaneyama, Yukihito Kondo, Seiji Niitaka, Hidenori Takagi, Yasumasa Tanishiro, Kunio Takayanagi. Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy, Journal of Electron Microscopy, Vol. 59, No. 3, June 2010.
• Y. Oshima, Y. Hashimoto, Y. Tanishiro, K. Takayanagi, H. Sawada, T. Kaneyama, Y. Kondo, N. Hashikawa, K. Asayama. Detection of arsenic dopant atoms in a silicon crystal using a spherical aberration corrected scanning transmission electron microscope, Physical Review B, American Physical Society, Vol. 81, No. 3, 035317, Jan. 2010.  公式リンク  
  
• Y. Tanishiro, R. Itoh, A. Arimoto, K. Takayanagi. Growth of a Long Silver Nanowire and the Electric Conductance, Annual American Physical Society March Meeting 2004, pp. P16.014, 2004.
• S. Shibata, Y. Tanishiro, Y. Kondo, H. Minoda, K. Takayanagi. The Development of High-resolution Transmission Electron Microscope (HRTEM) Combined with AFM for Simultaneous Observation of the Structure and Force of the Nanocontact, Annual American Physical Society March Meeting 2004, pp. K1.065, 2004.
• Y. Tanishiro, R. Itoh, A. Arimoto, K. Takayanagi. Development of Ultra-high Vacuum Transmission Electron Microscope (UHV-TEM) Combined with STM for Simultaneous Observation of the Structure and Electric Conductance of the Nanowire, Annual American Physical Society March Meeting 2004, pp. K1.060, 2004.
• S. Shibata, Y. Tanishiro, K. Takayanagi. Force and Structure of Gold Nanocontact Measured Simultaneously by High-resolurion Transmission Electron Microscopy (HRTEM) and Atomic Force Microscopy (AFM), Annual American Physical Society March Meeting 2004, pp. P16.006, 2004.
• 谷城康眞, 有本明希子, 高柳邦夫. 超イオン導電体AgIからの銀細線の成長と電気伝導, 真空, Vol. 46, No. 3, pp. 298-301, 2003.
• 谷城康眞. REM-RHEEDにおけるエネルギー損失分光　－Ωフィルターによるエネルギーフィルタリング－, 表面科学, Vol. 24, No. 3, pp. 166-173, 2003.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. Single- and triple-height-step distributions on Si(111) vicinal surfaces inclined toward [-1 -1 2] studied by reflection electron microscopy, Surface Sci., Vol. 496, No. 3, pp. 179-186, 2002.
• H.Minoda, T.Sato, K.Yagi, Y.Tanishiro, M.Iwatsuki. Formation of Anormalously Wide Si(111)■RT2（3） x ■RT2（3） Clean Surface and Its Stability, Surface Sci., Vol. 493, No. 1-3, pp. 157-165, 2001.
• Y.Peng, H.Minoda, Y.Tanishiro, K.Yagi. Au Adsorption on Si(5 5 12) Surfaces and Facet Formation Studied by High Resolution In-situ REM, Surface Science, Vol. 493, No. 1-3, pp. 508-518, 2001.
• Y.Peng, T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. High Resolution REM Studies of Si(5 5 12) Surfaces and Their Roughening Phase Transition, Surface Science, Vol. 493, No. 1-3, pp. 499-507, 2001.
• M.Degawa, H.Minoda, Y.Tanishiro, K.Yagi. New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing, J.Phys.Soc.Japan, Vol. 70, No. 4, pp. 1026-1034, 2001.
• T.Suzuki, Y.Tanishiro, N.Ishiguro, H.Minoda, K.Yagi. Energy-filtered Electron Interferometry in Reflection Electron Microscopy, Jpn.J.Appl.Phys., Vol. 40, No. 4, pp. 2527-2532, 2001.
• M.Degawa, H.Minoda, Y.Tanishiro, K.Yagi. In-phase Step Wandering on Si(111) Vicinal Surfaces: Effect of Direct Current Heating Tilted from the Step-down Direction, Phys.Rev.B, Vol. 63, No. 4, pp. 045309 (8pages), 2001.
• M.Degawa, H.Minoda, Y.Tanishiro, K.Yagi. Direct-current-induced Drift Direction of Silicon Adatoms on Si(111)-(1x1) Surfaces, Surface Sci.Lett., Vol. 461, No. 1-3, pp. L528-L536, 2000.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. REM Studies of the Roughening Transitions of Si High Index Surfaces, Thin Solid Films, Vol. 343-344, pp. 423-426, 1999.
• M.Degawa, H.Nishimura, Y.Tanishiro, H.Minoda, K.Yagi. Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces, Jpn.J.Appl.Phys., Vol. 38, No. 3B, pp. L308-L311, 1999.
• M.Chida, Y.Tanishiro, H.Minoda, K.Yagi. Growth Mechanism of 7x7 Domains from the '1x1' Phase on a Quenched Si(111) Surface Studied by High Temperature STM, Surface Sci.Lett., Vol. 423, No. 1, pp. L236-L243, 1999.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. TED Analysis of the Si(113) Surface Structure, Surface Sci., Vol. 438, pp. 76-82, 1999.
• Y.Takahashi, H.Minoda, Y.Tanishiro, K.Yagi. Cu-induced Step Bunching on a Si(111) Vicinal Surface Studied by Reflection Electron Microscopy, Surface Sci., Vol. 433-435, pp. 512-516, 1999.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. REM Studies of Step Creation Energies and Step-Step Interactions on Si(111) and (110) Vicinal Surfaces, Surface Review and Letters, Vol. 6, No. 6, pp. 985-994, 1999.
