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石原宏 研究業績一覧 (694件)
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論文
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K.Kato,
K.Suzuki,
K.Tanaka,
D.Fu,
K.Nishizawa,
T.Miki,
H.Ishiwara.
Ferroelectric characteristics of silicate-bound (Bi,La)4Ti3O12 thin films,
Appl. Phys. A,
Vol. 80,
pp. 271-273,
2005.
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Y.Fujisaki,
S.Ogasawara,
H.Ishiwara.
Advanced MFIS structure with Al2O3/Si3N4 stacked buffer layer,
Ferroelectrics,
Vol. 292,
pp. 3-13,
2003.
-
S.Kikuchi,
H.Ishiwara.
Improvement of ferroelectric properties in RF-magnetron- sputtered SrBi2Ta2O9 thin films by addition of Si atoms,
Jpn. J. Appl. Phys.,
Vol. 44, Part 2,
No. 4,
pp. L161- L163,
Jan. 2005.
-
H.Ohki,
H.Ishiwara.
Characterization of (Bi,La)4Ti3O12 film formed on Pt electrode with (Cr,Ti)N/TiN/Ti barrier layers,
Ferroelectrics,
Vol. 293,
pp. 101-110,
2003.
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B-E.Park,
K.Takahashi,
H.Ishiwara.
Fabrication and electrical properties of Pt/ (Bi,La)4Ti3O12/HfO2/Si structures,
J. Korean Phys. Soc.,
Vol. 46,
No. 1,
pp. 346-349,
Jan. 2005.
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K.Aizawa,
H.Ishiwara.
Evaluation of ferroelectric/silicon interface state density in ferroelectric-gate transistors using a charge pumping method,
Ferroelectrics,
Vol. 293,
pp. 119-126,
2003.
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H.Ohki,
X.Wang,
H.Ishiwara.
Improvement of ferroelectric properties in Mo-substituted Bi3.35La0.75Ti3O12 films by optimization of heating rate,
Jpn. J. Appl. Phys.,
Vol. 44, Part 1,
No. 2,
pp. 964- 967,
Feb. 2005.
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B-E.Park,
H.Ishiwara.
Formation of (Bi,La)4Ti3O12 films on Si (100) substrates using LaAlO3 buffer layers,
Ferroelectrics,
Vol. 293,
pp. 145-152,
2003.
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T.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Fatigueless ferroelectric capacitors with ruthenium bottom and top electrodes formed by metalorganic chemical vapor deposition,
Jpn. J. Appl. Phys.,
Vol. 44, Part 2,
No. 12,
pp. L378-L380,
Mar. 2005.
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K.Kato,
K.Suzuki,
K.Tanaka,
D.Fu,
K.Nishizawa,
T.Miki,
H.Ishiwara.
Ferroelectric characteristics of silicate-bound (Bi,La)4Ti3O12 thin films,
Appl. Phys. A,
Vol. Online,
2003.
-
H.Ohki,
Y.Fujisaki,
H.Ishiwara.
Characterization of Si- and Mo-codoped Bi3.35La0.75Ti3O12 ferroelectric thin films,
Jpn. J. Appl. Phys.,
Vol. 44, Part 1,
No. 3,
pp. 1329- 1332,
Mar. 2005.
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K.Iseki,
Y.Fujisaki,
H.Ishiwara.
Improvement of crystallinity in sol-gel derived (Bi,La)4Ti3O12 films by optimizing dry-gel structures,
Integrated Ferroelectrics,
Vol. 52,
pp. 33-40,
2003.
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H-S.Kim,
S.Yamamoto,
T.Ishikawa,
T.Fuchikami,
H.Ohki,
H.Ishiwara.
Fabrication and characterization of 1k-bit 1T2C-type ferroelectric memory cell array,
Jpn. J. Appl. Phys.,
Vol. 44, Part 1,
No. 4B,
pp. 2715-2721,
Apr. 2005.
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K.Kato,
H.Ishiwara.
Address of SiO2-based addtives in Bi4Ti3O12 thin films,
Integrated Ferroelectrics,
Vol. 52,
pp. 95-102,
2003.
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S.K.Singh,
H.Ishiwara.
Reduced Leakage Current in BiFeO3 Thin Films on Si Substrates Formed by a Chemical Solution Method,
Jpn. J. Appl. Phys.,
Vol. 44, Part 2,
No. 23,
pp. L734-L736,
May 2005.
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B.-E.Park,
H.Ishiwara.
Formation of Silicate-Added (Bi,La)4Ti3O12 Films on LaAlO3/Si(100) Structures,
Integrated Ferroelectrics,
Vol. 52,
pp. 179-186,
2003.
-
Y.Fujisaki,
H.Ishiwara.
Ferroelectric thin film depositions for various types of FeRAMs (ferroelectric random access memories),
Mater. Res. Soc. Symp. (Materials and Processes for Nonvolatile Memories) Proc.,
Vol. 830,
pp. D2.1.1- D2.1.12,
2005.
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B.-E Park,
H.Ishiwara.
Retention characteristics of (Bi,La)4Ti3O12 films on Si(100) substrates using LaAlO3 buffer layers,
Integrated Ferroelectrics,
Vol. 52,
pp. 187-193,
2003.
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K.Aizawa,
Y.Kawashima,
H.Ishiwara.
Long time data retention and a mechanism in ferroelectric-gate field effect transistors with HfO2 buffer layer,
Mater. Res. Soc. Symp. (Materials and Processes for Nonvolatile Memories) Proc.,
Vol. 830,
pp. D2.9.1- D2.9.6,
2005.
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H.Ohki,
H.Ishiwara.
Characterization of BLT films formed by using a flash-annealing process on Pt/(Cr,Ti)N/TiN/Ti bottom electrode,
Integrated Ferroelectrics,
Vol. 52,
pp. 215-222,
2003.
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Y.Tabuchi,
B-E.Park,
K.Aizawa,
Y.Kawashima,
K.Takahashi,
K.Kato,
Y.Arimoto,
H.Ishiwara.
Formation of ferroelectric (Bi,Nd)4Ti3O12 thin films on HfO2/Si(100) structures for MFIS-type ferroelectric memory applications,
Integrated Ferroelectrics,
Vol. 65,
pp. 125-134,
2005.
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S.Kikuchi,
H.Ishiwara.
Preparation of Si-added SrBi2Ta2O9 ferroelectric thin films by RF magnetron sputtering,
Integrated Ferroelectrics,
Vol. 52,
pp. 237-244,
2003.
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K.Aizawa,
S.Kobayashi,
H.Ishiwara,
K.Suzuki,
K.Kato.
Ferroelectric-gate field effect transistors using (Y,Yb)MnO3/Y2O3/Si(111) structures for 1T-type FeRAMs,
Integrated Ferroelectrics,
Vol. 65,
pp. 169-174,
2005.
-
H-S.Kim,
S.Yamamoto,
H.Ishiwara.
Operation simulation of an 8F2 1T2C-type ferroelectric memory array with a revised data writing method,
Integrated Ferroelectrics,
Vol. 56,
pp. 1045-1054,
2003.
-
H-S.Kim,
S.Yamamoto,
H.Ishiwara.
Improvement of data readout disturbance effect in 1T2C-type ferroelectric memory,
Integrated Ferroelectrics,
Vol. 67,
pp. 271-280,
2005.
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B-J.Koo,
H.Ishiwara.
Fabrication and characterization ofgate-connected 1T2C-type ferroelectric memory with paired Bi4-XLaXTi3O12 capacitors,
Integrated Ferroelectrics,
Vol. 56,
pp. 1055-1064,
2003.
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S.Yamamoto,
T.Ishikawa,
T.Fuchikami,
H-S.Kim,
K.Aizawa,
B-E.Park,
T.Furukawa,
H.Ohki,
S.Kikuchi,
H.Hoko,
H.Ishiwara.
Fabrication of 1k-bit 1T2C-type ferroelectric memory cell array,
Integrated Ferroelectrics,
Vol. 67,
pp. 281-286,
2005.
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T.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Chemical vapor deposition of Ru bottom electrode for ferroelectric Bi4-XLaXTi3O12 capacitors,
Integrated Ferroelectrics,
Vol. 59,
pp. 1437-1443,
2003.
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K.Takahashi,
K.Aizawa,
B-E.Park,
H.Ishiwara.
Thirty-day-long data retention in ferroelectric-gate field-effect transistors with HfO2 buffer layers,
Jpn. J. Appl. Phys.,
Vol. 44, Part 1,
No. 8,
pp. 6218-6220,
Aug. 2005.
-
S.Kim,
S.Yamamoto,
H.Ishiwara.
Improved data disturbance effects in 1T2C-type ferroelectric memory array,
Jpn. J.Appl. Phys.,
Vol. 53,
No. 5A,
pp. 2558-2563,
2004.
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K.Aizawa,
H.Ishiwara.
Reduction of pyrochlore phase and pronounced improvemrnt of ferroelectric properties in ultrathin SrBi2Ta2O9 films derived from Bi-rich sol-gel solution,
Jpn. J. Appl. Phys.,
Vol. 44, Part 1,
No. 8,
pp. 6221-6223,
Aug. 2005.
-
H.Ohki,
X.Wang,
H.Ishiwara.
Ferroelectric properties of Mo-doped Bi4-XLaXTi3O12 films,
Integrated Ferroelectrics,
Vol. 61,
pp. 37-42,
2004.
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S.Ohara,
K.Aizawa,
H.Ishiwara.
Ferroelectric properties of Pt/Pb5Ge3O11/Pt and Pt/Pb5Ge3O11/HfO2/Si structures,
Jpn. J. Appl. Phys,
Vol. 44, Part 1,
No. 9A,
pp. 6644-6647,
Sept. 2005.
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T.Tamura,
H.Hoko,
Y.Arimoto,
H.Ishiwara.
Fabrication of sol-gel thin films of silicate- doped PZT,
Integrated Ferroelectrics,
Vol. 62,
pp. 105-107,
2004.
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S.K.Singh,
R.Ueno,
H.Funakubo,
H.Uchida,
S.Koda,
H.Ishiwara.
Dependence of ferroelectric properties on thickness of BiFeO3 thin films fabricated by chemical solution deposition,
Jpn. J. Appl. Phys.,
Vol. 44, Part 1,
No. 12,
pp. 8525-8527,
Dec. 2005.
-
B-E.Park,
H.Ishiwara.
Fabrication and characterization of (Bi,La)4Ti3O12 films using LaAlO3 buffer layers for MFIS structures,
Integrated Ferroelectrics,
Vol. 62,
pp. 141-147,
2004.
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S.K.Singh,
H.Funakubo,
H.Uchida,
H.Ishiwara.
Structural and electrical properties of BiFeO3 thin films,
Integrated Ferroelectric,
Vol. 76,
pp. 139-146,
2005.
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Y.Kawashima,
H.Ishiwara.
Formation of ultra thin SrBi2Ta2O9 films using protective layers,
Integrated Ferroelectrics,
Vol. 62,
pp. 155-161,
2004.
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X.Wang,
H.Ishiwara.
Properties of ferroelectric SrBi2Ta2O9-Bi4Ti3O12 thin films derived by the sol-gel method,
J. Crystal Growth,
Vol. 285,
pp. 103-110,
2005.
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T.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Leakage current suppression of Pt/Bi4-XLaXTi3O12/Ru capacitors by post-annealing of Ru films,
Integrated Ferroelectrics,
Vol. 62,
pp. 171-176,
2004.
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K.Aizawa,
H.Ishiwara.
Low voltage operation of ferroelectric capacitors using Sr-deficient and praseodymium-substituted strontium bismuth tantalete ultra thin films,
Integrated Ferroelectrics,
Vol. 62,
pp. 211-214,
2004.
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HIROSHI ISHIWARA.
Recent progress in FET-type ferroelectric memories,
Proc. of 1^st^ Intern. Sympo. on Dielectrics for Nanosystems : Materials Science, Processing, Reliability, and Manufacturing (Electrochem. Soc. Pennington, 2004),
pp. 195-205,
2004.
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T.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Fabrication of Ru/Bi4-XLaX Ti3O12/Ru ferroelectric capacitor structure using a Ru film deposited by metalorganic chemical vapor deposition,
Mater. Res. Soc. Sympo. Proc. (Ferroelectric Thin Films XII),
Vol. 784,
pp. C7.7.1-C7.7.6,
2004.
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Y.Fujisaki,
K.Iseki,
H.Ishiwara.
Long retention performance of a MFIS device achieved by introducing high-k Al2O3/Si3N4/Si buffer layer,
Mater. Res. Soc. Sympo. Proc. (Ferro- electric Thin Films XII),
Vol. 784,
pp. C(E)9.6.1-C(E)9.6.11,
2004.
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K.Aizawa,
B-E.Park,
Y.Kawashima,
K.Takahashi,
H.Ishiwara.
Impact of HfO2 buffer layers on data retention characteristics of ferroelectric-gate field effect transistors,
Appl. Phys. Lett.,
Vol. 85,
No. 15,
pp. 3199-3201,
2004.
-
B-E.Park,
K.Takahashi,
H.Ishiwara.
Five-day-long ferroelectric memory effect in Pt/(Bi,La)4Ti3O12/HfO2/Si structures,
Appl. Phys. Lett.,
Vol. 85,
No. 19,
pp. 4448-4450,
2004.
-
B-E.Park,
K.Takahashi,
H.Ishiwara.
Fabrication and characterization of Pt/(Bi,La)4Ti3O12/ HfO2/Si(100) structures,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 12-03-P,
2004.
-
B-J.Koo,
Y.Hoshide,
H.Ishiwara.
Long-term retention characteristics of 1T2C-type ferroelectric memory,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 11-06-C,
2004.
-
K.Aizawa,
S.Kobayashi,
H.Ishiwara,
K.Suzuki,
K.Kato.
Ferroelectric-gate field effect transistors using (Y,Yb)MnO3/Y2O3/Si(111) structures for 1T-type FeRAMs,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 11-10-C,
2004.
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C.Aoki,
H.Hoko,
B-E.Park,
H.Ishiwara.
Electrical properties of HfxAlyO/Si and Bi3.45La0.75Ti3O12/HfxAlyO/Si structures,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 12-18-C,
2004.
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S.Yamamoto,
T.Ishikawa,
T.Fuchikami,
H-S.Kim,
K.Aizawa,
B-E.Park,
T.Furukawa,
H.Ohki,
S.Kikuchi,
H.Hoko,
H.Ishiwara.
Fabrication of 1k-bit 1T2C-type ferroelectric memory cell array,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 5-01-P,
2004.
-
H-S.Kim,
S.Yamamoto,
H.Ishiwara.
Improvement of data readout disturbance effects in 1T2C-type ferroelectric memory array,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 5-02-P,
2004.
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Y.Tabuchi,
B-E.Park,
K.Takahashi,
K.Kato,
Y.Arimoto,
H.Ishiwara.
Formation of ferroelectric (Bi,Nd)4Ti3O12 thin films on HfO2/Si(100) structures for MFIS-type ferroelectric memory applications,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 11-19-P,
2004.
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B-Y.Tan,
K.Iseki,
H.Ohki,
Y.Fujisaki,
H.Ishiwara.
Al2O3 hydrogen barrier encapsulation layer for FeRAM,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 11-20-P,
2004.
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K.Takahashi,
B-E.Park,
H.Ishiwara.
Electrical properties of Pt/SrBi2Ta2O9/HfO2/Si structure for a 1T-type ferroelectric memory,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 11-24-P,
2004.
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HIROSHI ISHIWARA.
Current status and prospect of FET-type ferroelectric memories,
16th Intern. Sympo. on Integrated Ferroelectrics, Gyeongiu,
No. 5-04-I,
2004.
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K.Takahashi,
B-E.Park,
K.Aizawa,
H.Ishiwara.
30-day-long data retention in ferroelectric-gate FET’s with HfO2 buffer layers,
Intern. Conf. on Solid State Devices and Materials, Tokyo,
No. D-1-2,
pp. 52-53,
2004.
-
H-S.Kim,
S.Yamamoto,
T.Ishikawa,
H.Ishiwara.
Fabrication and characteriza- tion of 1k-bit 1T2C-type ferroelectric memory cell array,
Intern. Conf. on Solid State Devices and Materials, Tokyo,
No. D-1-3,
pp. 54-55,
2004.