• Y.Tanishiro, K.Okamoto, M.Takeguchi, H.Minoda, T.Suzuki, K.Yagi. Design Features of a New Ultra-high Vacuum Electron Microscope with an Omega Filter, J.Electron Microsc., Vol. 48, No. 6, pp. 837-842, 1999.
• Y.Tanishiro, K.Okamoto, T.Suzuki, N.Ishiguro, H.Minoda, H.Miura, K.Yagi, M.Takeguchi. Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy, Jpn.J.Appl.Phys., Vol. 38, No. 11, pp. 6540-6543, 1999.
• M.Chida, Y.Tanishiro, H.Minoda, K.Yagi. STM Studies on Reversible Phase Transition Between Metastable Structures of Si(111)c2x8 and 1x1, Surface Sci., Vol. 441, pp. 179-191, 1999.
• H.Nishimura, H.Minoda, Y.Tanishiro, K.Yagi. DC Heating-induced Step Instability on Si(001) Vicinal Surfaces, Surface Sci.Lett., Vol. 442, pp. L1006-L1012, 1999.
• N.Kurahashi, H.Minoda, Y.Tanishiro, K.Yagi. In-situ REM Study of Au-induced Faceting on Si(113) Surface, Surface Sci., Vol. 438, pp. 91-96, 1999.
• H.Minoda, Y.Takahashi, Y.Tanishiro, K.Yagi. In Situ Reflection Electron Microscopy Study of Cu-induced Step Bunching on Si(111) Vicinal Surfaces, Surface Sci., Vol. 438, pp. 68-75, 1999.
• M.Degawa, H.Minoda, Y.Tanishiro, K.Yagi. Temperature Dependence of Period of Step Wandering Formed on Si(111) Vicinal Surfaces by DC heating, J.Phys.: Condens. Matter, Vol. 11, pp. L551-L556, 1999.
• M.Degawa, H.Minoda, Y.Tanishiro, K.Yagi. DC-Heating-Induced Antiband Formation and Subsequent Step Wandering on Si(111) Studied by In-situ REM, Surface Review and Letters, Vol. 6, No. 6, pp. 977-984, 1999.
• 八木克道, 出川雅士, 西村穂積, 鈴木孝将, 箕田弘喜, 谷城康眞. Si微斜面での通電効果と表面形態, 表面科学, Vol. 20, No. 12, pp. 830-836, 1999.
• A.V.Latyshev, H.Minoda, Y.Tanishiro, K.Yagi. Adatom Effective Charge in Morphology Evolution on Si(111) Surface, Appl. Surface Sci., Vol. 130-132, pp. 60-66, 1998.
• K.Aoki, T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. Au Adsorption Induced Faceting and Phase Transitions of Facet Planes on the Si[110] Zone Studied by UHV-REM, Surface Sci., Vol. 408, pp. 101-111, 1998.
• T.Shimakura, H.Minoda, Y.Tanishiro, K.Yagi. In-situ Study of Gold-induced Surface Structures and Step Rearrangements on the Si(001) Surface by High-temperatue STM, Surface Sci. Lett., Vol. 407, pp. L657-L664, 1998.
• A.V.Latyshev, H.Minoda, Y.Tanishiro, K.Yagi. Electromigration and Gold-induced Step Bunching on the Si(111) Surface, Surface Sci., Vol. 401, pp. 22-33, 1998.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. TED Study of Si(113) Surfaces, Surface Review and Letters, Vol. 5, No. 1, pp. 249-254, 1998.
• K.Aoki, H.Minoda, Y.Tanishiro, K.Yagi. REM Studies of Adsorption-induced Phase Transitions and Faceting in the Si(111)-Au System, Surface Review and Letters, Vol. 5, No. 3-4, pp. 653-663, 1998.
• M.Chida, H.Minoda, Y.Tanishiro, K.Yagi. Reversible Phase Transition Between Metastable Structures of Si(111)c2x8 and 1x1 Studied by High Temperature STM, Surface Sci. Lett., Vol. 411, No. 1-2, pp. L822-L827, 1998.
• H.Tamura, Y.Tanishiro, H.Minoda, K.Yagi. Competing Effects of Current and Strain on Step Structures on Si(001)2x1 Studied by REM, Surface Sci., Vol. 382, pp. 310-319, 1997.
• C.Collazo-Davilla, L.D.Marks, K.Nishii, Y.Tanishiro. Atomic Structure of the In on Si(111)4×1 Surface, Surface Review and Letters, Vol. 4, No. 1, pp. 65-70, 1997.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi. REM Study of High Index Si(5 5 12) Flat Surfaces, Surface Sci., Vol. 348, pp. 335-343, 1996.
• A.V.Latyshev, H.Minoda, Y.Tanishiro, K.Yagi. Dynamical Step Edge Stiffness on the Si(111) Surface, Phys.Rev.Lett., Vol. 76, pp. 94-97, 1996.
• T.Senoh, H.Minoda, Y.Tanishiro, K.Yagi. Quantitative Studies of Step Bunching Dynamics Si(111) Induced by a Current Effect, Surface Science, Vol. 357-358, pp. 518-521, 1996.
• Y.Shidahara, K.Aoki, Y.Tanishiro, H.Minoda, K.Yagi. PEEM and REM Studies of Surface Dynamics:Electromigaration and Cl Adsorption and Desorption, Surface Science, Vol. 357-358, pp. 820-824, 1996.
• Y.Tanishiro, K.Kaneko, H.Minoda, K.Yagi, T.Sueyoshi, T.Sato, M.Iwatsuki. Dynamic Observation of In Adsorption on Si(111)Surfaces by UHV High-Temperature Scanning Tunneling Microscopy, Surface Sci., Vol. 357-358, pp. 407-413, 1996.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi, T.Sueyoshi, T.Sato, M.Iwatsuki. STM Studies of Si(5 5 12)2x1 Surfaces, Surface Sci., Vol. 357/358, pp. 522-526, 1996.
• T.Suzuki, H.Minoda, Y.Tanishiro, K.Yagi, H.Kitada, N.Shimizu. STM Studies of Si(hhm) Surfaces with m/h=1.4-1.5, Surface Sci., Vol. 357/358, pp. 73-77, 1996.
• H.Tamura, K.Nishii, H.Minoda, Y.Tanishiro, K.Yagi. Studies of Surface Stress by Reflection Electron Microscopy and Transmission Electron Microscopy, Surface Sci., Vol. 357/358, pp. 576-580, 1996.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. In Situ TEM Observations of Surfactant-Mediated Epitaxy: Growth of Ge on an Si(111) Surface Mediated by In, Surface Sci., Vol. 357/358, pp. 418-421, 1996.
• A.V.Latyshev, H.Minoda, Y.Tanishiro, K.Yagi. UHV REM Investigation of the Interaction Between Steps and Dislocation on Silicon (111) Surface II, Surface Sci., Vol. 357/358, pp. 550-554, 1996.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. REM Studies of Ge Growth on Au Adsorbed Si(001) Surfaces, Surface Sci., Vol. 331-333, pp. 913-919, 1995.
• K.Yagi, Y.Tanishiro. Studies of Surface Phase Transition by Electron Microscopy, Phase Transitions, Vol. 53, pp. 197-214, 1995.
• A.Latyshev, H.Minoda, Y.Tanishiro, K.Yagi. Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface, Jpn.J.Appl.Phys., Vol. 34, pp. 5768-5773, 1995.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. Growths of Ge on In Adsorbed Si(111) Surfaces Studied by UHV-REM, Surface Review and Letters, Vol. 2, pp. 1-8, 1995.
• T.Suzuki, Y.Tanishiro, H.Minoda, K.Yagi, M.Suzuki. REM Observations of Si (hhk) Surfaces and Their Vicinal Surfaces, Surface Science, Vol. 298, pp. 473-477, 1993.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. Growth of Si(111)■RT2（3） x ■RT2（3） -In Surfaces Studied by UHV-REM, Surface Sci., Vol. 287/288, pp. 915-920, 1993.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. Reflection Electron Microscopy Study of Thin Films Growth, Thin Solid Films, Vol. 228, pp. 12-17, 1993.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. Growth of Si on Au Deposited Si(111) Surfaces Studied by UHV-REM, Appl.Surface Sci., Vol. 60/61, pp. 107-111, 1992.
• H.Yamaguchi, Y.Tanishiro, K.Yagi. REM Study of Surface Electromigration of Ge, Au-Cu and Ag on Si(111) Surfaces, Appl.Surface Sci., Vol. 60/61, pp. 79-84, 1992.
• T.Nakayama, Y.Tanishiro, K.Takayanagi. Heterogrowth of Ge on the Si(001)2x1 Reconstructed Surface, Surface Sci., Vol. 273, pp. 9-20, 1992.
• A.Yamanaka, Y.Tanishiro, K.Yagi. Surface Electromigration of Au on Si(001) Studied by REM, Surface Sci., Vol. 264, pp. 55-64, 1992.
• K.Murooka, Y.Tanishiro, K.Takayanagi. Dynamic Observation of Oxygen-induced Step Movement on the Si(111)7x7 Surface by High-resolution Reflection Electron Microscopy, Surface Sci., Vol. 275, pp. 26-30, 1992.
• H.Sato, Y.Tanishiro, K.Yagi. TEM Study of Si(111) Surfaces, Appl.Surface Sci., Vol. 60/61, pp. 367-371, 1992.
• M.Shima, Y.Tanishiro, K.Kobayashi, K.Yagi. UHV-REM Study of Homoepitaxial Growth of Si, J. Cryst. Growth, Vol. 115, pp. 359-364, 1991.
• Y.Kondo, K.Ohi, Y.Ishibashi, H.Hirano, Y.Harada, K.Takayanagi, Y.Tanishiro, Kobayashi, K.Yagi. Design and Development of an Ultrahigh Vacuum High-Resolution Transmission Electron Microscope, Ultramicroscopy, Vol. 35, pp. 111-118, 1991.
• I.Homma, Y.Tanishiro, K.Yagi. REM and TEM Studies of 2D Au-Cu Alloy Adsorbates on a Si(111) Surface, Surface Sci., Vol. 242, pp. 81-89, 1991.
• S.Takahashi, Y.Tanishiro, K.Takayanagi. Short Range Orders of an Adsorbed Layer: Gold on the Si(111)7x7 Surface, Surface Sci., Vol. 242, pp. 73-80, 1991.
• Y.Tanishiro, K.Takayanagi, K.Yagi. Density of Silicon Atoms in the Si(111)■RT2（3） x ■RT2（3） -Ag Structure Studied by In Situ UHV Reflection Electron Microscopy, Surface Science Letter, Vol. 258, pp. L687-L690, 1991.
• K.Yagi, A.Yamanaka, H.Sato, M.Shima, H.Ohse, S.Ozawa, Y.Tanishiro. UHV-TEM-REM Studies of Si(111) Surfaces, Prog. Theo. Phys. Suppl, Vol. 106, pp. 303-314, 1991.
• M.Mitome, K.Takayanagi, Y.Tanishiro. Commensurate Reconstruction on a (001) Facet of a Gold Particle, Phys.Rev.B, Vol. 42, No. 11, pp. 7238-7241, 1990.
• K.Murooka, M.Mitome, Y.Tanishiro, K.Takayanagi. High-resolution Electron Microscope Observation of Atomic Bridge Formation Between Two Interacting Gold Particles, J.Vac.Sci.Technol.A, Vol. 8, No. 1, pp. 153-154, 1990.