-
HIROSHI ISHIWARA.
Recent progress in FET-type ferroelectric memories,
1^st^ Intern. Sympo. on Dielectrics for Nanosystems : Materials Science, Processing, Reliability, and Manufacturing in 206^th^ Meeting of Electrochem. Soc. Honolulu,
No. 870,
2004.
-
S.K.Singh,
H.Ishiwara.
Thickness dependence properties of Bi3.25La0.75Ti3O12 thin film capacitors,
National Seminar on Ferroelectrics and Dielectrics, Delhi,
No. 67,
pp. 159-162,
2004.
-
Y.Fujisaki,
H.Ishiwara.
Ferroelectric thin film depositions for various types of FeRAMs (ferroelectric random access memories),
Fall Meeting of Mater. Res. Soc. (Sympo. D ; Materials and Processes for Nonvolatile Memories), Boston,
No. D2.1,
2004.
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K.Aizawa,
B-E.Park,
Y.Kawashima,
K.Takahashi,
H.Ishiwara.
Effect of Ferroelectric/HfO2/Si Structures on Electrical Properties of Ferroelectric-gate FETs,
Fall Meeting of Mater. Res. Soc. (Sympo. D ; Materials and Processes for Nonvolatile Memories), Boston,
No. D2.9,
2004.
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菊池真,
石原宏.
FRマグネトロンスパッタ法によるSi添加SiBi2Ta2O9強誘電体薄膜の作製(3),
第51回応用物理学関連連合講演会,
No. 30a-ZL-3,
2004.
-
大木博,
Xusheng Wang,
石原宏.
MoドープBi4-xLaxTi3O12薄膜の強誘電体特性に及ぼす昇温レートの効果,
第51回応用物理学関連連合講演会,
No. 30p-ZL-3,
2004.
-
大木博,
石原宏.
Si添加Bi3.35La0.75(Ti1-xMox)3O12強誘電体薄膜の特性評価,
第51回応用物理学関連連合講演会,
No. 30p-ZL-4,
2004.
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藤崎芳久,
井関邦江,
石原宏.
減圧仮焼成プロセスによるゲルゾルBLT薄膜の特性改善(2),
第51回応用物理学関連連合講演会,
No. 30p-ZL-10,
2004.
-
星出裕亮,
具本宰,
有本由弘,
石原宏.
均一なキャパシタ特性を持つ1T2C型強誘電体メモリの作製,
第51回応用物理学関連連合講演会,
No. 30p-ZL-17,
2004.
-
高橋憲弘,
朴炳垠,
川島良仁,
田渕良志明,
會澤康治,
石原宏.
(Bi,La)4Ti3O12/HfO2構造を用いたMFISダイオードおよび1T型FETの電気的特性評価,
第51回応用物理学関連連合講演会,
No. 30p-ZL-18,
2004.
-
會澤康治,
川島良仁,
高橋憲弘,
朴炳垠,
石原宏.
SBT/HfO2構造を用いたMFIS DiodeおよびFETの作製と評価,
第51回応用物理学関連連合講演会,
No. 30p-ZL-19,
2004.
-
田渕良志明,
朴炳垠,
會澤康治,
川島良仁,
高橋憲弘,
加藤一実,
有本由弘,
石原宏.
(Bi,Nd)4Ti3O12/HfO2/Si(100)構造MFIS型強誘電体メモリの作製とデータ保持特性の評価,
第51回応用物理学関連連合講演会,
No. 31a-ZL-1,
2004.
-
青木千恵子,
鉾宏真,
朴炳垠,
石原宏.
HfO2系非晶質バッファ層を用いたMFIS(metal-ferroelectric-insulator-semiconductor)構造の特性,
第51回応用物理学関連連合講演会,
No. 31p-ZL-1,
2004.
-
キムヒンス,
山本修一郎,
石原宏.
1T2C型強誘電体メモリアレイにおけるV/4ルールデータ書き込み法の提案,
第51回応用物理学関連連合講演会,
No. 31p-ZL-2,
2004.
-
タンブンイー,
井関邦江,
大木博,
藤崎芳久,
石原宏.
Radical-Si3N4/高誘電率バッファー層を用いたMFIS-FETの作製と評価,
第51回応用物理学関連連合講演会,
No. 31p-ZL-3,
2004.
-
青木千恵子,
石原宏,
鉾宏真.
HfSiON非晶質バッファ層を用いたMFIS型構造の特性,
第65回応用物理学会学術講演会,
No. 4a-Y-2,
2004.
-
キムヒンス,
山本修一郎,
石川徹,
石原宏.
1T2C型強誘電体メモリアレイの作製と評価,
第65回応用物理学会学術講演会,
No. 4a-Y-7,
2004.
-
會澤康治,
高橋憲弘,
田村哲朗,
有本由弘,
石原宏.
CVD HfO2薄膜をバッファ層に用いたSBT/HfO2/p-Si構造の作製と評価,
第65回応用物理学会学術講演会,
No. 4a-Y-8,
2004.
-
田渕良志明,
朴炳垠,
會澤康治,
川島良仁,
高橋憲弘,
田村哲朗,
鉾宏真,
加藤一実,
有本由弘,
石原宏.
(Bi, Nd)4Ti3O12/HfO2/Si(100)構造MFIS型強誘電体メモリの特性評価,
第65回応用物理学会学術講演会,
No. 4a-Y-9,
2004.
-
高橋憲弘,
會澤康治,
田村哲朗,
有本由弘,
石原宏.
(Bi,La)4Ti3O12/CVD HfO2構造を用いたMFISダイオードの電気的特性評価,
第65回応用物理学会学術講演会,
No. 4a-Y-10,
2004.
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M. S. Bozgeyik,
J. S. Cross,
H. Ishiwara,
K. Shinozaki.
Electrical and Memory Window Properties of Sr0.8-xBaxBi2.2Ta2-yZryO9 Ferroelectric Gate in Metal-Ferroelectric-Insulator-Semiconductor Structure,
Journal of Electroceramics,
Vol. 28,
No. 2-3,
pp. 158-164,
Mar. 2012.
-
Gwang-Geun Lee,
Yosihisa Fujisaki,
Hiroshi Ishiwara,
Eisuke Tokumitsu.
Low-voltage Operation of Ferroelectric Gate Thin Film Transistors Using Indium Gallium Zinc Oxide-Channel and Ferroelectric Polymer Poly(vinylidene fluoride-trifluoroethylene),
Applied Physics Express,
Vol. 4,
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Defect engineering for control of polarization fatigue in Bi3.25La0.75Ti3O12 thin film capacitors,
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Mater. Res. Soc. Symp. (Ferroelectric Thin Films XIII) Proc.,
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Thin Solid Films,
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Room temperature ferroelectric properties of SrBi2Ta2O9- and (Bi, La)4Ti3O12-incorporated BiFeO3 thin films,
Integrated Ferroelectrics,
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Characterization of (Bi,Nd)4Ti3O12/HfO2/p-Type Si Structures for MFIS-FeRAM Application,
Integrated Ferroelectrics,
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Solid State Communications,
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川島良仁,
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H.Ohki,
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Characterization of BLT films formed by using a flash-annealing process on Pt/(Cr,Ti)N/TiN/Ti bottom electrode,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 10.3.14-P,
2003.
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K.Iseki,
Y.Fujisaki,
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Improvement of crystallinity in sol-gel derived BLT by optimizing dry-gel,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 10.1.6-C,
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K.Kato,
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Address of SiO2-based additives in Bi4Ti3O12 thin films,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 10.2.6-I,
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S.Kikuchi,
H.Ishiwara.
Preparation of Bi2SiO5-SrBi2Ta2O9 ferroelectric thin films by RF magnetron sputtering,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 11.1.7-C,
2003.
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Y.Fjisaki,
K.Iseki,
H.Ishiwara.
Elimination of charge states in high-k Al2O3/Si3N4 stacked insulator using nitrogen radicals,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 5.2.5-C,
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菊地真,
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RFマグネトロンスパッタ法によるSi添加SrBi2Ta2O9強誘電体薄膜の作製(2),
第50回応用物理学関係連合講演会,
No. 27p-Q-12,
2003.
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Y.Fjisaki,
K.Iseki,
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Sympo. on Polar Oxides – Properties, Characterization and Imaging, Capri,
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2003 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices,
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Fabrication of sol-gel thin films of silicate doped PZT,
10th European Meeting on Ferroelectricity,
No. S07-F06,
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H.Ohki,
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Ferroelectric properties of Mo-doped Bi4-XLaXTi3O12 films,
10th European Meeting on Ferroelectricity,
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New line of solid solution system of oxide ferroelectrics,
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Jpn. J. Appl. Phys.,
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Jpn. J. Appl. Phys.,
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Ferroelectric characteristics control of (Bi,La)4Ti3O12 and SrBi2Ta2O9 films by addition of silicates and germanates,
Jpn. J. Appl. Phys.,
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T.Kijima,
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Preparation of ferroelectric thin films using sol-gel solutions dissolved in supercritical carbon dioxide,
Jpn. J. Appl. Phys.,
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X.Wang,
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Polarization enhancement and coercive field reduction in W- and Mo-doped Bi3.35La0.75Ti3O12 thin films,
Appl. Phys. Lett.,
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2003.
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B.J.Koo,
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Characteristics of 1T2C-type ferroelectric memory with paired Bi4-xLaxTi3O12 (BLT) capacitors,
J. Korean Phys. Soc.,
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Recent Progress on Ferroelectric Memories,
Intern. J. High Speed Electronics and Systems,
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2003.
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Y.Fujisaki,
K.Iseki,
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Jpn. J. Appl. Phys.,
Vol. 42,
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井関邦江,
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石原宏.
LSMCDによるAl2O3/Si3N4バッファー層上への(Bi,La)4Ti3O12薄膜の作製,
第64回応用物理学会学術講演会,
No. 30p-T-3,
2003.
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K.Aizawa,
H.Ishiwara.
Praseodymium-substituted strontium bismuth tantalate films with saturated remanent polarization at 1V,
Jpn. J. Appl. Phys.,
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Effects of SiO2-based additives on Bi-based layer-structured ferroelectrics,
Key Engineering Materials,
Vol. 248,
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Y.Idemoto,
T.Miyahara,
N.Koura,
T.Kijima,
H.Ishiwara.
Crystal structure and ferro- electric properties of (Bi,La)4(Ti,Si)3O12 as a bulk ferroelectric material,
Solid State Communications,
Vol. 128,
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金泫秀、山本修一郎、石原宏.
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電子情報通信学会技術研究報告,
No. SDM2002-267,
2003.
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藤崎芳久,
井関邦江,
石原宏.
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電子情報通信学会技術研究報告,
No. SDM2002-271,
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電気学会,電子材料研究会資料,
No. EFM-03-15,
2003.
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H-S.Kim,
S.Yamamoto,
H.Ishiwara.
Operation simulation of an 8F2 1T2C-type ferroelectric memory array with a revised data writing method,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 4.1.7-C,
2003.
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B.J.Koo,
H.Ishiwara.
Fabrication and characterization of gate-connected 1T2C-type ferroelectric memory with paired Bi4-XLaXTi3O12 (BLT) capacitors,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 4.1.8-C,
2003.
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T.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Chemical vapor deposition of Ru bottom electrode for ferroelectric Bi4-XLaXTi3O12 capacitors,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 8.2.2-C,
2003.
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T.Ishikawa,
S.Yamamoto,
T.Fuchikami,
T.Furukawa,
K.Aizawa,
B-E.Park,
S.Kikuchi,
H.Ohki,
H.Hoko,
H.Ishiwara.
Fabrication of 1T2C-type ferroelectric memory cell array,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 4.3.1-P,
2003.
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H.Ishiwara.
Recent progress in FET-type ferroelectric memories,
Intern. Electron Devices Meeting,
No. 10.3,
2003.
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Y.Fujisaki,
K.Iseki,
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Long retention performance of a MFIS device achieved by introducing high-k Al2O3/Si3N4/Si Buffer layer,
Fall Meeting of Mater. Res. Soc. (Sympo. C ; Ferroelectric thin Films XII),
No. C9.6,
2003.
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D.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Fabrication of Ru/Bi4-XLaXTi3O12/Ru ferroelectric capacitor structure using a Ru film deposited by metalorganic chemical vapor deposition,
Fall Meeting of Mater. Res. Soc. (Sympo. C ; Ferroelectric thin Films XII),
No. C7.7,
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松本貴希,
石原宏.
ゲートトンネルリング電流に基づくSOIデバイス特性の変化,
第64回応用物理学会学術講演会,
No. 31p-A-11,
2003.
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古川泰助,
黒岩丈晴,
藤崎芳久,
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MOCVD法によるRu膜の強誘電体メモリ電極への適用検討(3),
第64回応用物理学会学術講演会,
No. 2p-V-7,
2003.
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木島健,
石原宏.
Siを添加した強誘電体薄膜の諸特性,
第64回応用物理学会学術講演会,
No. 1p-V-1,
2003.
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大木博,
X-Wang,
石原宏.
Bi4xLaxTi3O12強誘電体薄膜に対するMoドープ効果,
第64回応用物理学会学術講演会,
No. 30p-V-12,
2003.
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朴炳垠,
石原宏.
Pt基板上に形成したBLT((Bi,La)4Ti3O12)薄膜の昇温レート依存性,
第64回応用物理学会学術講演会,
No. 30p-V-11,
2003.
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川島良仁,
石原宏.
超臨界二酸化炭素を利用した強誘電体薄膜の作製,
第64回応用物理学会学術講演会,
No. 30p-V-1,
2003.
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菊地真,
石原宏.
RFマグネトロンスパッタ法によるSi添加SrBi2Ta2O9強誘電体薄膜の加熱基板上への成膜,
第64回応用物理学会学術講演会,
No. 30a-V-11,
2003.
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會澤康治,
石原宏.
Bi過剰前駆体溶液を用いたゾルゲルSBT極薄膜の形成と分極特性,
第64回応用物理学会学術講演会,
No. 30a-V-6,
2003.
-
山本修一郎,
石原宏.
1T2C型強誘電体メモリアレイの読み出し回路の設計と評価,
第64回応用物理学会学術講演会,
No. 30p-T-17,
2003.
-
具本宰,
星出裕亮,
石原宏.
BLT薄膜を用いた1T2C型強誘電体メモリのデータ保持特性,
第64回応用物理学会学術講演会,
No. 30p-T-16,
2003.
-
金泫秀,
山本修一郎,
石原宏.
1T2C型強誘電体メモリセルに対する読み出しディスターブの低減法,
第64回応用物理学会学術講演会,
No. 30p-T-15,
2003.
-
タンブン イー,
斉藤亮平,
山本修一郎,
石原宏.
強誘電体を用いた不揮発性CMOSラッチ回路の特性評価,
第64回応用物理学会学術講演会,
No. 30p-T-14,
2003.
-
藤崎芳久,
井関邦江,
石原宏.
Pt/LSMCD-BLT/ALD-ALD/Al2O3/Radical-Si3N4/Siの長期データ保持特性,
第64回応用物理学会学術講演会,
No. 30p-T-4,
2003.
-
石川徹,
山本修一郎,
石原宏.
SPICEによる1T2C型強誘電体メモリアレイの動作解析,
第50回応用物理学関係連合講演会,
No. 30p-R-1,
2003.
-
山本修一郎,
石原宏.
強誘電体を用いたCMOS不揮発性ラッチ回路の消費電力の評価,
第50回応用物理学関係連合講演会,
No. 30a-R-11,
2003.
-
金泫季,
山本修一郎,
石原宏.
1T2C型強誘電体メモリアレイに対するデータ書き込みディスターブの低減法,
第50回応用物理学関係連合講演会,
No. 30a-R-10,
2003.
-
具本宰,
石原宏.
BLT薄膜を用いたゲート接続型1T2C強誘電体メモリの特性,
第50回応用物理学関係連合講演会,
No. 30a-R-9,
2003.
-
朴炳垠,
石原宏.
BLT/LaAlO3/Si(100)キャパシタの作製と保持特性,
第50回応用物理学関係連合講演会,
No. 30a-R-5,
2003.