• Y.Tanishiro, K.Yagi, K.Takayanagi. Gold Adsorption Processes on Si(111)7x7 Studied by In-Situ Reflection Electron Microscopy, Surface Science, Vol. 234, pp. 37-42, 1990.
• S.Ozawa, A.Yamanaka, K.Kobayashi, Y.Tanishiro, K.Yagi. A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces, Jpn.J.Appl.Phys., Vol. 29, pp. L655-L658, 1990.
• M.Mitome, K.Takayanagi, Y.Tanishiro. Improvement of Resolution by Convergent-Beam Illumination in Surface Profile Images of High Resolution Transmission Electron Microscopy, Ultramicroscopy, Vol. 33, pp. 255-260, 1990.
• K.Kajiyama, Y.Tanishiro, K.Takayanagi. Reconstructions and Phase Transitions of Ge on the Si(111)7x7 Surface. II. 7x7 and 5x5 Structures Stabilized by Ge, Surface Sci., Vol. 222, pp. 47-63, 1989.
• M.Mitome, K.Takayanagi, Y.Tanishiro. On the Structure and Stability of Small Metal Particles: High Resolution UHV Electron Microscope Study, Z.Phys.D, Vol. 12, pp. 45-51, 1989.
• Y.Tanishiro, K.Takayanagi. Dynamic Observation of Gold Adsorption on Si(111)7x7 Surface by High-resolution Reflection Electron Microscopy, Ultramicroscopy, Vol. 31, pp. 20-28, 1989.
• Y.Tanishiro, K.Takayanagi. Validity of the Kinematical Approximation in Transmission Electron Diffraction for the Structure Analysis of Surface Structures, Ultramicroscopy, Vol. 27, pp. 1-8, 1989.
• K.Kajiyama, Y.Tanishiro, K.Takayanagi. Reconstructions and Phase Transitions of Ge on the Si(111)7x7 Surface. I. Structural Changes, Surface Sci., Vol. 222, pp. 38-46, 1989.
• K.Takayanagi, Y.Tanishiro, T.Ishitsuka, K.Akiyama. In-situ UHV Electron Microscope Study of Metal-Silicon Surfaces, Appl. Surface Sci., Vol. 41/42, pp. 337-341, 1989.
• K.Akiyama, K.Takayanagi, Y.Tanishiro. UHV Electron Microscope and Diffraction Analyses of the root3 x root3 Structure Formed by Pd on Si(111)7x7, Surface Sci., Vol. 205, pp. 177-186, 1988.
• S.Ogawa, Y.Tanishiro, K.Yagi. In Situ Studies of Fast Atom Bombardment and Annealing Processes by Reflection Electron Microscopy, Nucl.Inst.Methods in Physics Research B, Vol. 33, pp. 474-478, 1988.
• 高柳邦夫, 谷城康眞, 秋山和弘. 微粒子・原子層成長過程の高分解能・超高真空電子顕微鏡による”その場”観察, 日本結晶成長学会誌, Vol. 15, No. 3-4, pp. 322-326, 1988.
• K.Takayanagi, Y.Tanishiro, K.Yagi, K.Kobayashi, G.Honjo. UHV-TEM Study on the Reconstructed Surface of Au(111): Metastable pxp and Stable px1 Surface Structure, Surface Sci., Vol. 205, pp. 637-651, 1988.
• K.Yamazaki, K.Takayanagi, Y.Tanishiro, K.Yagi. Transmission Electron Microscope Study of the Reconstructed Au(001) Surface, Surface Sci., Vol. 199, pp. 595-608, 1988.
• S.Ogawa, Y.Tanishiro, K.Takayanagi, K.Yagi. Reflection Electron Microscope Study of Pt(111) Surfaces, J.Vac.Sci.Technol.A, Vol. 5, No. 4, pp. 1735-1738, 1987.
• N.Shimizu, Y.Tanishiro, K.Takayanagi, K.Yagi. On the Vacancy Formation and Diffusion on the Si(111)7x7 Surfaces Under Exposures of Low Oxygen Pressure Studied by In Situ Reflection Electron Microscopy, Surface Sci., Vol. 191, pp. 28-44, 1987.
• K.Takayanagi, Y.Tanishiro, K.Murooka. Microscopy: A Means to Study Surface Structures, J. de Physique , Vol. 48, No. 11, pp. C6.525-C6.530, 1987.
• K.Takayanagi, Y.Tanishiro, K.Kobayashi, K.Akiyama, K.Yagi. Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic Level., Japanese Journal of Applied Physics, Vol. 26, No. 6, pp. L957-L960, 1987.
• T.Nakayama, Y.Tanishiro, K.Takayanagi. Biatomic Layer-High Steps on Si(001)2x1 Surface, Jpn.J.Appl.Phys., Vol. 26, No. 4, pp. L280-L282, 1987.
• N.Inoue, Y.Tanishiro, K.Yagi. UHV-REM Study of Changes in the Step Structures on Clean (100) Silicon Surfaces by　Annealing, Jpn.J.Appl.Phys., Vol. 26, No. 4, pp. L293-L295, 1987.
• T.Nakayama, Y.Tanishiro, K.Takayanagi. Monolayer and Bilayer High Steps on Si(001)2x1 Vicinal Surface, Jpn.J.Appl.Phys., Vol. 26, No. 7, pp. L1186-L1188, 1987.
• K.Takayanagi, Y.Tanishiro, K.Kajiyama. On the Stability and Structure of 5x5 and 7x7 Reconstruction of the (111) Surface of Si and Ge, J.Vac.Sci.Technol.B, Vol. 4, No. 4, pp. 1074-1078, 1986.