-
小林宗太,
朴炳垠,
會澤康治,
石原 宏.
MBE法で作製したLaALO3/Si構造を用いたMFISダイオードの作製と電気的特性,
第50回応用物理学関係連合講演会,
No. 30a-R-2,
2003.
-
藤崎芳久,
井関邦江,
石原宏.
Radical-Si3N4/ALD-Al2O3high-k膜のポスト窒化による特性改善,
第50回応用物理学関係連合講演会,
No. 29p-ZX-21,
2003.
-
藤崎芳久,
井関邦江,
石原宏.
減圧仮焼成プロセスによるゾルゲルBLT薄膜の特性改善,
第50回応用物理学関係連合講演会,
No. 29a-R-8,
2003.
-
井関邦江,
藤崎芳久,
渡辺隆之,
舟窪浩,
石原宏.
Bi堆積層を用いたゾルゲル(Bi,La)4Ti3O12薄膜の結晶性制御,
第50回応用物理学関係連合講演会,
No. 29a-R-7,
2003.
-
井出本康,
小浦延幸,
石原宏,
C.-K.Loong,
J.W.Richardson,
Jr..
Bi3.25La0.75(Ti,Si)3O12の熱処理による結晶構造、物性と強誘電体特性の関係,
第50回応用物理学関係連合講演会,
No. 29a-R-6,
2003.
-
井出本康,
磯英治,
菊池淳,
小浦延幸,
石原宏,
C.-K.Loong,
J.W.Richardson,
Jr..
(Bi,La)4+x(Ti,Si)3-yO12の結晶構造、物性と強誘電体特性の関係,
第50回応用物理学関係連合講演会,
No. 29a-R-5,
2003.
-
大木博,
石原宏.
Pt/CrTiN/TiN/Ti下部電極上の Bi4-xLaxTi3O12薄膜に及ぼすFlash-Annealingの効果,
第50回応用物理学関係連合講演会,
No. 29a-R-3,
2003.
-
加藤一実,
鈴木一行,
符徳勝,
西澤かおり,
三木健,
石原宏.
Bi4Ti3O12強誘電体薄膜の構造と特性に対するSiO2系添加物の効果,
第50回応用物理学関係連合講演会,
No. 28a-R-11,
2003.
-
井出本康,
小浦延幸,
石原宏,
J.W.Richardson,
Jr.,
C.-K.Loong.
Bi4(Ti,Si)3O12の結晶構造、物性と強誘電体特性の関係および熱処理効果,
第50回応用物理学関係連合講演会,
No. 28a-R-1,
2003.
-
B-E.Park,
H.Ishiwara.
Effect of temperature raising rate in crystallization process on electrical properties of (Bi,La)4Ti3O12 films derived by sol-gel method,
10th European Meeting on Ferroelectricity,
No. S18-A04,
2003.
-
B-E.Park,
H.Ishiwara.
Formation of silicate-added (Bi,La)4Ti3O12 films on LaAlO3/Si structures,
15th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 10.3.9-P,
2003.
-
Y.Kawashima,
H.Ishiwara.
A novel chemical solution deposition method suitable for high-yield fabrication of 50-nm-thick SrBi2Ta2O9 capacitors,
Intern. Conf. on Solid State Devices and Materials,
No. B-1-5,
2003.
-
古川泰助,
黒岩丈晴,
藤崎芳久,
佐藤剛,
石原宏.
MOCVD法によるRu膜の強誘電体メモリ電極への適用検討(Ⅱ),
第50回応用物理学関係連合講演会,
No. 27p-R-1,
2003.
-
會澤康治,
石原宏.
Pr-SrBi2Ta2O9薄膜の作製と電気的特性評価,
第50回応用物理学関係連合講演会,
No. 27p-Q-10,
2003.
-
井出本康,
高橋智之,
小浦延幸,
石原宏,
C.-K.Loong,
J.W.Richardson,
Jr..
Sr1-xBi2+x(Ta,Si)2O9-■δ(X=0,0.2)の結晶構造、物性と強誘電体特性,
第50回応用物理学関係連合講演会,
No. 27p-Q-4,
2003.
-
岡本大輔,
會澤康治,
石原宏.
Sr0.8Bi2.2Ta2.0O9キャパシタのRTA昇温レート依存性,
第50回応用物理学関係連合講演会,
No. 27p-Q-6,
2003.
-
田渕良志明,
田村哲朗,
石原宏.
Biバッファ層を用いたシリケート添加BLT薄膜の特性評価,
第64回応用物理学会学術講演会,
No. 30p-V-14,
2003.
-
H.Ishiwara.
Recent progress in ferroelectric-gate FETs,
Mater. Res. Soc. Sympo. Proc.,
Vol. 748,
pp. 297-304,
2003.
-
S.Kikuchi,
H.Ishiwara.
Preparation of Bi2SiO5-SrBi2Ta2O9 ferroelectric thin films by RF magnetron sputtering,
Mater. Res. Soc. Sympo. Proc.,
Vol. 748,
pp. 117-122,
2003.
-
Y.Fujisaki,
K.Iseki,
H.Ishiwara,
M.Mao,
R.Bubber.
Al2O3/Si3N4 stacked insulators for 0.1μm gate metal-oxide-semiconductor transistors realized by high-density Si3N4 buffer layers,
Appl. Phys. Lett.,
Vol. 82,
No. 22,
pp. 3931-3933,
2003.
-
T.Furukawa,
T.Kuroiwa,
Y.Fujisaki,
T.Sato,
H.Ishiwara.
Leakage current suppression of Pt/ Bi4-XLaXTi3O12 /Ru capacitors by post-annealing of Ru films,
10th European Meeting on Ferroelectricity,
No. S18-5,
2003.
-
S.Kikuchi,
H.Ishiwara.
Preparation of Si-added SrBi2Ta2O9 ferroelectric thin films by RF magnetron sputtering at high temperature,
10th European Meeting on Ferroelectricity,
No. S18-6,
2003.
-
B-E.Park,
H.Ishiwara.
Fabrication and characterization of (Bi,La)4Ti3O12 films using LaAlO3 buffer layers for MFIS structures,
10th European Meeting on Ferroelectricity,
No. S18-8,
2003.
-
Y.Kawashima,
H.Ishiwara.
Formation of ultrathin SrBi2Ta2O9 films using protective layers,
10th European Meeting on Ferroelectricity,
No. S18-11,
2003.
-
K.Aizawa,
H.Ishiwara.
Low voltage operation of ferroelectric capacitors using Sr1-XPr2X/3Bi2Ta2O9 thin films,
10th European Meeting on Ferroelectricity,
No. S18-A01,
2003.
-
B-E.Park,
H.Ishiwara.
Formation of LaAlO3 films on Si(100) substrates using molecular beam deposition,
Jpn. J. Appl. Phys.,
Vol. 82,
No. 8,
2003.
-
S.Yamamoto,
T.Ishikawa,
T.Fuchigami,
T.Furukawa,
K.Aizawa,
H.Ohki,
S.Kikuchi,
B-E.Park,
H.Hoko,
T.Kuroiwa,
H-S.Kim,
B-J.Koo,
H.Isjiwara,
HIROSHI ISHIWARA.
Fabrication of 1T2C-type ferroelectric memory array with sense amplifiers,
10th European Meeting on Ferroelectricity,
No. S03-18,
2003.
-
田渕良志明,
田村哲朗,
鉾宏真,
有本由弘,
石原宏.
シリケート添加BIT系強誘電体薄膜の特性評価,
第50回応用物理学関係連合講演会,
No. 28a-R-10,
2003.
-
田村哲朗,
鉾宏真,
石原宏.
ゾルゲルPZTにおけるシリケート添加効果,
第50回応用物理学関係連合講演会,
No. 28p-R-2,
2003.
-
鉾宏真,
石原宏.
ゾルゲル法で形成したBi4-xLaxTi3O12強誘電体薄膜の特性改善,
第50回応用物理学関係連合講演会,
No. 29a-R-9,
2003.
-
田村哲朗,
鉾宏真,
有本由弘,
石原宏.
シリケート添加ゾルゲルPZTの特性評価,
第64回応用物理学会学術講演会,
No. 1p-V-4,
2003.
-
大木博,
石原宏.
最適化された下部電極上でのBi4-xLaxTi3O12薄膜の特性改善,
第49回応用物理学関係連合講演会,
No. 29a-ZA-11,
2002.
-
T.Kijima,
H.Ishiwara.
Ultra-thin ferroelectric films modified by Bi2SiO5,
Ferroelectrics,
Vol. 271,
pp. 289-295,
2002.
-
S-K.Kang,
H.Ishiwara.
Memory retention characteristics of MFMIS structure using SBT and Al2O3 buffer layer,
Ferroelectrics,
Vol. 273,
pp. 101-106,
2002.
-
X.Wang,
H.Ishiwara.
Surface decoration for sol-gel derived ferroelectric Pb(Zr0.52Ti0.48)O3 thin films,
Key Engineering Materials,
Vol. 228-229,
pp. 57-62,
2002.
-
S.Ohmi,
S.Akama,
A.Kikuchi,
I.Kashiwagi,
C.Ohshima,
J.Taguchi,
H.Yamamoto,
K.Sato,
M.Takeda,
H.Ishiwara,
H.Iwai.
Rare earth metal oxides for high-k gate insulator,
Electrochem. Soc. Proc. (9th Intern. Sympo. on Silicon Materials Science and Technology),
Vol. 2002-2,
pp. 376-387,
2002.
-
T.Kijima,
H.Ishiwara.
Si-substituted ultrathin ferroelectric films,
Jpn. J. Appl. Phys,
Vol. 41,
No. 6B,
pp. 716-719,
2002.
-
H.Ishiwara,
S.Yamamoto.
A novel data writing method in a 1T2C-type ferroelectric memory,
Facta Universitatis (Nis) - Elec. Energ,
Vol. 15,
No. 1,
pp. 81-92,
2002.
-
T.Tamura,
Y.Arimoto,
H.Ishiwara.
A new circuit simulation model of ferroeletric capacitors,
Jpn. J. Appl. Phys,
Vol. 41,
No. 4B,
pp. 2654-2657,
2002.
-
S.Ogasawara,
H.Ishiwara.
Fabrication and characterization of 1T2C-type ferroelectric memory cell with local interconnections,
Jpn. J. Appl. Phys.,
Vol. 41,
No. 11B,
pp. 6895-6898,
2002.
-
S-K.Kang,
H.Ishiwara.
Characteristics of LaAlO3 as insulating buffer layers of ferroelectric-gate FETs,
Jpn. J. Appl. Phys.,
Vol. 41,
No. 11B,
pp. 6899-6903,
2002.
-
T.Kijima,
Y.Kawashima,
Y.Idemoto,
H.Ishiwara.
Effect of high-pressure oxygen annealing on Bi2SiO5-added ferroelectric thin films,
Jpn. J. Appl. Phys.,
Vol. 41,
No. 10B,
pp. 1164-1166,
2002.
-
Y.Fujisaki,
H.Ishiwara.
Al2O3/Si3N4 buffer layer for high performance MFIS (metal-ferroelectric-insulator-semiconductor) transistors,
Mater. Res. Soc. Sympo. Proc.,
Vol. 688,
pp. 377-382,
2002.
-
X.Wang,
H.Ishiwara.
Properties of ferroelectric Pb(Zr,Ti)O3-SiO2-B2O3 glass-ceramic thin films derived by sol-gel method,
Ferroelectrics,
Vol. 271,
pp. 3-8,
2002.
-
K.Aizawa,
H.Ishiwara.
Memory effect in ferroelectric-gate field effect transistors using 0.1-μm-thick-silicon-on-insulator substrates,
Ferroelectrics,
Vol. 271,
pp. 173-178,
2002.
-
T.Sato,
T.Kuroiwa,
K.Sugawara,
H.Ishiwara.
Preparation of Bi3.25+xLa0.75Ti3O12+y film on ruthenium electrodes,
Jpn. J. Appl. Phys,
Vol. 41,
No. 4A,
pp. 2105-2109,
2002.
-
S-K.Kang,
H.Ishiwara.
Data retention characteristics of metal-ferroelectric-metal-insulator-semiconductor diodes with SrBi2Ta2O9 ferroelectrics and Al2O3 buffer layers,
Jpn. J. Appl. Phys,
Vol. 41,
No. 4A,
pp. 2094-2098,
2002.
-
Y.Fujisaki,
S.Ogasawara,
H. Ishiwara.
Advanced MFIS Structure with Al2O3/Si3N4 Stacked Buffer Layer,
7th Intern. Sympo. on Ferroic Domains and Mesoscopic Structures,
No. B1OP01,
2002.
-
Y.Kawashima,
T.Kijima,
H.Ishiwara.
Orientation control of (Bi,La)4Ti3O12 films by addition of various silicates and germanates,
2002 Intern. Conf. on Solid State Devices and Materials, Nagoya,
No. D-2-5,
2002.
-
S.Yamamoto,
H-S.Kim,
H.Ishiwara.
Proposal of a planar 8F2 1T2C-type ferroelectric memory cell,
2002 Intern. Conf. on Solid State Devices and Materials, Nagoya,
No. P10-8,
2002.
-
S.Ohmi,
I.Kashiwagi,
C.Ohshima,
J.Taguchi,
H.Yamamoto,
J.Tonotani,
H.Ishiwara,
H.Iwai.
Electrical characteristics of rare earth gate oxides improved by chemical oxide and long low temperature annealing,
2002 Intern. Conf. on Solid State Devices and Materials, Nagoya,
No. B-7-4,
2002.
-
B-E.Park,
H.Ishiwara.
Formation of BLT films on Si(100) structure using LaAlO3 buffer layers,
6th Euro. Conf. on Applications of Polar Dielectrics, Averio,
No. P-6,
2002.
-
K.Aizawa,
H.Ishiwara.
Characterization of BLT film formed on Pt electrode with (Cr,Ti)N/TiN/Ti barrier layers,
6th Euro. Conf. on Applications of Polar Dielectrics, Averio,
No. O-5,
2002.
-
Y.Fujisaki,
O.Ogasawara,
K.Aizawa,
H.Ishiwara.
MFIS FET with ultra thin Si3N4 buffer layer made by atomic nitrogen radicals.,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30G-MM-6P,
2002.
-
B-E.Park,
H.Ishiwara.
Fabrication of MFIS diodes using (Bi,La)4Ti3O12 and LaAlO3 buffer layers,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30G-MM-8P,
2002.
-
T.Tamura,
Y.Arimoto,
H.Ishiwara.
Simulation of retention proprety of ferroeletric memories,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30G-MM-11P,
2002.
-
S-K.Kang,
H.Ishiwara.
Characteristics of LaAlO3 as insulating buffer latyers of ferroelectirc-gate FETs,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30G-MM-14P,
2002.
-
S.Ogasawara,
H.Ishiwara.
Fabricatrion and characterization of 1T2C-type ferroeletric memory cell with local interconnection,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30G-IF-11P,
2002.
-
T.Kijima,
H.Ishiwara.
New line of solid solution systems of oxide ferroelectrics,
Fall Meeting of Mater. Res. Soc.,
No. U2.1,
2002.
-
H.Ishiwara.
Recent progress in ferroelectric-gate FETs,
Fall Meeting of Mater. Res. Soc.,
No. T4.5/U9.5,
2002.
-
H.Ishiwara.
Recent progress of materials and device structures in ferroelectric memories,
Intern. Semiconductor Technology Conf. 2002,
No. 43,
2002.
-
H.Ishiwara,
S.Yamamoto.
A novel data writing method in a 1T2C-type ferroelectric memory,
23rd Intern. Conf. on Microelectronics, Nis,
pp. 517-520,
2002.
-
H.Ishiwara.
Recent progress of ferroelectric memory,
Workshop on Frontiers in Electronics, St.Croix,
No. ULSI-4,
2002.
-
S.Kikuchi,
H.Ishiwara.
Preparation of Bi2SiO5-SrBi2Ta2O9 ferroelectric thin films by magnetron sputtering,
Fall Meeting of Mater. Res. Soc.,
No. U12.8,
2002.
-
Y.Fujisaki,
K.Iseki,
H.Ishiwara.