• K.Takayanagi, Y.Tanishiro. Dimer-chain Model for the 7x7 and the 2x8 Reconstructed Surfaces of Si(111) and Ge(111), Phys.Rev.B, Vol. 34, No. 2, pp. 1034-1040, 1986.
• Y.Tanishiro, K.Takayanagi, K.Yagi. Observation of Lattice Fringes of the Si(111)-7x7 Structure by Reflection Electron Microscopy., Journal of Microscopy, Vol. 142, No. 2, pp. 211-221, 1986.
• 八木克道, 谷城康眞, 高柳邦夫. 表面電子顕微鏡法, 応用物理, Vol. 55, No. 11, pp. 1036-1050, 1986.
• K.Takayanagi, Y.Tanishiro, S.Takahashi, M.Takahashi. Structure Analysis of Si (111)-7x7 Reconstructed Surface by Transmission Electron Diffraction, Surface Science, Vol. 164, pp. 367-392, 1985.
• N.Shimizu, Y.Tanishiro, K.Kobayashi, K.Takayanagi, K.Yagi. Reflection Electron Microscope Study of the Initial Stages of Oxidation of Si(111)-7x7 Surfaces, Ultramicroscopy, Vol. 18, pp. 453-462, 1985.
• J.J.Metois, K.Takayanagi, Y.Tanishiro. Growth of Monoatomic Layer Terraces on a (111) Lead Crystal Face: In Situ Observations in Dark Field by UHV-TEM, Surface Sci., Vol. 155, pp. 53-64, 1985.
• K.Yagi, K.Kobayashi, Y.Tanishiro, K.Takayanagi. In Situ Electron Microscope Study of the Initial Stage of Metal Growth on Metals, Thins Solid Films, Vol. 126, pp. 95-105, 1985.
• K.Takayanagi, Y.Tanishiro, M.Takahashi, S.Takahashi. Structural Analysis of Si(111)-7x7 by UHV-transmission Electron Diffraction and Microscopy, J.Vac.Sci.Technol.A, Vol. 3, pp. 1502-1506, 1985.
• O.L.Krivanek, Y.Tanishiro, K.Takayanagi, K.Yagi. Electron Energy Loss Spectroscopy in Glancing Reflection from Bulk Crystals, Ultramicroscopy, Vol. 11, pp. 215-222, 1983.
• Y.Tanishiro, K.Takayanagi, K.Yagi. On the Phase Transition Between the (7x7) and (1x1) Structures of Silicon (111) Surface Studied by Reflection Electron Microscopy, Ultramicroscopy, Vol. 11, pp. 95-102, 1983.
• 八木克道, 高柳邦夫, 谷城康眞. 超高真空電子顕微鏡による表面観察, 日本物理学会誌, Vol. 37, No. 12, pp. 994-1002, 1982.
• Y.Tanishiro, H.Kanamori, K.Takayanagi, K.Yagi, G.Honjo. UHV Transmission Electron Microscopy on the Reconstructed Surface of (111) Gold. I. General Features, Surface Science, Vol. 111, pp. 395-413, 1981.
• N.Osakabe, Y.Tanishiro, K.Yagi, G.Honjo. Image Contrast of Dislocations and Atomic Steps on (111) Silicon Surface in Reflection Electron Microscopy, Surface Sci., Vol. 102, pp. 424-442, 1981.
• N.Osakabe, Y.Tanishiro, K.Yagi, G.Honjo. Direct Observation of the Phase Transition Between the (7x7) and (1x1) Structures of Clean (111) Silicon Surfaces, Surface Sci., Vol. 109, pp. 353-366, 1981.
• Y.Tanishiro, K.Takayanagi, K.Kobayashi, K.Yagi. In-situ Reflection Electron Microscope Study of Metal Deposition on Clean Si(111) Surface, Acta Crystallogr.A, Vol. 37, No. supplement, pp. C-300, 1981.
• K.Takayanagi, H.Kanamori, Y.Tanishiro, K.Yagi. Dynamic Processes of Monolayer Adsorption Studied by In-situ UHV-transmission Electron Microscope, Acta Crystallogr.A, Vol. 37, No. supplement, pp. C-300, 1981.
• N.Osakabe, Y.Tanishiro, K.Yagi, G.Honjo. Reflection Electron Microscopy of Clean and Gold Deposited (111) Silicon Surfaces, Surface Sci., Vol. 97, pp. 393-408, 1980.
• K.Yagi, K.Takayanagi, K.Kobayashi, N.Osakabe, Y.Tanishiro, G.Honjo. Surface Study by an UHV Electron Microscope, Surface Sci., Vol. 86, pp. 174-181, 1979.

著書

• 谷城康眞, 箕田弘喜（5.2節のみ）. 表面物性工学ハンドブック 第2版, 丸善, pp. 2.2.4節(単著）、3.2.3節(単著）、5.2節（共著）, Jan. 2007.
• K. Yagi, Y. Tanishiro, H. Minoda. Spectro-microscopy by TEM-SEM, Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research, Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research, Vol. 588, pp. 11-23, 2002.
• 谷城康眞, 高柳邦夫. 表面物性測定, 丸善 実験物理学講座, 丸善 実験物理学講座, Vol. 10, pp. 7-41, 2001.
• Y.Tanishiro, T.Suzuki, N.Ishiguro, H.Minoda, K.Yagi. Energy Filtering in UHV Reflection Electron Microscopy, Microbeam Analysis 2000 (Proc. 2nd Conf. of International Union of Microbeam Analysis Societies, Kailua-Kona, Hawaii, 2000, Eds. D.B.Wiliams and R.Shimizu) IOP Conf. Series, Microbeam Analysis 2000 (Proc. 2nd Conf. of International Union of Microbeam Analysis Societies, Kailua-Kona, Hawaii, 2000, Eds. D.B.Wiliams and R.Shimizu) IOP Conf. Series, Vol. 165, pp. 215-216, 2000.
• C.Collazo-Davila, L.D.Marks, K.Nishii, Y.Tanishiro. Structure of the In on Si(111)4x1 Surface Determined by Applying Direct Phasing Methods to Transmission Electron Diffraction Data, in Proc. 55th Annual Meeting of the Microscopy Society of America (Cleveland, 1997), in Proc. 55th Annual Meeting of the Microscopy Society of America (Cleveland, 1997), pp. 1041-1042, 1997.
• K.Yagi, K.Aoki, H.Minoda, Y.Tanishiro, H.Tamura, T.Suzuki. REM Studies of Surface Dynamics on Si Surfaces, in Proc. 55th Annual Meeting of the Microscopy Society of America (Cleveland, 1997), in Proc. 55th Annual Meeting of the Microscopy Society of America (Cleveland, 1997), pp. 579-580, 1997.
• H.Minoda, Y.Tanishiro, K.Yagi. REM and TEM Studies of Thin Film Growth Dynamics on Si Surfaces, in Mat.Res.Soc.Symp.Proc., in Mat.Res.Soc.Symp.Proc., Vol. 404, pp. 131-141, 1996.
• T.Suzuki, Y.Tanishiro, H.Minoda, K.Yagi. REM Observations of Si(5 5 12) Surfaces, in Proc.13th International Congress on Electron Microscopy (Paris, 1994), in Proc.13th International Congress on Electron Microscopy (Paris, 1994), pp. 1033-1034, 1994.
• K.Yagi, Y.Tanishiro, H.Minoda. Electron Microscope Studies of Surface Dynamic Processes, in Book “Thin Films and Phase Transitions on Surfaces “ (Proceedings of the East-West Surface Science Workshop ’94 (EWSSW94) , Pamporovo(1994), Eds. by M.Michailov and I.Gutzow), in Book “Thin Films and Phase Transitions on Surfaces “ (Proceedings of the East-West Surface Science Workshop ’94 (EWSSW94) , Pamporovo(1994), Eds. by M.Michailov and I.Gutzow), pp. 223-230, 1994.
• H.Minoda, Y.Tanishiro, N.Yamamoto, K.Yagi. Growth of Ge on Au Adsorbed Si(001) Studied by REM, in Proc.13th International Congress on Electron Microscopy (Paris, 1994), in Proc.13th International Congress on Electron Microscopy (Paris, 1994), pp. 1031-1032, 1994.
• Y.Tanishiro, M.Fukuyama, K.Yagi. REM and RHEED Studies of Pb Adsorption on Si (111), Mater. Res. Soc. Proc. Materials Research Society Symposium Proceedings, Mater. Res. Soc. Proc. Materials Research Society Symposium Proceedings, Vol. 280, pp. 109-117, 1993.
• K.Takayanagi, Y.Tanishiro. Symmetry and Ordering of Metal Deposits on the Si(111)7x7 Surface, in book of Ordering at Surfaces and Interfaces, eds. A.Yoshimori, T.Shinjo and H.Watanabe, Springer-Verlag , in book of Ordering at Surfaces and Interfaces, eds. A.Yoshimori, T.Shinjo and H.Watanabe, Springer-Verlag , pp. 273-278, 1992.
• A.Yamanaka, Y.Tanishiro, K.Yagi. Surface Electromigration of Au on Si(111) Studied by REM, in book of Ordering at Surfaces and Interfaces, eds. A.Yoshimori, T.Shinjo and H.Watanabe, Springer-Verlag, in book of Ordering at Surfaces and Interfaces, eds. A.Yoshimori, T.Shinjo and H.Watanabe, Springer-Verlag, pp. 215-226, 1992.
• I.Homma, Y.Tanishiro, K.Yagi. REM and TEM Studies of 2D Alloy Adsorbate on Si(111) Surface, in book of The Structure of Surfaces III, eds. S.Y.Tong, M.A.Van Hove, X.Xide and K.Takayanagi, Springer-Verlag, Berlin , in book of The Structure of Surfaces III, eds. S.Y.Tong, M.A.Van Hove, X.Xide and K.Takayanagi, Springer-Verlag, Berlin , Vol. 3, pp. 610-614, 1991.
• Y.Tanishiro, M.Fukuyama, K.Yagi. REM and RHEED Studies of Lead Adsorption on Silicon(111) Surfaces, The Structure of Surfaces III, Springer-Verlag, Berlin, The Structure of Surfaces III, Springer-Verlag, Berlin, pp. 623-627, 1991.
• K.Takayanagi, Y.Tanishiro, K.Murooka, M.Mitome. High-Resolution UHV Electron Microscopy on Surfaces and Heteroepitaxy, Mat.Res.Soc.Symp.Proc., Mat.Res.Soc.Symp.Proc., Vol. 139, pp. 59-66, 1989.
• K.Yagi, S.Ogawa, Y.Tanishiro. Reflection Electron Microscopy with Use of CTEM: Studies of Au Growth on Pt(111), Proc. of NATO advanced Research Workshop (Veldhoven, 1987; Eds. by R.K.Larsen and P.J.Dobson, Plenum Press, NATO ASI Series B), Proc. of NATO advanced Research Workshop (Veldhoven, 1987; Eds. by R.K.Larsen and P.J.Dobson, Plenum Press, NATO ASI Series B), Vol. 188, pp. 285-301, 1987.
• Y.Tanishiro, K.Takayanagi, S.Takahashi, M.Takahashi, K.Yagi. Validity of Kinematical Approximation in Transmission Electron Diffraction for Structure Analysis of Si(111)-7x7 Reconstructed Surface, Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Vol. 2, pp. 1339-1340, 1986.