Pt/Bi3.25La0.75Ti3O12/Al2O3/Si3N4/Si MFIS structure with long retention characteristics,
Fall Meeting of Mater. Res. Soc.,
No. T4.7/U9.7,
2002.
-
B-J.Koo,
H.Ishiwara.
Characteristics of paired Bi(4-x)LaxTi3O12 capacitors array suitable for 1T2C-type FeRAM,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30G-IF-14P,
2002.
-
Y.Kawashima,
K.Kijima,
H.Ishiwara.
Orientation control of (Bi,La)4Ti3O12 thin films by addition of silicates and germanates,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 30H-TB-16P,
2002.
-
T.Kijima,
H.Ishiwara.
A new class of ferroeletircs suitable for 0.5V operation of non-volatile randon access memory,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 31A-TF9-3C,
2002.
-
Y.Fujisaki,
H.Ishiwara.
Al2O3/Si3N4 stacked insulator for advanced MOS FETs,
Intern. Joint Conf. on Application of Ferroeletrics, Nara,
No. 31C-FE-4C,
2002.
-
S.Yamamot,
H.Ishiwara.
Analysis of non-volatile latch circuits with ferroelectric-gate field effect transistors for low power and low voltage operation,
23rd Intern. Conf. on Micro-electronics, Nis,
pp. 589-592,
2002.
-
Y.Fujisaki,
H.Ishiwara.
The interface quality control in MFIS structures with the use of highly stable Si3N4 buffer layer,
ONR Workshop on Ferroelectric Semiconductor Interfaces, Kona,
No. 3b-2,
2002.
-
H.Ishiwara,
B-E.Park,
S-K.Kang.
MFIS devices with Al2O3 and LaAlO3 buffer layer,
ONR Workshop on Ferroelectric Semiconductor Interfaces, Kona,
No. 3b-1,
2002.
-
加藤一実,
石原宏.
ビスマス系層状強誘電体におけるSiO2系添加物の効果,
第21回電子材料研究討論会,
No. 2B06,
2002.
-
石原宏.
強誘電体、High-kゲート薄膜用Al2O3, LaAlO3耐酸化バリア膜,
応用物理学会結晶工学分科会,
No. 6,
2002.
-
石原宏.
強誘電体メモリの最近の動向,
日本学術振興会,
No. 7,
2002.
-
石原宏.
次世代強誘電体メモリプロジェクト,
新機能素子シンポジウム,
No. 6-2,
2002.
-
石原宏,
木島健.
新規強誘電体メモリ用薄膜の作製,
第31回応用物理学会スクールB,
No. 2,
2002.
-
藤崎芳久,
石原宏.
高誘電率バッファー層を用いたMFIS構造の界面特性,
電気学会,
2002.
-
山本修一郎,
井上進,
石原宏.
不揮発性強誘電体ラッチ回路の新構成法と低電圧動作解析,
電子情報通信学会,
No. SDM 2001-262,
2002.
-
小笠原悟,
石原宏.
1T2C型強誘電体メモリの作製及び評価,
電子情報通信学会,
No. SDM 2001-260,
2002.
-
井上進,
石原宏.
1T2C型強誘電体メモリアレイの特性評価,
第63回応用物理学会学術講演会,
No. 24p-P4-16,
2002.
-
金,
山本修一郎,
石原宏.
1T2C型強誘電体メモリの高集積化とSPICEによる動作解析,
第63回応用物理学会学術講演会,
No. 24p-P4-18,
2002.
-
井関邦江,
藤崎芳久,
石原宏.
Al2O3/Si3N4非晶質バッファー層上の(Bi,La)4Ti3O12配向制御,
第63回応用物理学会学術講演会,
No. 27a-P14-23,
2002.
-
會澤康治,
小林宗太,
石原宏.
SBT系強誘電体/Al2O3/Si構造MFISダイオードの電気的 特性評価,
第63回応用物理学会学術講演会,
No. 24p-P4-6,
2002.
-
古川泰助,
黒岩丈晴,
藤崎芳久,
佐藤剛彦,
石原宏.
MOCVD法によるRu膜の強誘電体メモリ電極への適用検討,
第63回応用物理学会学術講演会,
No. 25a-P6-4,
2002.
-
大木博,
石原宏.
Pt/CrTiN/TiN/Ti下部電極上のBi4-XLaXTi3O12薄膜の 強誘電体特性,
第63回応用物理学会学術講演会,
No. 27a-P14-22,
2002.
-
具本宰,
石原宏.
BLTキャパシタ対を持つ1T2C型強誘電体メモリの特性,
第63回応用物理学会学術講演会 ,
No. 27a-P14-18,
2002.
-
朴炳垠,
石原宏.
LaAlO3/Si構造上へのシリケート添加(Bi,La)4Ti3O12薄膜の形成,
第63回応用物理学会学術講演会 ,
No. 27a-P14-20,
2002.
-
川島良仁,
木島健,
石原宏.
Si化合物添加によるSBT強誘電体薄膜の特性変化,
第63回応用物理学会学術講演会 ,
No. 27a-P14-21,
2002.
-
井出本康,
宮原孝弘,
小浦延幸,
木島健,
石原宏.
Bi3.25La0.75(Ti,Si)3O12の結晶構造、物性と強誘電体特性,
第63回応用物理学会学術講演会 ,
No. 27a-P14-27,
2002.
-
田村哲朗,
有本由弘,
石原宏.
消極を考慮した強誘電体キャパシタモデル,
第49回応用物理学関係連合講演会 ,
No. 28a-ZA-7,
2002.
-
X.Wang,
H.Ishiwara.
Properties of ferroelecric (1-x)SrBi2Ta2O9-xBi4Ti3O12 solid-solution thin films derived by sol-gel method,
第49回応用物理学関係連合講演会 ,
No. 28p-ZA-6,
2002.
-
西岡浩,
石原宏.
スパッタSrBi2Ta2O9強誘電体薄膜のSr組成制御による強誘電特性改善と低温結晶化,
第49回応用物理学関係連合講演会,
No. 28p-ZA-8,
2002.
-
川島良仁,
木島健,
石原宏.
添加剤によりBIT系強誘電体薄膜の配向制御,
第49回応用物理学関係連合講演会 ,
No. 29a-ZA-4,
2002.
-
朴炳垠,
石原宏.
ゾルゲル法によるLaAlO3/Si構造上へのBLT(Bi,La)4Ti3O12薄膜の形成,
第49回応用物理学関係連合講演会,
No. 29a-ZA-8,
2002.
-
康昇国,
石原宏.
強誘電体ゲートFET用LaAlO3バッファ層の特性評価,
第49回応用物理学関係連合講演会,
No. 30a-ZA-5,
2002.
-
藤崎芳久,
小笠原悟,
石原宏.
ALD-Al2O3/radical-Si3N4高誘電率バッファー層を用いたMFIS構造,
第49回応用物理学関係連合講演会,
No. 30a-ZA-6,
2002.
-
會澤康治,
川島良仁,
石原宏.
Charge pumping法による強誘電体/Si構造の界面準位密度評価,
第49回応用物理学関係連合講演会,
No. 30a-ZA-8,
2002.
-
佐藤剛彦,
黒岩丈晴,
石原宏.
プラグ構造をもつMFMISデバイスへのBLT膜への適用検討,
第49回応用物理学関係連合講演会 ,
No. 30p-ZA-4,
2002.
-
小笠原悟,
石原宏.
局所配線を用いた1T2C型強誘電体メモリ,
第49回応用物理学関係連合講演会 ,
No. 30p-ZA-5,
2002.
-
具本宰,
石原宏.
1T2C型強誘電体メモリ用キャパシタ対の作製とデータディスターブ特性の評価,
第49回応用物理学関係連合講演会 ,
No. 30p-ZA-6,
2002.
-
山本修一郎,
石原宏.
FETのゲート容量を考慮した1T2C型強誘電体メモリの新規書込み法の提案と動作解析,
第49回応用物理学関係連合講演会 ,
No. 30p-ZA-7,
2002.
-
貴志真士,
藤崎芳久,
井関邦江,
石原宏,
徳光永輔.
(Sm,Sr)0.8Bi2.2Ta2O9を用いたMFIS構造の作成と評価,
第63回応用物理学会学術講演会,
No. 24p-P4-8,
2002.
-
小林宗太,
會澤康治,
石原宏.
窒素雰囲気中アニールによるBLT系強誘電体/Al2O3/Siダイオードの作製と電気的特性,
第63回応用物理学会学術講演会,
No. 24p-P4-9,
2002.
-
山本修一郎,
金,
石原宏.
1T2C型強誘電体メモリアレイにおける書込み・読み出しデータディスターブ低減法,
第63回応用物理学会学術講演会 ,
No. 24p-P4-17,
2002.
-
康昇国,
石原宏.
LaAlO3ゲート絶縁膜をバッファー層として作製したMFMIS構造の評価,
第63回応用物理学会学術講演会 ,
No. 24p-P4-19,
2002.
-
藤崎芳久,
井関邦江,
石原宏.
ALD-Al2O3/radical-Si3N4高誘電率バッファー層を用いたMFIS構造,
第63回応用物理学関係連合講演会,
No. 24p-P4-20,
2002.
-
菊地真,
石原宏.
RFマグトロンスパッタ法によるBi2SiO5-SrBi2Ta2O9強誘電体薄膜の作製,
第63回応用物理学関係連合講演会,
No. 27a-P14-3,
2002.
-
Y.Fujisaki,
K.Iseki,
H.Ishiwara.
Al2O3/Si3N4 stacked insulator for advanced MOS devices,
Fall Meeting of Mat. Res. Soc.,
No. N2.9,
2002.
-
X.Wang,
H.Ishiwara.
Low-temperature synthesis of SrBi2Ta2O9 thin films with Bi2SiO5-containing seed layers,
Jpn. J. Appl. Phys,
Vol. 41,
No. 12B,
pp. 1492-1494,
2002.
-
田村 哲朗,
鉾 宏真,
有本 由弘,
石原 宏.
ゾルゲルPZT膜におけるシリケート添加効果,
第63回応用物理学会学術講演会,
No. 26a-P10-7,
2002.
-
E.Tokumitsu,
Takeaki Isobe,
Takeshi Kijima,
Hiroshi Ishiwara.
Fabrication and Characterization of Metal- Ferroelectric-Metal-Insulator-Semiconductor (MFMIS) Structures Using Ferroelectric (Bi,La)4Ti3O12 Films,
Jpn. J. Appl. Phys,
Vol. 40,
No. 9B,
pp. 5576-5579,
Sept. 2001.
-
Eisuke Tokumitsu,
Kojiro Okamoto,
Hiroshi Ishiwara.
Low Voltage Operation of Nonvolatile Metal-Ferroelectric-Metal-Insulator-Semiconductor(MFMIS)-Field-Effect-Transistors(FETs) Using Pt/SrBi2Ta2O9/Pt/SrTa2O6/SiON/Si Structures,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 4B,
pp. 2917-2922,
Apr. 2001.
-
S.Imada,
E.Tokumitsu,
H.Ishiwara.
Ferroelectricity of YMnO3 Thin Films on Pt(111)/ Al2O3(0001)and Pt(111)/Y2O3(111)/Si(111) structures grown by Molwcular Beam Epitaxy,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 2A,
pp. 666-671,
Feb. 2001.
-
Bum-Ki Moon,
Hiroshi Ishiwara,
E.Tokumitsu,
M.Yoshimoto.
Characteristics of ferroelectric Pb(Zr,Ti)O3 films epitaxialy grown on CeO2(111)/Si(111) substrates,
Thin Solid Films,
Vol. 385,
pp. 307-310,
Jan. 2001.
-
E.Tokumitsu,
K.Okamoto,
H.Ishiwara.
Low voltage operation of nonvolatile metal-ferroelectric-metal-insulator-semiconductor(MFMIS)-field-effect-transistors(FETs) using Pt/SrBi2Ta2O9/Pt/SrTa2O6/SiON/Si structures,
Jpn. J. Appl.Phys.,
Vol. 40,
No. 4B,
pp. 2911-2916,
2001.
-
S-M.Yoon,
H.Ishiwara.
Memory operations of 1T2C-type ferroelectric memory cell with excellent data retention characteristics,
IEEE Trans. on Electron Devices,
Vol. 48,
No. 9,
pp. 2002-2008,
2001.
-
S.Imada,
T.Kuraoka,
E.Tokumitsu,
H.Ishiwara.
Ferroelectricity of YMnO3 thin films on Pt(111)/Al2O3(0001) and Pt(111)/Y2O3(111)/Si(111) structures grown by molecular beam epitaxy,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 2A,
pp. 666-671,
2001.
-
Y.Fujisaki,
T.Kijima,
H.Ishiwara.
High-performance metal-ferroelectric-insulator-semiconductor structure with a damage-free and hydrogen-free sillicon-nitride buffer layer,
Appl. Phys. Lett.,
Vol. 78,
No. 9,
pp. 1285-1287,
2001.
-
X.Wang,
H.Ishiwara.
Structural and electrical properties of ferroelectric PbZr1-xTixO3-SiO2 glass-ceramic thin films derived by the sol-gel method,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 3A,
pp. 1401-1407,
2001.
-
H.Ishiwara.
Current status and prospects of FET-type ferroelectric memories,
J. Semicon. Tech. & Sci.,
Vol. 1,
No. 1,
pp. 1-14,
2001.
-
S.Yamamoto,
T.Kato,
H.Ishiwara.
A novel simulation program with integrated circuit emphasis(SPICE) model of ferroelectric capacitors using Schmitt-trigger circuit,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 4B,
pp. 2928-2934,
2001.
-
會澤康治,
石原宏.
薄膜SOI基板上に作製した強誘電体ゲートFETの評価,
第48回応用物理学関係連合講演会,
No. 28p-ZX-3,
2001.
-
藤崎芳久,
木島健,
石原宏.
MFISトランジスタ用水素フリーSi3N4薄膜,
第48回応用物理学関係連合講演会,
No. 28a-ZX-7,
2001.
-
藤崎芳久,
木島健,
石原宏.
La添加Bi4Ti3O12薄膜中でのLaの結合状態,
第48回応用物理学関係連合講演会,
No. 30p-YA-15,
2001.
-
小笠原悟,
尹聖民,
石原宏.
1T2C型強誘電体ゲートFETの動作確認,
第48回応用物理学関係連合講演会,
No. 28-ZX-7,
2001.
-
井上進,
山本修一郎,
石原宏.
強誘電体ゲートFETを用いた不揮発性ラッチ回路の動作,
第48回応用物理学関係連合講演会,
No. 29p-YA-4,
2001.
-
康昇国,
石原宏.
SrBi2Ta2O9とAl2O3 バッファー層とを用いたMFMIS構造の評価,
第48回応用物理学関係連合講演会,
No. 28p-ZX-4,
2001.
-
S.Ogasawara,
S-M.Yoon,
H.Ishiwara.
Analysis of 1T2C-type ferroelectric memory cell in read-out operation,
13th Inern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. P2.3.1,
2001.
-
N.Ogata,
H.Ishiwara.
A model for high frequency C-V characteristics of ferroelelctric capacitors,
13th Inern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. P2.3.6,
2001.
-
山本修一郎,
平山智久,
石原宏.
強誘電体キャパシタシミュレーション支援LSIの設計,
電子情報通信学会2001年総合大会講演論文集・エレクトロニクス2 (2001),
No. C-12-33,
2001.
-
K.Aizawa,
H.Ishiwara.
Memory effect in ferroelectric-gate field effect transistors using 0.1μm-thick silicon-on-insulator substrates,
10th Intern. Meeting on Ferroelectrics, Madrid,
No. PS2C-54,
pp. 142,
2001.
-
Y.Fujisaki,
T.Kijima,
K.Aizawa,
S.Ogasawara,
H.Ishiwara.
Novel metal-ferroelectric-insulator-semiconductor transistor with long retention characteristics under low voltage operation,
10th International Meeting on Ferroelectrics, Madrid,
No. PS5A-46,
pp. 236,
2001.
-
S.K.Kang,
H.Ishiwara.
Memory retention characteristics of MFMIS structure using SBT and Al2O3 buffer layer,
10th Intern. Meeting on Ferroelectrics, Madrid,
No. PS5B-15,
pp. 241,
2001.
-
會澤康治,
川島良仁,
木島健,
石原宏.
新規強誘電体材料を用いた強誘電体ゲートFET,
第62回応用物理学会学術講演会,
No. 11p-T-4,
2001.
-
藤崎芳久,
石原宏.
MFISトランジスタ用Al2O3/radical-Si3N4多層構造膜,
第62回応用物理学会学術講演会,
No. 11p-T-2,
2001.
-
康昇国,
石原宏.
Al2O3ゲート絶縁膜をバッファー層として用いたMFMIS構造の評価,
第62回応用物理学会学術講演会,
No. 11p-T-5,
2001.
-
山本修一郎,
石原宏.
強誘電体を用いた不揮発性CMOSラッチ回路の新構成法と低電圧動作解析,
第62回応用物理学会学術講演会,
No. 11p-T-8,
2001.
-
木島健,
川島良仁,
石原宏.
新規強誘電体材料へのポストアニール効果,
第62回応用物理学会学術講演会,
No. 14p‐ZR-1,
2001.
-
B-E.Park,
H. Ishiwara.
Fabrication of MFIS diodes using sol-gel derived SBT film and LaAlO3 buffer layers,
Integrated Ferroelectrics,
Vol. 40,
No. 1-5,
pp. 201-209,
2001.
-
小笠原悟,
石原宏.
局所配線を用いた1T2C型強誘電体ゲートFETの作製 及び評価,
第62回応用物理学会学術講演会,
No. 11p-T-3,
2001.
-
S.Ogasawara,
S-M.Yoon,
H.Ishiwara.
Analysis of read-out operation in 1T2C-type ferroelectric memory cell,
Integrated Ferroelectrics,
Vol. 40,
No. 1-5,
pp. 83-92,
2001.
-
S-M. Yoon,
H. Ishiwara.
Data disturb characteristics of 1T2C ferroelectric memory array,
Integrated Ferroelectrics,
Vol. 40,
No. 1-5,
pp. 31-40,
2001.
-
T.Tamura,
Y.Arimoto,
H.Ishiwara.
Modeling of dynamic response of ferroelectric capacitors,
Integrated Ferroelectrics,
Vol. 39,
No. 1-4,
pp. 179-187,
2001.
-
T.Sato,
K.Sugawara,
T.Kijima,
H.Ishiwara.
Formation of ferroelectric thin films on ruthenium electrodes,
Integrated Ferroelectrics,
Vol. 39,
No. 1-4,
pp. 169-177,
2001.
-
E.Tokumitsu,
T.Isobe,
T.Kijima,
H.Ishiwara.
Preparation and characterization of (Bi,La)4Ti3O12 films by the sol-gel technique,
Mater. Res. Soc. Sympo. Proc.,
Vol. 655,
pp. CC13.9.1-CC13.9.6,
2001.
-
S-M.Yoon,
H.Ishiwara.
Write and read-out operation of novel 1T2C-type ferroelectric memory cells with an array structure,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 5A,
pp. L449-L452,
2001.
-
T.Kijima,
Y.Fujisaki,
H.Ishiwara.
Fabrication and characterization of Pt/(Bi,La)4Ti3O12/Si3N4/Si metal-ferroelectric-insulator-semiconductor structure for FET-type ferroelectric memory applications,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 4B,
pp. 2977-2982,
2001.
-
藤井俊成,
舟窪浩,
石原宏.
ダブルアルコキシド原料を用いた溶液気化MOCVD法によるSrBi2Ta2O9薄膜の作製(2),
第48回応用物理学関係連合講演会,
No. 30p-YA-1,
2001.
-
王旭升,
石原宏.
Properties of ferroelectric Pb(Zr1-xTi)O3-SiO2-B2O3 glass-ceramic thin films derived by sol-gel method,
第48回応用物理学関係連合講演会,
No. 31p-YA-1,
2001.
-
朴炳垠,
石原宏.
MBE法によるSi基板上へのLaAlO3膜の作製,
第48回応用物理学関係連合講演会,
No. 30a-YF-9,
2001.
-
森岡洋,
石原宏.
(Bi,Ta)4Ti3O12薄膜形成用ゾルゲル塗布溶液の合成と薄膜評価,
第48回応用物理学関係連合講演会,
No. 30p-YA-17,
2001.
-
西岡浩,
石原宏.
RFマグネトロンスパッタ法によるSrBi2Ta2O9強誘電体薄膜の作製,
第48回応用物理学関係連合講演会,
No. 30a-YA-6,
2001.
-
佐藤剛彦,
須賀原和之,
石原宏.
Ru電極上へのBi3.25+xLa0.75Ti3O12膜形成,
第48回応用物理学関係連合講演会,
No. 30p-YA-16,
2001.
-
田村哲朗,
有本由弘,
石原宏.
強誘電体キャパシタの分極反転速度を取り込んだシミュレーションモデル,
第48回応用物理学関係連合講演会,
No. 29p-YA-5,
2001.
-
平山智久,
山本修一郎,
石原宏.
1T2C型強誘電体メモリの周辺回路の設計,
電子情報通信学会2001年エレクトロニクスソサイエティ大会講演論文集2,
No. C-12-36,
2001.
-
大島亮介,
大見俊一郎,
朴炳垠,
石原宏,
岩井洋.
電子ビーム蒸着法によるZrO2薄膜成膜時における酸素導入の効果,
第62回応用物理学会学術講演会,
No. 12p-C-3,
2001.
-
朴炳垠,
石原宏.
MBE法によるSi基板上へのLaAlO3膜の作製,
第62回応用物理学会学術講演会,
No. 12p-C-2,
2001.
-
木島健,
田村哲朗,
石原宏.
新規強誘電体材料の大面積成膜,
第62回応用物理学会学術講演会,
No. 14p-ZR-3,
2001.
-
木島健,
石原宏.
強誘電体薄膜への各種誘電体添加効果,
第62回応用物理学会学術講演会,
No. 14p-ZR-2,
2001.
-
木島健,
川島良仁,
石原宏.
新規強誘電体材料へのポストアニール効果,
第62回応用物理学会学術講演会,
No. 14p-ZR-1,
2001.
-
田村哲朗,
有本由弘,
石原宏.
強誘電体の分極反転速度を考慮したデバイス動作評価,
第62回応用物理学会学術講演会,
No. 11p-T-7,
2001.
-
具本宰,
石原宏.
異なる膜厚を持つ1T2C型強誘電体メモリ用キャパシタの形成,
第62回応用物理学会学術講演会,
No. 11p-T-6,
2001.
-
佐藤剛彦,
黒岩丈晴,
石原宏.
Ru電極上Bi3.25La0.75Ti3O12+y膜の減圧中での結晶化,
第62回応用物理学会学術講演会,
No. 12a-2R-10,
2001.
-
西岡浩,
石原宏.
核発生層によるスパッタSrBi2Ta2O9強誘電体薄膜の強誘電性特性改善,
第62回応用物理学会学術講演会,
No. 12a-ZR-2,
2001.
-
具本宰,
尹聖民,
石原宏.
SPICE解析による強誘電体メモリアレイにおける読み出し方法の検討,
第48回応用物理学関係連合講演会,
No. 28p-ZX-10,
2001.
-
小篠団,
會澤康治,
石原宏.
SOI基板上へのMFISFET型マトリックス構造の作製と評価,
第48回応用物理学関係連合講演会,
No. 28p-ZX-9,
2001.
-
小粥光洋,
田村哲朗,
有本由弘,
石原宏.
強誘電体ゲートFETの減分極電界の影響,
第48回応用物理学関係連合講演会,
No. 28p-ZX-8,
2001.
-
木島健,
石原宏.
新規強誘電体薄膜の低温成長と表面モフォロジー,
第48回応用物理学関係連合講演会,
No. 28a-ZX-1,
2001.
-
尹聖民,
小笠原悟,
石原宏.
1T2C型強誘電体メモリアレイにおける動作特性の評価,
第48回応用物理学関係連合講演会 ,
No. 28p-ZX-6,
2001.
-
対馬明人,
尹聖民,
小笠原悟,
石原宏.
液体霧化成膜法を用いたMFMOS構造の作製,
第48回応用物理学関係連合講演会 ,
No. 28p-ZX-5,
2001.
-
X.Wang,
H.Ishiwara.
Surface decoration for the sol-gel- derived ferroelectric Pb(Zr0.52Ti0.48)O3thin films,
2nd Asian Meeting on Electronics Kawasaki,
No. IA05,
2001.
-
B.J.Koo,
H.Ishiwara.
Formation of paired Bi(4-x)LaxTi3O12 capacitors suitable for 1T2C-typed ferroelectric memory,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P55,
pp. 186-187,
2001.
-
石原宏.
FET型強誘電体メモリの現状,
第61回半導体・集積回路技術シンポジウム予稿集,
pp. 55-60,
2001.
-
石原宏.
学習する半導体回路-強誘電体を用いた自己学習回路,
第62回応用物理学会学術講演会,
No. 12a-N-2,
2001.
-
T.Kijima,
H.Ishiwara.
Ultra-thin ferroelectric film with new structure,
10th Intern. Meeting of Ferroelectricity, Madrid,
No. PS5A-30,
pp. 232,
2001.
-
X.Wang,
H.Ishiwara.
Properties of ferroelectric Pb(Zr,Ti)O3-SiO2-B2O3 glass-ceramic thin films derived by sol-gel-method,
10th Intern. Meeting of Ferroelectricity, Madrid,
No. PS2C-01,
pp. 129,
2001.
-
T.Tamura,
Y.Arimoto,
H.Ishiwara.
A new circuit simulation model of ferroelectric capacitors,
2001 Intern. Conf. on Solid State Devies and Materials, Tokyo,
No. LC-2-1,
pp. 528-529,
2001.
-
S.Ohmi,
C.Kobayashi,
E.Tokumitsu,
H.Ishiwara,
H.Iwai.
Low leakage La2O3 gate insulator film with EOT of 0.8-1.2nm,
2001 Intern. Conf. on Solid State Devies and Materials, Tokyo,
No. B-9-1,
pp. 496-497,
2001.
-
H.Morioka,
H.Ishiwara.
Orientation control in (Bi,La)4Ti3O12 thin films by preparation method of sol-gel precursor solution,
13th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. P2.2.7,
2001.
-
S-M.Yoon,
H.Ishiwara.
Memory operations and data disturb characteristics of 1T2C-type ferroelectric memory array,
13th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 5.1.5C,
2001.
-
T.Tamura,
Y.Arimoto,
H.Ishiwara.
Modeling of dynamic response of ferroelectric capacitors,
13th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. P1.2.2,
2001.
-
B-E.Park,
H.Ishiwara.
Fabrication of MFIS diodes using sol-gel derived SBT films and LaAlO3 buffer layers,
13th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. P1.1.2,
2001.
-
T.Kijima,
H.Ishiwara.
Novel ferroelectric materials with low crystallization temperature and excellent surface morphology,
13th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 2.3.5C,
2001.
-
X.Wang,
H.Ishiwara.
Improvement of electrical property of sol-gel-derived lead zirconate titanate thin films by multiple rapid thermal annealing,
Jpn. J. Appl. Phys.,
Vol. 40,
No. 12,
pp. 7002-7006,
2001.
-
石原宏.
強誘電体メモリの現状,
クライスターイオンビームプロセステクノロジー予稿集,
pp. 33-34,
2001.
-
Y.Fujisaki,
H.Ishiwara.
Al2O3/Si3N4 buffer layer for high performance MFIS transistors,
2001 Material Research Society Fall Meeting,
No. C11.4,
2001.
-
緒方信人,
石原宏.
MOCVD-Ir薄膜形成過程における酸素分圧の影響,
第62回応用物理学会学術講演会,
No. 13a-ZR-2,
2001.
-
N.Ogata,
H.Ishiwara.
Optimized MOCVD condition using Ir(EtCp)(cod) for formation of dense and smooth iridium films,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P25,
pp. 126-127,
2001.
-
T.Tamura,
Y.Arimoto,
H.Ishiwara.
Ferroelectric capacitor model for circuit simulation of FeRAM,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P20,
pp. 116-117,
2001.
-
S.Ogasawara,
H.Ishiwara.
1T2C-type ferroelectric memory using SBT capacitors and local interconnention,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P63,
pp. 202-203,
2001.
-
Y.Fujisaki,
T.Kijima,
K.Aizawa,
S.Ogasawara,
H.Ishiwara.
High performance buffer layer suitable for metal-ferroelectric-insulator-semicondoctor transistor with low voltage operation,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P61,
pp. 198-199,
2001.
-
S-K.Kang,
H.Ishiwara.
Electrical properities of Pt/SBT/Pt/LaAlO3/Si MFMIS structure,
1st Intern. Meeting on Ferroelectric Random Access Memories, Goteomba,
No. P54,
pp. 184-185,
2001.
-
T.Sato,
T.Kuroiwa,
H.Ishiwara.
Low pressure crystallization of Bi-La-Ti-O thin films,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P46,
pp. 168-169,
2001.
-
X.Wang,
H.Ishiwara.
Ferroelectric SrBi2Ta2O9-Bi4Ti3O12 composite thin films prepared by sol-gel method,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P40,
pp. 156-157,
2001.
-
Y.Nishioka,
H.Ishiwara.
Improvement of ferroelectric properities of SrBi2Ta2O9 thin films sputtered through a metal mask,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. P36,
pp. 148-149,
2001.
-
K.Kijima,
H.Ishiwara.
A novel solid solution exhibiting excellent ferroelectricity,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. WO3-1,
pp. 67-68,
2001.
-
H.Ishiwara.
Current status of ferroelectric memories,
1st Intern. Meeting on Ferroelectric Random Access Memories, Gotemba,
No. PL-3,
pp. 6-7,
2001.
-
E.Tokumitsu,
T.Isobe,
T.Kijima,
H.Ishiwara.
Fabrication and characterization of metal-ferroelectric-metal-insulator-semiconductor (MFMIS) structure using ferroelectric (Bi,La)4Ti3O12 films,
Jpn. J. Appl. Phys,
Vol. 40,
No. 9B,
pp. 5576-5578,
2001.
-
X.Wang,
H.Ishiwara.
Sol-gel derived ferroelectric Pb(Zr1-XTiX)O3-SiO2-B2O3 glass-ceramic thin films formed at relatively low annealing temperatures,
Jpn. J. Appl. Phys,
Vol. 40,
No. 9B,
pp. 5547-5550,
2001.
-
Y.Fujisaki,
T.Kijima,
H.Ishiwara.
High performance MFIS structure with sol-gel (Bi,La)4Ti3O12 ferroelectrics and Si3N4 buffer layer made by atomic nitrogen,
13th Intern. Sympo. on Integrated Ferroelectrics, Colorado Springs,
No. 9.1.2I,
2001.
-
H.Ishiwara.
Current status of ferroelectric memories,
Proc. of 2001 Intern. Conf. on Electrical, Electronics, Communication and Information (CECI2001), Jakarta,
No. IP-3,
pp. 9-16,
2001.
-
H.Ishiwara.
Current status of FET-type ferroelectric memories,
2001 Asia-Pasific Workshop on Fundamemtal and Application of Advanced Semiconductor Devices, Cheju,
No. 6.1,
pp. 197-204,
2001.
-
H.Ishiwara.
Current status of FET-type ferroelectric memories,
8th Intern. Workshop on Oxide Electronics, Osaka,
No. 0I-5,
2001.
-
H.Ishiwara.
Recent progress of ferroelectric memory materials and FET-type FeRAMs,
IUVSTA 15th Intern. Vaccum Congress, San Francisco,
No. EL-MoM6,
2001.
-
H.Ishiwara.
Current status and prospects of ferroelectric memories,
IEEE Intern. Electron Devices Meeting,
No. 33.1,
pp. 725-728,
2001.
-
B-K.Moon,
H.Ishiwara,
E.Tokumitsu,
M.Yoshimoto.
Characteristics of ferroelectric Pb(Zr,Ti)O3 films epitaxially grown on CeO2(111)/Si(111) substrates,
Thin Solid Films,
Vol. 385,
pp. 307-310,
2001.
-
T.Tamura,
A.Arimoto,
H.Ishiwara.