• K.Kajiyama, K.Takayanagi. Y.Tanishiro, K.Yagi. Transmission Electron Diffraction and Microscopy of 5x5 and 7x7 Reconstructed Structures of Ge Deposited on Si(111), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Vol. 2, pp. 1341-1342, 1986.
• T.Nakayama, K.Takayanagi. Y.Tanishiro, K.Yagi. Transmission Electron Diffraction Analysis of the Si(001)-2x1 Reconstructed Surface, Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Vol. 2, pp. 1343-1344, 1986.
• S.Ogawa, Y.Tanishiro, K.Kobayashi, K.Takayanagi, K.Yagi. In-situ UHV REM Studies of Fast Atom Bombardment and Annealing Processes on Clean Surfaces, Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Vol. 2, pp. 1349-1350, 1986.
• T.Ishitsuka, K.Takayanagi. Y.Tanishiro, K.Yagi. Reflection and Transmission Electron Microscopy and Diffraction Study of Cu Condensation on Si(111)-7x7 Reconstructed Surface, Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Vol. 2, pp. 1347-1348, 1986.
• K.Takayanagi, Y.Tanishiro, K.Kobayashi, N.Yamamoto, K.Yagi, K.Ohi, Y.Kondo, H.Hirano, Y.Ishibashi, H.Kobayashi, Y.Harada. A New Ultra-high Vacuum and High Resolution Electron Microscope for In-situ Surface Study, Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Proc.11th International Congress on Electron Microscopy (Kyoto, 1986), Vol. 2, pp. 1337-1338, 1986.
• O.L.Krivanek, Y.Tanishiro, K.Yagi, R.P.Burgner. Electron Energy Loss Spectroscopy in Glancing Angle and Other Recent EELS Developments, Proc. 41st Annual Meeting of the Electron Microscopy Society of America (San Francisco, 1983), Proc. 41st Annual Meeting of the Electron Microscopy Society of America (San Francisco, 1983), pp. 386-387, 1983.
• Y.Tanishiro, K.Takayanagi, K.Kobayashi, K.Yagi. Double Tilt Specimen Holder for Contrast Analyses in Reflection Electron Microscopy, Proc.10th International Congress on Electron Microscopy (Hamburg, 1982), Proc.10th International Congress on Electron Microscopy (Hamburg, 1982), Vol. 2, pp. 299-300, 1982.
• K.Takayanagi, Y.Tanishiro, M.Takahashi, H.Motoyoshi, K.Yagi. UHV-transmission Electron Diffraction Study on (111)Si-7x7 Surface, Proc.10th International Congress on Electron Microscopy (Hamburg, 1982), Proc.10th International Congress on Electron Microscopy (Hamburg, 1982), Vol. 2, pp. 285-286, 1982.
• K.Yagi, N.Osakabe, Y.Tanishiro, G.Honjo. Reflection Electron Microscope Study of Au and Ag Deposited (111) and (001) Si Surfaces, Proc. 4th International Conference on Solid Surfaces (Cannes, 1980), Proc. 4th International Conference on Solid Surfaces (Cannes, 1980), Vol. 2, pp. 1007-1010, 1980.
• Y.Tanishiro, H.Kanamori, K.Takayanagi, K.Kobayashi, K.Yagi, G.Honjo. Electron Microscope Study of Reconstructed (111) Gold Surface, Proc. 4th International Conference on Solid Surfaces (Cannes, 1980), Proc. 4th International Conference on Solid Surfaces (Cannes, 1980), Vol. 1, pp. 683-686, 1980.
• K.Yagi, K.Takayanagi, K.Kobayashi, N.Osakabe, Y.Tanishiro, G.Honjo. Surface Study by UHV Electron Microscope, Proc. 9th International Congress on Electron Microscopy (Toronto, 1978), Proc. 9th International Congress on Electron Microscopy (Toronto, 1978), Vol. 1, pp. 458-459, 1978.

国際会議発表 (査読有り)

• T. Sannomiya, H. Sawada, T. Nakamichi, F. Hosokawa, YOSHIO NAKAMURA, Y. Tanishiro, K. Takayanagi. Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors, Microscopy and Microanalysis, Aug. 2013.
• Lee, S., Oshima, Y., YASUMASA TANISHIRO, Takayanagi, K.. In-situ ABF-STEM Observation of Structure Transformation of Spinel LiV2O4 Crystals, Microscopy and Microanalysis, Vol. 18, No. S2, pp. 368-369, 2012.

国際会議発表 (査読なし・不明)

• Toshikatsu Kaneyama, Takeshi Tomita, Fumio Hosokawa, Hidetaka Sawada, Takumi Sannomiya, Syunji Deguchi, Muneyuki Kawazoe, Takahisa Miyata, Eiji Kobayashi, Yukihito Kondo, Yasumasa Tanishiro, Kunio Takayanagi. Design and Development of 300 kV Super-High Resolution FETEM “R005”, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. 1452, Sept. 2006.
• Yasumasa Tanishiro, Kunio Takayanagi. Development of Image Recording System for In-situ High-resolution TEM Observation: Lens-coupling Electron Multiplier CCD (EM-CCD) System, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. SP4_a1, Sept. 2006.
• Yasumasa Tanishiro, Kunio Takayanagi. Development of TEM-STM Holder for 4D Observation, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. P4I_88, Sept. 2006.
• Yasumasa Tanishiro, Keita Ogawa, Tsukasa Hattori, Satoshi Teraguchi, Kunio Takayanagi. Silver and Carbon Nanowires Formed Between Silver Electrodes Studied by TEM-STM, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. P8M_80, Sept. 2006.
• Chiaki Akahori, Satoshi Miwa, Yasumasa Tanishiro, Kunio Takayanagi. Structure Change of Gold Nanowire Caused by Stress Change Studied by TEM-AFM, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. P8M_89, Sept. 2006.