A parallel element model for simulation switching response of ferroelectric capacitors,
IEICE Trans. on Electronics,
Vol. 84-C,
No. 6,
pp. 785-790,
2001.
-
N.Ogata,
H.Ishiwara.
A model for high frequency C-V characteristics of ferroelectric capacitors,
IEICE Trans. on Electronics,
Vol. 84-C,
No. 6,
pp. 777-784,
2001.
-
S.Ogasawara,
S-M.Yoon,
H.Ishiwara.
Fabrication and characterzation of 1T2C-type ferroelectric memory cell,
IEICE Trans. on Electronics,
Vol. 84-C,
No. 6,
pp. 771-776,
2001.
-
B-E.Park,
H.Ishiwara.
Electrical properties of LaAlO3/Si and Sr0.8Bi2.2Ta2O9/LaAlO3/Si structure,
Appl. Phys. Lett.,
Vol. 79,
No. 6,
pp. 806-808,
2001.
-
B-E.Park,
H.Ishiwara.
Fabrication of PZT films on Si substrate by sol-gel method using Y2O3 buffer layers,
Integrated Ferroelectrics,
Vol. 33,
No. 1-4,
pp. 109-116,
2001.
-
H.Ishiwara.
Recent progress on FET-type ferroelectric memories,
Integrated Ferroelectrics,
Vol. 34,
No. 1-4,
pp. 11-20,
2001.
-
E. Tokumitsu,
D. Takahashi,
H. Ishiwara.
Characterization of Metal-Ferroelectric- (Metal-)Insulator-Semiconductor(MF(M)IS)Structures Using (Pb,La)(Zr,Ti)O3and Y2O3 Films,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 9B,
pp. 5456-5459,
Sept. 2000.
-
Sung-ming Yoon,
Eisuke Tokumitsu,
Hiroshi Ishiwara.
Ferroelectric Neuron Integrated Circuits using SrBi2Ta2O9-Gate FET's and CMOS Schmitt-Trigger Oscillators,
IEEE Transactions on Electron Devices,
Vol. 47,
No. 8,
pp. 1630-1635,
Aug. 2000.
-
Sung-ming YOON,
Eisuke TOKUMITSU,
Hiroshi ISHIWARA.
Improvement of Memory Retention Characteristics in Ferroelectric Neuron Circuits Using a Pt/ SrBi2Ta2O9/Pt/Ti/SiO2/Si Structure-Field Effect Transistor as a Synapse Device,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 4B,
pp. 2119-2124,
Apr. 2000.
-
Eisuke TOKUMITSU,
Gen FUJII,
Hiroshi ISHIWARA.
Electrical Properties of Metal-Ferroelectric-Insulator-Semiconductor(MFIS)-and Metal-Ferroelectric-Metal-Insulator-Semiconductor (MFMIS)-FETs Using Ferroelectric SrBi2Ta2O9 Film and SrTa2O6/SiON Buffer Layer,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 4B,
pp. 2125-2130,
Apr. 2000.
-
Eisuke Tokumitsu,
Koji Aizawa,
Kojiro Okamoto,
Hiroshi Ishiwara.
Impact of face-to-face annealing in preparation of sol-gel-derived SrBi2Ta2O9 thin films,
Appl. Phys. Lett.,
Vol. 76,
No. 18,
pp. 2609-2611,
Mar. 2000.
-
磯辺武揚,
木島健,
徳光永輔,
石原宏.
ゾルゲル法によるLaド-プBi4Ta3O12膜の配向性制御,
第61回応用物理学会学術講演会,
pp. 7a-G-10/II,
2000.
-
E. Tokumitsu,
T. Isobe,
T. Kijima,
H. Ishiwara.
Preparation and characterization of (Bi,La)4Ti3O12 films by the sol-gel technique,
Mater. Res. Soc. Sympo. (Ferroelectric Thin films IX),
pp. CC-13.9,,
2000.
-
T. Kijima,
Y. Fujisaki,
T. Isobe,
E. Tokumitsu,
H. Ishiwara.
New Pt/(Bi,La)4Ti3O12/Si3N4/Si MFIS structure for FET-type ferroelectric memories by the sol-gel method,
Mater. Res. Soc. Sympo. (Ferroelectric Thin films IX),
pp. CC-3.6,,
2000.
-
飯塚力巳,
會澤康治,
石原宏.
Face-to-face annealing法によるゾルゲルSBT薄膜の作製,
第61回応用物理学会学術講演会,
pp. 7p-G-6/II,
2000.
-
會澤康治,
石原宏.
Face-to-face annealing法によるゾルゲルSBT薄膜のTEM観察,
第61回応用物理学会学術講演会,
pp. 7p-G-5/II,
2000.
-
佐藤剛彦,
石原宏.
Ru電極上への強誘電体膜形成,
第61回応用物理学会学術講演会,
pp. 7p-G-4/II,
2000.
-
木島健,
磯辺武揚,
徳光永輔,
石原宏.
ゾルゲル法による(Bi,La)4Ti3O12/SiN/Si構造の作製,
第61回応用物理学会学術講演会,
pp. 7a-G-11/II,
2000.
-
朴炳垠,
石原宏.
ゾルゲル法によるLaAlO3/Si構造上へのSr0.8Bi2.2Ta2O9薄膜の形成,
第61回応用物理学会学術講演会,
pp. 7a-G-8/II,
2000.
-
藤井俊成,
舟窪浩,
石原宏.
ダブルアルコキシド原料を用いた溶液気化MOCVD法によるSrBi2Ta2O9薄膜の作製,
第61回応用物理学会学術講演会,
pp. 7a-G-7/II,
2000.
-
天野敦弘,
岡本浩次郎,
徳光永輔,
石原宏.
Pt/SrBi2Ta2O9/Pt/SrTa2O6/SiON/Si構造のデバイスパラメーターの検討,
第61回応用物理学会学術講演会,
pp. 6p-G-17/II,
2000.
-
康昇国,
石原宏.
SrBi2Ta2O9/(Pt)/Al2O3/Si構造MF(M)ISの特性評価,
第61回応用物理学会学術講演会,
pp. 6p-G-16/II,
2000.
-
田村哲郎,
小粥光洋,
有本由弘,
會澤康治,
石原宏.
SBTキャパシタの分極反転特性,
第61回応用物理学会学術講演会,
pp. 6p-G-8/II,
2000.
-
山本修一郎,
石原宏.
シュミットトリガ回路を用いた回路要素並列型強誘電体SPICEモデルの構築,
第61回応用物理学会学術講演会,
pp. 6a-G-11/II,
2000.
-
小篠団,
會澤康治,
石原宏.
SOI基板上へのMFISFET型マトリクス構造の作製と評価,
第61回応用物理学会学術講演会,
pp. 6a-G-10/II,
2000.
-
緒方直人,
石原宏.
強誘電体キャパシタの高周波C-Vモデル,
第61回応用物理学会学術講演会,
pp. 6a-G-9/II,
2000.
-
尹聖民,
小笠原悟,
石原宏.
保持と読み出し動作の機能を分離した1T2C構造の強誘電体メモリアレイの作製,
第61回応用物理学会学術講演会,
pp. 6a-G-8/II,
2000.
-
小笠原悟,
尹聖民,
石原宏.
機能分離型1T2C強誘電体ゲートFETの動作特性,
第61回応用物理学会学術講演会,
pp. 6a-G-7/II,
2000.
-
小粥光洋,
田村哲郎,
有本由弘,
會澤康治,
石原宏.
強誘電体ゲートFETの減分極電界の影響,
第61回応用物理学会学術講演会,
pp. 6a-G-4/II,
2000.
-
藤崎芳久,
石原宏.
原子状窒素を用いたSi(100)基板の直接窒化,
第61回応用物理学会学術講演会,
pp. 5a-ZD-3/II,
2000.
-
今田将吾,
徳光永輔,
石原宏.
強誘電体YMnO3薄膜を用いた強誘電体ゲートFETの作製,
第61回応用物理学会学術講演会,
pp. 5a-G-1/II,
2000.
-
王旭升,
石原宏.
Sol-gel prepared ferroelectric PZT glassceramic thin films for FeRAM aplications,
第61回応用物理学会学術講演会,
pp. 4p-G-3/II,
2000.
-
大島享介,
大見俊一郎,
徳光永輔,
岩井洋,
石原宏.
高誘電率材料ZrO2膜の特性とSr添加の効果,
第61回応用物理学会学術講演会,
pp. 3p-ZD-5/II,
2000.
-
柏木仁,
上杉尚史,
徳光永輔,
石原宏.
InXGa1-XAsをバッファー層としたBaMgF4膜のGaAs基板上への作製と評価 (III),
第47回応用物理学関係連合講演会,
pp. 31a-P18-29/II,
2000.
-
小笠原悟,
加藤匠,
高原淳,
徳光永輔,
石原宏.
機能分離型強誘電体ゲートFETのSPICEシミュレーション,
第47回応用物理学関係連合講演会,
pp. 31a-P18-28/II,
2000.
-
尹聖民,
川口直一,
徳光永輔,
石原宏.
MFMOS構造のFETにおけるメモリ保持特性の評価とデバイス構造の最適化,
第47回応用物理学関係連合講演会,
pp. 31a-P18-27/II,
2000.
-
高橋大輔,
徳光永輔,
石原宏.
Pt/PLZT/Pt/Y2O3/Siを用いたMFMIS構造の作製と評価,
第47回応用物理学関係連合講演会,
pp. 31a-P18-26/II,
2000.
-
加藤匠,
高原淳,
山本修一郎,
小笠原悟,
徳光永輔,
石原宏.
HSPICEによるトランジスタ型強誘電体メモリの動作解析,
第47回応用物理学関係連合講演会,
pp. 31a-P18-17/II,
2000.
-
神保武人,
藤井俊成,
磯辺武揚,
舟窪浩,
徳光永輔,
石原宏.
溶液気化MOCVD法により作製したSrBi2Ta2O9薄膜の評価と膜質の改善,
第47回応用物理学関係連合講演会,
pp. 30a-P11-31/II,
2000.
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天野敦弘,
岡本浩次郎,
徳光永輔,
石原宏.
SrBi2Ta2O9/Ir系導電膜/SiO2/SrからなるMFMIS構造の作製,
第47回応用物理学関係連合講演会,
pp. 30a-P11-29/II,
2000.
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今福周作,
岡本浩次郎,
徳光永輔,
石原宏.
ゾルゲル法による(SrXBa1-X)Bi2Ta2O9薄膜の作製,
第47回応用物理学関係連合講演会,
pp. 30a-P11-18/II,
2000.
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今田将吾,
倉岡拓也,
徳光永輔,
石原宏.
金属Mn及びラジカル酸素を用いた強誘電体YMnO3薄膜のMBE成長,
第47回応用物理学関係連合講演会,
pp. 30a-P11-16/II,
2000.
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岡本浩次郎,
天野敦弘,
會澤康治,
徳光永輔,
石原宏.
SrBi2Ta2O9/Pt/SrTa2O6/SiON/Si構造MFMIS-FETの特性評価(II),
第47回応用物理学関係連合講演会,
pp. 30a-P11-15/II,
2000.
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康昇国,
藤崎芳久,
石原宏.
窒素ラジカル源による窒化膜とSrBi2Ta2O9強誘電体を用いたMFIS構造の作製,
第47回応用物理学関係連合講演会,
pp. 30a-P11-11/II,
2000.
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藤井俊成,
神保武人,
舟窪浩,
徳光永輔,
石原宏.
Sr,Ta新原料を用いた溶液気化MOCVD法によるSBT薄膜の作製,
第47回応用物理学関係連合講演会,
pp. 30a-P11-10/II,
2000.
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飯塚力巳,
會澤康治,
徳光永輔,
石原宏.
Face-to-face annealing法により結晶化したゾルゲルSBT薄膜のBi組成比依存性,
第47回応用物理学関係連合講演会,
pp. 30a-P11-8/II,
2000.
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會澤康治,
岡本浩次郎,
徳光永輔,
石原宏.
Face-to-face annealing法によるゾルゲルSBT薄膜の形成と評価,
第47回応用物理学関係連合講演会,
pp. 30a-P11-7/II,
2000.
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Y. Fujisaki,
H. Ishiwara.
Dmage-free and hydrogen-free nitridation of silicon substrate by nitrogen radical source,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 11A,
pp. L1075-L1077,
2000.
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K. Aizawa,
H. Ishiwara.
Correlation between ferroelectricity and grain structures of face-to-face annealed strontium bismuth tantalate thin films,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 11B,
pp. L1191-L1193,
2000.
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K. Oshima,
E. Tokumitsu,
S. Ohmi,
H. Iwai,
H. Ishiwara.
Electrical characteristics of high dielectric constant ZrO2 thin films prepared by ultra high vacuum-electron beam evaporation method,
29th IUVSTA Intern. Workshop on Selective and Functional Film Deponsition Technologies as Applied to ULSI Technology,
pp. LNP-2,,
2000.
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S-M. Yoon,
H. Ishiwara.
A novel FET-type ferroelectric memory with excellent data retention characteristics,
Technical Digest of Intern. Electron Devices Meeting,
No. 13-6,
pp. 317-320,
2000.
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HIROSHI ISHIWARA.
Recent progress on FET-type ferroelectric memories,
12th Intern Sympo. on Integrated Ferroelectrics,
No. 130-I,
pp. 172,
2000.
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石原宏.
トランジスタ型強誘電体メモリの現状と展望,
FEDジャーナル,
Vol. 11,
No. 3,
pp. 52-66,
2000.
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HIROSHI ISHIWARA.
Current status and prospects of FET-type ferroelectric memories,
FED journal,
Vol. 11,
No. Supplement,
pp. 27-40,
2000.
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石原宏.
強誘電体メモリの現状と将来,
第20回武井セミナー講演集,
pp. 32-39,
2000.
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石原宏.
新しい薄膜・プロセス技術,
ブレークスルー,
No. 10月,
pp. 1,
2000.
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藤崎芳久,
石原宏.
原子状窒素を用いたSi基板のダメージフリー低温窒化技術,
電子情報通信学会、信学技報,
No. SDM2000-145,
pp. 21-25,
2000.
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徳光永輔,
岡本浩次郎,
石原宏.
SrBi2Ta2O9とSrTa2O6/SiONバッファ層を用いた強誘電体ゲートFETデバイスパラメータの最適化,
電子情報通信学会、信学技報,
No. ED2000-67,
pp. 37-42,
2000.
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今田将吾,
徳光永輔,
石原宏.
MBE法を用いた強誘電体YMnO3薄膜のSi(111)基板上への成長と強誘電体ゲートトランジスタへの応用,
電子情報通信学会、信学技報,
No. ED99-328,
pp. (SDM99-221),13-18,
2000.
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石原宏.
高誘電率/強誘電体ゲート絶縁膜の可能性,
応用物理,
Vol. 69,
No. 9,
pp. 1094-1099,
2000.
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石原宏.
強誘電体メモリの現状,
セラミックデータブック2000(工業製品技術協会),
pp. 183-186,
2000.
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石原宏.
トランジスタ型強誘電体メモリ,
電子材料,
No. 1月,
pp. 29-34,
2000.
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T. Kijima,
Y. Fujisaki,
H. Ishiwara.
Fabrication and characterization of Pt/(Bi,La)4Ti3O12/ Si3N4/Si MFIS structure for FET-type ferroelectric memory applications,
Ext. Abst. of Intern. Conf. on Solid State Device and Materials,
No. LC-1-3,
pp. 302-303,
2000.
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K. Aizawa,
K. Iizuka,
E. Tokumitsu,
H. Ishiwara.
Ferroelectric properties of face-to-face annealed Sr0.8BiXTa2O9 thin films,
12th Intern. Sympo. on Applications of Ferroelectrics,
pp. II-6-251,,
2000.
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S-M.Yoon,
E.Tokumitsu,
H.Ishiwara.
Adaptive-learning neuron circuit using ferroelectric-gate FETs,
12th Intern. Sympo. on. Integrated Ferroelectrics,
pp. 331,
2000.
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K. Aizawa,
E. Tokumitsu,
K. Okamoto,
H. Ishiwara.
Ferroelectric properties of sol-gel derived and face-to-face annealed SrBi2Ta2O9 thin films,
12th Intern. Sympo. on. Integrated Ferroelectrics,
pp. 259,
2000.
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B-E. Park,
E. Tokumitsu,
H. Ishiwara.
Fabrication of PZT films on Si substrates by sol-gel method using Y2O3 buffer layers,
12th Intern. Sympo. on. Integrated Ferroelectrics,
pp. 196,
2000.
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HIROSHI ISHIWARA.
Current status of FET-type ferroelectric memories,
12th Intern. Sympo. on Applications of Ferroelectrics,
pp. VII-1-1,,
2000.
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E. Tokumitsu,
D. Takahashi,
H. Ishiwara.
Characterization of metal-ferroelectric-(matal-)insulator- semiconductor(MF(M)IS) structures using (Pb,La)(Zr,Ti)O3 andY2O3 films,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 9B,
pp. 5456-5459,
2000.
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HIROSHI ISHIWARA.
Current status of fabrication and integration of ferroelectric-gate FET's,
Mater. Res. Soc. Sympo. Proc. (Ferroelectric Thin Film VIII),
Vol. 596,
pp. 427-436,
2000.
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S-M. Yoon,
E. Tokumitsu,
H. Ishiwara.
Ferroelectric neuron integrated circuits using SrBi2Ta2O9-gate FET's and CMOS Schmitt-trigger oscillators,
IEEE Trans. on Electron Devices,
Vol. 47,
No. 8,
pp. 1630-1635,
2000.
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HIROSHI ISHIWARA.
Current status of FET-type ferroelectric memories,
Proc. of 22nd Intern. Conf. on Microelectronics, Nis,
Vol. 2,
pp. 423-427,
2000.
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E. Tokumitsu,
G. Fujii,
H. Ishiwara.
Electrical properties of metal-ferroelectric-insulator- semiconductor(MFIS)- and metal-ferroelectric-metal-insulator-semiconductor(MFMIS)-FETs using ferroelectric SrBi2Ta2O9film and SrTa2O6/SiON buffer layer,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 4B,
pp. 2125-2130,
2000.
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S-M. Yoon,
E. Tokumitsu,
H. Ishiwara.
Improvement of memory retention characteristics in ferroelectric neuron circuits using Pt/SrBi2Ta2O9/Pt/Ti/SiO2/Si structure-field effect transistor as a synapse device,
Jpn. J. Appl. Phys.,
Vol. 39,
No. 4B,
pp. 2119-2124,
2000.
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S. Yamamoto,
T. Kato,
H. Ishiwara.
A novel SPICE model of ferroelectric capacitors using Schmitt trigger circuit,
Ext. Abst. of Intern. Conf. on Solid State Devices and Materials,
No. C-4-4,
pp. 270-271,,
2000.
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E. Tokumitsu,
K. Okamoto,
H. Ishiwara.
Nonvolatile metal-ferroelectric-metal-insulater-semiconductor(MFMIS)-FETs using Pt/SrBi2Ta2O9/Pt/SrTa2O6/SiON/Si structures operating at 3.5V,
Ext. Abst. of Intern. Conf. on Solid State Devices and Materials,
No. C-3-3,
pp. 260-261,,
2000.
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T. Kijima,
Y. Fujisaki,
H. Ishiwara.
New MFIS structure of MOCVD-Bi3.3La0.7Ti3O12 with silicon nitride buffer layer,
12th Intern. Sympo. on Applications of Ferroelectrics,
pp. I-5-130,,
2000.
-
Y. Fujisaki,
S-K. Kang,
H. Ishiwara.
High performance MFIS structure with silicon nitride buffer layer made by radical nitrogen source,
12th Intern. Sympo. on Applications of Ferroelectrics,
pp. I-5-118,,
2000.
-
K. Aizawa,
E. Tokumitsu,
K. Okamoto,
H. Ishiwara.
Impact of face-to-face annealing in preparation of sol-gel-derived SrBi2Ta2O9 thin films,
Appl.Phys.Lett.,
Vol. 76,
No. 18,
pp. 2609-2611,
2000.
-
Sung-ming Yoon,
Eisuke Tokumitsu,
Hiroshi Ishiwara.
Adaptive-Learning Neuron Integrated Circuits Using Metal-Ferroelectric (SrBi2Ta2O9)-Semiconductor (MFS) FETs,
IEEE Electron Device Letters,
Vol. 20,
No. 10,
pp. 526-528,
Oct. 1999.
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E.Tokumitsu,
Gen Fujii,
Hiroshi Ishiwara.
Nonvolatile ferroelectric-gate FETs using SrBi2Ta2O9/Pt/SrTa2O6/SiON/Si structures,
Appl. Phys. Lett.,
Vol. 75,
No. 4,
pp. 575-577,
July 1999.
-
Sung-ming Yoon,
Eisuke Tokumitsu,
Hiroshi Ishiwara.
An electrically modifiable synapse arrary composed of metal-ferroelectric-semiconductor (MFS) FETs using SrBi2Ta2O9 thin films,
IEEE Electron Device Lett.,
Vol. 20,
No. 5,
pp. 229-231,
May 1999.
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藤井巌,
徳光永輔,
石原宏.
Pt/SrBi2Ta2O9/Pt/SrTa2O6/SiON/Siの構造の作製と保持特性の評価,
第46回応用物理学関係連合講演会,
pp. 29p-L-3/II,
1999.
-
佐野春行,
高橋祐治,
神保武人,
舟窪浩,
徳光永輔,
石原宏.
溶液気化MOCVD法を用いたSrBi2Ta2O9薄膜形成におけるプラズマ印加効果(II),
第46回応用物理学関係連合講演会,
pp. 29a-L-9/II,
1999.
-
モハンマッド・ムスタファ・サリナント,
今田将吾,
正力重仁,
朴炳垠,
徳光永輔,
石原宏.
Y2O3/Si上に成長した強誘電体薄膜の断面TEM観察,
第46回応用物理学関係連合講演会,
pp. 29p-K-19/II,
1999.
-
今田将吾,
正力重仁,
徳光永輔,
石原宏.
MBE法による強誘電体YMnO3薄膜の作製(IV),
第46回応用物理学関係連合講演会,
pp. 29p-K-17/II,
1999.
-
M. M. Sarinanto,
S. Imada,
S. Shoriki,
B-E. Park,
E. Tokumitsu,
H. Ishiwara.
TEM observation of ferroelectric films grown on sillicon using Y2O3 buffer layer(共著),
Intern. Sympo. on Integrated Ferroelectric,
Vol. 27,
pp. 81-91,
1999.
-
T. Jimbo,
H. Sano,
Y. Takahashi,
E. Tokumitsu,
H. Funakubo,
H. Ishiwara.
Effers of growth conditions and RF plasma on crystalline and electrical properties of SrBi2Ta2O9 thin films grown by liquid delivery MOCVD using a double alcholate(共著),
Intern. Sympo. on Integrated Ferroelectric,
Vol. 26,
pp. 109-117,
1999.
-
K. Aizawa,
H. Ishiwara.
Fabrication and characterization of MFSFET arrays using Al/BaMgF4/Si(111) structures(共著),
Intern. Sympo. on Integrated Ferroelectric,
Vol. 27,
pp. 1-8,
1999.
-
H.Ishiwara.
Current status of fabrication and integration of ferroelectric-gate FETs,
Mater. Res. Soc. Sympo.,
pp. Y16.7,
1999.
-
S-M. Yoon,
E. Tokumitsu,
H. Ishiwara.
Adaptive-learning neuron integrated circuits using metal-ferroelectric(SrBi2Ta2O9)-semiconductor (MFS) FETs(共著),
IEEE Electron Device Lett.,
Vol. 20,
No. 10,
pp. 526-528,
1999.
-
S-M. Yoon,
E. Tokumitsu,
H. Ishiwara.
An electrically modifiable synapse array composed of metal-ferroelectric-semiconductor (MFS) FETs using SrBi2Ta2O9 thin films(共著),
IEEE Electron Device Lett.,
Vol. 20,
No. 5,
pp. 229-231,
1999.
-
S-M. Yoon,
E. Tokumitsu,
H. Ishiwara.
Realization of adaptive learning function in a neuron circuit using metal/ferroelectric(SrBi2Ta2O9)/semiconductor field effect transistor (MFSFET)(共著),
Jpn. J. Appl. Phys.,
Vol. 38,
No. 4B,
pp. 2289-2293,
1999.
-
T. Jimbo,
H. Sano,
Y. Takahashi,
H. Hunakubo,
E. Tokumitsu,
H. Ishiwara.
Preparation of SrBi2Ta2O9 thin films by liquid-delivery metalorganic chemical vapor deposition using a double alcoholate source(共著),
Jpn. J. Appl. Phys.,
Vol. 38,
No. 11,
pp. 6456-6461,
1999.
-
E. Tokumitsu,
G. Fujii,
H. Ishiwara.
Nonvolatile ferroelectric-gate FETs using SrBi2Ta2O6/Pt/SrTa2O6/SiON/Si structures(共著),
Appl. Phys. Lett.,
Vol. 75,
No. 4,
pp. 575-577,
1999.
-
S. Imada,
S. Shouriki,
E. Tokumitsu,
H. Ishiwara.
Molecular beam epitaxial growth of YMno3 films on Si(111) substrates for ferroelectric-gate FET applications(共著),
Proc. of Intern. Sympo. on Future of Intellectual Integrated Electronics,
pp. 371-376,
1999.
-
E. Tokumitsu,
Y. Takahashi,
H. Ishiwara.
Preparation and characterization of Bi2VO5.5 films by MOD method(共著),
Mater. Res. Soc. Sympo. Proc.,
Vol. 541,
pp. 555-559,
1999.
-
S. Imada,
S. Shouriki,
E. Tokumitsu,
H. Ishiwara.
MBE growth of ferroelectric YMnO3 thin films on Si(111) using Y2O3 buffer layers(共著),
Mater. Res. Soc. Sympo. Proc.,
Vol. 541,
pp. 585-589,
1999.
-
正力重仁,
今田将吾,
徳光永輔,
石原宏.
Y2O3バッファ層を用いたMF(M)IS構造の作製,
第46回応用物理学関係連合講演会,
pp. 31a-K-10/II,
1999.
-
H.Ishiwara.
Current status and prospects of FET-type ferroelectric memories,
57th Device Reseach Conf. Digest,
pp. 6-9,
1999.
-
H.Ishiwara.
Adaptive-learning neurochips using ferroelectric thin films,
Mater. Res. Soc. Sympo.,
pp. X2.2,
1999.
-
H.Ishiwara,
E.Tokumitsu,
G.Fujii.
Optimization of buffer layers and device structures in ferroelectric-gate FETs,
Ext. Abstracts of 9th US-Japan Seminar on Dielectric and Piezoelectric Ceramics,
pp. 219,
1999.
-
朴炳垠,
高橋大輔,
徳光永輔,
石原宏.
ゾルゲル法によるPZT/Y2O3/Si構造の作製(2),
第46回応用物理学関係連合講演会,
pp. 30p-K-7/II,
1999.
-
尹聖民,
徳光永輔,
石原宏.
SrBi2Ta2O9/Si構造のMFSFETを用いたニューロン集積回路の適応学習機能,
第46回応用物理学関係連合講演会,
pp. 29p-L-15/II,
1999.
-
高橋祐治,
佐野春行,
神保武人,
舟窪浩,
徳光永輔,
石原宏.
溶液気化MOCVD法によるSi基板上へのBi2SiO5薄膜の作製(2),
第46回応用物理学関係連合講演会,
pp. 29p-L-5/II,
1999.
-
柏木仁,
上杉尚史,
徳光永輔,
石原宏.
InXGa1-XAsをバッファー層としたBaMgF4膜のGaAs基板上への作製と評価(II),
第60回応用物理学会学術講演会,
pp. 4a-A-7/II,
1999.
-
今田将吾,
徳光永輔,
石原宏.
MBE法による強誘電体YMnO3薄膜の作製(V),
第60回応用物理学会学術講演会,
pp. 4a-A-2/II,
1999.
-
加藤匠,
山本修一郎,
徳光永輔,
石原宏.
強誘電体の過渡応答SPICEモデル(II),
第60回応用物理学会学術講演会,
pp. 4a-A-1/II,
1999.
-
高原淳,
徳光永輔,
石原宏.
機能分離型強誘電体ゲートFETの作製,
第60回応用物理学会学術講演会,
pp. 3p-A-19/II,
1999.
-
尹聖民,
徳光永輔,
石原宏.
SrBi2Ta2O9薄膜を用いた強誘電体ニューロン回路の適応学習機能,
第60回応用物理学会学術講演会,
pp. 3p-A-17/II,
1999.
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石原宏.
強誘電体ゲートFETの現状と展望,
Challenge of Intelligence for Future BREAK THROUGH,
No. 160,
pp. 7-10,
1999.
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石原宏.
第11回集積強誘電体会議報告,
電子工業月報,
No. 440, 6月号,
pp. 28-32,
1999.
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石原宏.
Si基板上への強誘電体薄膜の形成,
電気化学会 第66回大会,
pp. 特3G21,
1999.
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石原宏,
徳光永輔,
尹聖民.
適応学習型強誘電体メモリ,
第46回応用物理学関係連合講演会,
pp. 28p-YK-7,
1999.
-
E. Tokumitsu,
S-M. Yoon,
H. Ishiwara.
Fabrication and characterization of neuron circuits using ferroelectric-gate transistors,
応用物理シリコンテクノロジー研究会,
1999.
-
S-M. Yoon,
A. Amano,
E. Tokumitsu,
H. Ishiwara.
Nonvolatile ferroelectric memory FET using Pt/SrBi2Ta2O9/Pt/SiO2/Si structure,
Abstructs of 1999 Joint Intern. Meeting of Electrochem. Soc. Sympo.,
pp. 1060,
1999.
-
E. Tokumitsu,
G. Fujii,
H. Ishiwara.
Electrical properties of MFIS- and MFMIS-FETs using ferroelectric SrBi2Ta2O9 film and SrTa2O6/SiON buffer layer,
Ext. Abstructs of Intern. Conf. on Solid State Devices and Materials,
No. C-10-2,
pp. 404-405,
1999.
-
S-M. Yoon,
E. Tokumitsu,
H. Ishiwara.
Neuron integrated circuits with adaptive learning function using ferroelectric(SrBi2Ta2O9)-gate FETs and CMOS Schmitt-trigger oscillators,
Ext. Abstracts of Intern. Conf. on Solid State Devices and Materials,
No. C-10-1,
pp. 402-403,
1999.
-
E. Tokumitsu,
A. Amano,
G. Fujii,
H. Ishiwara.
Electrical properties of Pt/SrBi2Ta2O9/Pt/SiO2/Si MFMIS structures and FETs with various area rations of MFM capacitor to Pt floating gate,
Technical report of IEICE,
pp. SDM99-95,
1999.
-
E. Tokumitsu,
G. Fujii,
H. Ishiwara.
Characterization of MFIS and MFMIS structures using SrBi2Ta2O9 film with SrTa2O6/SiON stacked buffer layer,
41st Electronic. Mater. Conf.,
pp. O-6,
1999.
-
E. Tokumitsu,
A. Amano,
G. Fujii,
H. Ishiwara.
Characterization of Pt/SrBi2Ta2O9/Pt/SiO2/Si MFMIS structures for ferroelectric-gate FET applications,
Abst. of '99 Asian Conf. on Electrochemistry,
No. 1PA10,
pp. 64,
1999.
-
會澤康治,
岡本浩次郎,
天野敦弘,
徳光永輔,
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19th Intern. Sympo. on Integrated Ferroelectrics,
19th Intern. Sympo. on Integrated Ferroelectrics,
Vol. 5D-209-C,
May 2007.
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HIROSHI ISHIWARA.
Recent researches for realizing high-density ferroelectric memories,
Spring Meeting of Mater. Res. Soc. (Sympo. I; Materials and Processes for Nonvolatile Memories),
Spring Meeting of Mater. Res. Soc. (Sympo. I; Materials and Processes for Nonvolatile Memories),
No. I8.5,
Apr. 2007.
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S.Fujisaki,
Y.Fujisaki,
H.Ishiwara.