• Fumio Hosokawa, Hidetaka Sawada, Takumi Sannomiya, Toshikatsu Kaneyama, Yukihito Kondo, Madoka Hori, Shyuichi Yuasa, Muneyuki Kawazoe, Tomonori Nakamichi, Yasumasa Tanishiro, Naoki Yamamoto, Kunio Takayanagi. Design and Development of Cs corrector for a 300 kV TEM and STEM, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. 1946, Sept. 2006.
• H.Sawada, T.Sannomiya, F.Hosokawa, T.Kaneyama, Y.Kondo, Y.Tanishiro, K.Takayanagi. Method to Measure Aberrations from Ronchigram by Auto-Correlation Function, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. 1818, Sept. 2006.
• Kunio Takayanagi, Yoshifumi Oshima, Yoshihiko Kurui, Makoto Yoshida, Yasumasa Tanishiro. Transmission Electron Microscopy on Atomic Chains and Nanowires at Quantum Contact： From Metal Bridge to Molecular Bridge, The 16th International Microscopy Congress, Proc. 16th Int. Microsc. Cong., pp. 1963, Sept. 2006.
• Y. Tanishiro, S. Shibata, H. Minoda, K. Takayanagi, Y. Kondo. In-situ electron microscopy on nanowires and nanocontacts, The 13th European Microscopy Congress 2004, Proc. 13th European Microscopy Congress 2004, pp. MS03b.I2, Aug. 2004.

国内会議発表 (査読なし・不明)

• 三宮工, 沢田英敬, 中道智寛, 細川史生, 中村吉男, 谷城康眞. STEMロンチグラムの収差中心決定法の実装, May 2013.
• 谷城康眞. 50pm分解能電子顕微鏡が拓くナノ構造解析, 2013年度精密工学会春季大会, 2013年度精密工学会春季大会講演論文集, 公益社団法人 精密工学会, F61, Mar. 2013.
• 春本 高志, 三宮工, 村石 信二, 史 蹟, 中村 吉男, 沢田英敬, 田中 崇之, 谷城 康眞, 高柳邦夫. 高配向（金属-AlN）多層膜の Cs 補正 STEM 観察, 顕微鏡学会, 2012.
• 三宮工, 沢田英敬, 中道 智寛, 細川 史生, 中村 吉男, 谷城 康眞, 高柳邦夫. STEM 完全自動収差補正に向けたロンチグラム上の収差中心の見つけ方, 顕微鏡学会, 2012.
• 谷城康眞, 寺口聡, 服部司, 高柳邦夫. 高感度CCD-TEM-STM による ナノワイヤ構造変化の動的観察, 日本物理学会2006年秋季大会, 日本物理学会, Vol. 61, No. 2- Part4, pp. 25pPSB-59, Sept. 2006.
• 谷城康眞, 金秀鉉, 高柳邦夫. 広領域観察可能なTEM-STM の開発, 日本物理学会2006年秋季大会, 日本物理学会, Vol. 61, No. 2- Part4, pp. 25pPSB-26, Sept. 2006.
• 赤堀千明, 谷城康眞, 高柳邦夫. 応力印加に伴う金ナノワイヤの構造変化Ⅱ, 日本物理学会2006年秋季大会, 日本物理学会, Vol. 61, No. 2- Part4, pp. 25aYC-3, Sept. 2006.
• 小川慶太, 服部司, 寺口聡, 谷城康眞, 高柳邦夫. TEM-STMによるAgナノワイヤの構造観察および電気計測 III, 日本物理学会第61回年次大会, 日本物理学会, Vol. 61, No. 1- Part4, pp. 30pXJ-4, Mar. 2006.
• 赤堀千明, 三輪哲史, 谷城康眞, 高柳邦夫. 応力変化に伴う金ナノワイヤの構造変化, 日本物理学会第61回年次大会, 日本物理学会, Vol. 61, No. 1- Part4, pp. 30pXJ-5, Mar. 2006.
• 三輪哲史, 赤堀千明, 谷城康眞, 高柳邦夫. 応力印加時の金ナノワイヤの変形・破断過程の構造観察, 日本物理学会第61回年次大会, 日本物理学会, Vol. 61, No. 1- Part4, pp. 30aPS-70, Mar. 2006.
• 小川慶太, 寺口聡, 服部司, 谷城康眞, 高柳邦夫. TEM-STMを用いたAgナノワイヤの構造と電気伝導の研究, 日本物理学会第61回年次大会, 日本物理学会, Vol. 61, No. 1- Part4, pp. 30aPS-71, Mar. 2006.

その他の論文・著書など

• 高柳 邦夫, 大島 義文, 李 少淵, 田中 崇之, 谷城康眞. 収差補正電子顕微鏡と表面・界面科学, 表面科学 : hyomen kagaku = Journal of the Surface Science Society of Japan, The Surface Science Society of Japan, Vol. 34, No. 5, pp. 226-233, May 2013.
• 大島 義文, 谷城 康眞, 田中 崇之, 高柳 邦夫. 球面収差補正透過型電子顕微鏡法を用いたアトミックスケールでの構造解析, 日本結晶学会誌, 日本結晶学会, Vol. 54, No. 3, pp. 159-165, June 2012.
• 谷城康眞, 近藤行人, 高柳邦夫. 国産球面収差補正電子顕微鏡R005の開発, J. Vac. Soc. Japan, 日本真空協会, Vol. 51, No. 11, pp. 714-718, Nov. 2008.  公式リンク  
  

学位論文

• 超高真空電子顕微鏡によるAu(111)表面の異常構造の研究,  Master of Science,  東京工業大学,  1980/--/--, 

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