Large ferroelectricity of thin poly (vinylidene fluoride- trifluoroethylene) copolymer films suitable for non-volatile memory applications,
Spring Meeting of Mater. Res. Soc. (Sympo. I; Materials and Processes for Nonvolatile Memories),
Spring Meeting of Mater. Res. Soc. (Sympo. I; Materials and Processes for Nonvolatile Memories),
No. I6.3,
Apr. 2007.
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H.Ishiwara.
Recent progress in ferroelectric memory technology,
8th Intern. Conf. on Solid-State and Integrated Circuit Technology,
8th Intern. Conf. on Solid-State and Integrated Circuit Technology,
No. C3.8 Proc. Part 2,
pp. 713-716,
Oct. 2006.
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S.K.Singh,
Y-K.Kim,
H.Funakubo,
H.Ishiwara.
Epitaxial BiFeO3 multiferroic thin films fabricated by chemical solution deposition,
IUMRS Intern. Conf. in Asia,
IUMRS Intern. Conf. in Asia,
Vol. 6-O-15,
Sept. 2006.
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Eisuke Tokumitsu,
Kensuke Itani,
Bum-Ki Moon,
Hiroshi Ishiwara.
Preparation of PbZrxTi1-xO3 Films on Si Substrates using SrTiO3 Buffer Layers,
Materials Research Society Symposium Proceedings,
Vol. 361,
pp. 427-432,
Nov. 1994.
国内会議発表 (査読有り)
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Lee Gwang Geun,
Yosihisa Fujisaki,
Hiroshi Ishiwara,
Eisuke Tokumitsu.
Low voltage operation of ferroelectric thin film transistors using P(VDF-TrFE) and IGZO,
第72回応用物理学会学術講演会,
Aug. 2011.
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Gwang-Geun Lee,
Sung-Min Yoon,
Joo-Won Yoon,
Yosihisa Fujisaki,
Hiroshi Ishiwara,
Eisuke Tokumitsu.
Flexible non-volatile memory TFT with IGZO-channel and ferroelectric polymer,
第71回応用物理学会学術講演会,
Sept. 2010.
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Gwang-Geun Lee,
Sung-Min Yoon,
Joo-Won Yoon,
藤崎芳久,
石原宏,
徳光永輔.
有機強誘電体P(VDF-TrFE)と無機酸化物半導体IGZOを用いた強誘電体ゲート薄膜トランジスタの作製と評価,
信学技報、SDM2010-16、OME2010-16(2010-04),
社団法人電子情報通信学会,
Vol. 110,
No. 15,
pp. 71-75,
Apr. 2010.
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尹珠元,
石原宏.
Characterics of MFIS structures based on poly (vinylidene fluoridetrifluoroethylene),
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
3a-K-4/II,
Sept. 2008.
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鐘志勇,
石原宏.
Enhanced ferroelectric properties of BiFexCr1-xO3 thin film formed by chemical solution deposition,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
2a-K-11/II,
Sept. 2008.
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田中敬人,
安念一規,
井端雅一,
石原宏.
平坦化強誘電体膜を用いたC60メモリトランジスタ,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
3a-K-11/II,
Sept. 2008.
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陸旭兵,
石原宏.
Improved electrical properties of metal-ferroelectric-insulator-silicon diodes using an epitaxial SrTio3 buffer layer,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
3a-K-10/II,
Sept. 2008.
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近藤佑美,
鉾宏真,
石原宏.
2T型強誘電体メモリのデータディスターブ特性IV,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
3a-K-8/II,
Sept. 2008.
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鉾宏真,
川嶋将一郎,
石原宏.
p-ch MFIS-FETとn-ch MOSFETからなる改良2T型FeRAMセルの電気特性,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
3a-K-7/II,
Sept. 2008.
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王冬きょう,
石原宏.
Sr2(Ta,Nb)2O7を強誘電体層に用いたMFISの評価,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
3a-K-5/II,
Sept. 2008.
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金正桓,
舟窪浩,
石原宏.
SrRuO3/Pt(111)とPt(111)の上にスパッタで形成されたBiFeO3膜の電気特性評価,
2008年(平成20年)秋季第69回応用物理学会学術講演会,
2008年(平成20年)秋季第69回応用物理学会学術講演会講演予稿集,
2p-K-1/II,
Sept. 2008.
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王冬きょう,
石原宏.
バッファ層を用いたMFISダイオードの評価,
2008年(平成20年)第55回応用物理学関係連合講演会,
2008年(平成20年)春季第55回応用物理学関係連合講演会講演予稿集,
30a-P14-31/II,
Mar. 2008.
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尹珠元,
大見俊一郎,
石原宏.
Ferroelectrics Characteristics of poly (vinylidene fluoride-trifluoroethylene) MFIS diodes,
2008年(平成20年)第55回応用物理学関係連合講演会,
2008年(平成20年)春季第55回応用物理学関係連合講演会講演予稿集,
30a-P14-30/II,
Mar. 2008.
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陸旭兵,
杉山芳弘,
石原宏.
Electrical Properties of ZrSiO4 doped Sr0.8Bi2.2Ta2O9 films,
2008年(平成20年)第55回応用物理学関係連合講演会,
2008年(平成20年)春季第55回応用物理学関係連合講演会講演予稿集,
30a-P14-11/II,
Mar. 2008.
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安念一規,
田中敬人,
井端雅一,
石原宏.
C60フラーレンを用いた強誘電体ゲートトランジスタ(II),
2008年(平成20年)第55回応用物理学関係連合講演会,
2008年(平成20年)春季第55回応用物理学関係連合講演会講演予稿集,
28a-ZE-14/III,
Mar. 2008.
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近藤佑美,
李月剛,
鉾宏真,
有本由弘,
石原宏.
2T型強誘電体メモリのデータディスターブ特性の評価III,
2008年(平成20年)第55回応用物理学関係連合講演会,
2008年(平成20年)春季第55回応用物理学関係連合講演会講演予稿集,
30a-P14-32/II,
Mar. 2008.
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鉾宏真,
李月剛,
丸山研二,
石原宏.
p-ch MFIS-FETとn-ch MOSFETからなる2T型FeRAMセルの電気特性評価,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-6/Ⅱ,
Sept. 2007.
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李月剛,
丸山研二,
鉾宏真,
有本由弘,
石原宏.
2T型強誘電体メモリのディスターブ特性の評価,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-7/Ⅱ,
Sept. 2007.
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井端雅一,
高下裕一郎,
石原宏.
カーボンナノチューブを用いた強誘電体ゲート電界効果トランジスタのモデリング,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-10/Ⅱ,
Sept. 2007.
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高下裕一郎,
井端雅一,
石原宏.
強誘電体ゲートカーボンナノチューブトランジスタの作製と真空中における評価,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-11/Ⅱ,
Sept. 2007.
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安念一規,
井端雅一,
石原宏.
C60フラーレンを用いた強誘電体ゲートトランジスタ,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-12/Ⅱ,
Sept. 2007.
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鍾志勇,
S.K.Singh,
丸山研二,
石原宏.
A Reduced Coercive Electric Field in Mn-substituted BiFeO3 Thin Films Formed by Chemical Solution Deposition Method,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 5p-ZL-2/Ⅱ,
Sept. 2007.
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藤崎寿美子,
石原宏,
藤崎芳久.
薄膜P(VDF-TrFE)コポリマーを用いた強誘電体キャパシタの高速動作,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4a-ZL-9/Ⅱ,
Sept. 2007.
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尹珠元,
石原宏.
Ferroelectric Characteristics of Patterned p(VDF-TrFE) Thin Films,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4a-ZL-10/Ⅱ,
Sept. 2007.
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岡沢昴,
丸山研二,
石原宏.
低比誘電率材料Bi2W0.9Mn0.1O6薄膜のMFISデバイスへの適用,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-3/Ⅱ,
Sept. 2007.
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陸旭兵,
鉾宏真,
丸山研二,
石原宏.
Electrical Properties of Metal-ferroelectric-Insulator-Silicon using HfTaO as Buffer Layer,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-4/Ⅱ,
Sept. 2007.
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池田武嗣,
田渕良志明,
田村哲朗,
鉾宏真,
有本由弘,
石原宏.
MSIF-FETを用いたNAND型強誘電体メモリ回路における書込みディスター,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
2007年(平成19年)秋季第68回応用物理学会学術講演会,
Vol. 4p-ZL-5/Ⅱ,
Sept. 2007.
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梅山将志,
岡沢昴,
石原宏,
丸山研二.
Bi2WO6添加Sr0.8Bi2.2Ta2O9を用いたMFIS-FETの動作特性,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-11/Ⅱ,
Mar. 2007.
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岡沢昴,
梅山将志,
丸山研二,
石原宏.
低比誘電率Bi2WO6薄膜のMFISへの適用,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-10/Ⅱ,
Mar. 2007.
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李月剛,
齋藤貢一,
丸山研二,
鉾宏真,
有本由弘,
石原宏.
2T型強誘電体メモリのディスターブ特性の評価,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-6/Ⅱ,
Mar. 2007.
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池田武嗣,
田渕良志明,
田村哲朗,
鉾宏真,
有本由弘,
石原宏.
MFIS-FETを用いたNAND型強誘電体メモリ回路における書込みディスターブ,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-5/Ⅱ,
Mar. 2007.
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藤崎寿美子,
石原 宏.
VDF/TrFE共重合体を用いたMFISダイオードの低電圧動作,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-7/Ⅱ,
Mar. 2007.
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井端雅一,
高下裕一郎,
石原宏.
カーボンナノチューブを用いた強誘電体ゲート電界効果トランジスタ,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-8/Ⅱ,
Mar. 2007.
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高下裕一郎,
白尾瑞基,
矢野亜季,
井端雅一,
石原宏.
強誘電体ゲートカーボンナノチューブトランジスタの作製と評価,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
2007年(平成19年)春季第54回応用物理学関係連合講演会,
Vol. 29a-SV-9/Ⅱ,
Mar. 2007.
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Sung-ming YOON,
Eisuke TOKUMITSU,
Hiroshi ISHIWARA.
Realization of adaptive learning function in a neuron circuit using metal/ferroelectric (SrBi2Ta2O9)/semiconductor field effect transisitor (MFSFET),
Jpn. J. Appl. Phys.,
Vol. 38-1,
No. 4B,
pp. 2289-2293,
Jan. 1999.
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Eisuke TOKUMITSU,
Kensuke ITANI,
Bum-Ki MOON,
Hiroshi ISHIWARA.
Crystalline Quality and Electrical Properties of PbZrxTi1-xO3 Thin Films Prepared on SrTiO3-Covered Si Substrates,
Japanese Journal of Applied Physics,
Vol. 34,
No. 9B,
pp. 5202-5206,
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国際会議発表 (査読なし・不明)
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H. Ishiwara.
Applications of bismuth-layered perovskite thin films to FET-type ferroelectric memories,
17th Intern. Sympo. on Integrated Ferroelectrics,
No. 3-1-I,
Apr. 2005.
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S. K. Singh,
H. Ishiwara.
Defect engineering for control of polarization fatigue in Bi4-XLaXTi3O12 film capacitors,
17th Intern. Sympo. on Integrated Ferroelectrics,
No. 3-4-C,
Apr. 2005.
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H. Hoko,
C. Aoki,
Y. Tabuchi,
T. Tamura,
K. Maruyama,
Y. Arimoto,
H. Ishiwara.
Electrical properties of Pt/BLT/HfSiON/Si structure for 1T-type ferroelectric memory,
17th Intern. Sympo. on Integrated Ferroelectrics,
No. 3-20-P,
Apr. 2005.
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Y. Tabuchi,
K. Aizawa,
T. Tamura,
K. Takahashi,
H. Hoko,
K. Kato,
Y. Arimoto,
H. Ishiwara.
Characterization of (Bi,Nd)4Ti3O12/HfO2/p-type Si structures for MFIS-FeRAM application,
17th Intern. Sympo. on Integrated Ferroelectrics,
No. 3-33-P,
Apr. 2005.
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S. Ohara,
K. Aizawa,
H. Ishiwara.
Fabrication and characterization of metal-ferroelectric- insulator-semiconductor devices with Pt/Pb5Ge3O11/HfO2/Si structures,
17th Intern. Sympo. on Integrated Ferroelectrics,
No. 2-14-C,
Apr. 2005.
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S. K. Singh,
H. Funakubo,
H. Uchida,
H. Ishiwara.
Structural and electrical properties of BiFeO3 thin films,
17th Intern. Sympo. on Integrated Ferroelectrics,
No. 7-5-C,
Apr. 2005.
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S.K.Singh,
H.Ishiwara.
Bismuth ferrite thin films for advanced FeRAM devices,
Intern. Conf. on Solid State Devices and Materials,
Vol. H-8-3,
pp. Ext. Abstracts pp.1036-1037,
Sept. 2005.
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Y.Tabuchi,
S.Hasegawa,
T.Tamura,
H.Hoko,
K.Kato,
Y.Arimoto,
H.Ishiwara.
Multi-bit programming for 1T-FeRAM by local polarization method,
Intern. Conf. on Solid State Devices and Materials,
Vol. H-8-4,
pp. Ext. Abstracts pp.1038-1039,
Sept. 2005.
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Mehmet Sait Bozgeyik,
Jeffery S. Cross,
Hiroshi Ishiwara,
Kazuo Shinozaki.
Ferroelectric and Electrical Properties of BaZrO3 Doped Sr0.8Bi2.2Ta2O9 Thin Films,
MRS Spring Meeting,
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F3.9,
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H.Ishiwara.
Recent progress in ferroelectric memory technology,
8th Intern. Conf. on Solid-State and Integrated Circuit Technology,
Vol. Proc. Part 2,
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pp. 713-716,
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S.K.Singh,
H.Ishiwara.
Excellent Room-Temperature Ferroelectricity in Mn-substituted BiFeO3 Thin Films Formed by Chemical Solution Deposition,
Spring Meeting of Mater. Res. Soc. (Sympo. G; Science and Technology of Nonvolatile Memories),
No. G3.3,
Apr. 2006.
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H.Ishiwara.
Ferroelectric FET Memory,
ITRS workshop on Assessment of Options for Emerging Research Memory Devices,
No. 2-4,
Apr. 2006.
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S.K.Singh,
Y-K.Kim,
H.Kuwabara,
H.Funakubo,
H.Ishiwara.
Strain effect due to the bottom electrodes in epitaxial BiFeO3 films formed by chemical solution deposition,
18th Intern. Sympo. on Integrated Ferroelectrics,
Vol. 9-281-C,
Apr. 2006.
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H.Ishiwara,
S.K.Singh.
Characteristics of BiFeO3 thin films prepared by chemical solution deposition,
18th Intern. Sympo. on Integrated Ferroelectrics,
Vol. 9-561-I,
Apr. 2006.
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S.K.Singh,
H.Ishiwara,
K.Maruyama.
Site-engineering of BiFeO3 thin films for obtaining ferroelectric properties at room temperature,
18th Intern. Sympo. on Integrated Ferroelectrics,
Vol. 6A-101-C,
Apr. 2006.
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Y.Tabuchi,
S.Hasegawa,
T.Tamura,
H.Hoko,
K.Kato,
Y.Arimoto,
H.Ishiwara.
Multi-bit programming for MFIS-FET using Pt/(Bi,Nd)4Ti3O12/HfO2/n-type Si structures,
18th Intern. Sympo. on Integrated Ferroelectrics,
Vol. 1-441-C,
Apr. 2006.
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S.K.Singh,
H.Ishiwara.
Enhanced electrical properties in Mn-doped Bi3.35La0.75Ti3O12 thin film,
Fall Meeting of Mater. Res. Soc. (Sympo. T ; Ferroelectric Thin Films XIII),
No. T3.52,
Nov. 2005.
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S.K.Singh,
H.Ishiwara.
Improved insulating properties in La-doped BiFeO3 films fabricated by chemical solution deposition,
Fall Meeting of Mater. Res. Soc. (Sympo. U ; Multiferroic materials),
No. U5.7,
Nov. 2005.
国内会議発表 (査読なし・不明)
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林大祐,
小菅博明,
大島憲昭,
石原宏.
CVD Ru薄膜を下部電極として用いたMo添加BLT強誘電体キャパシタの評価,
2005年(平成17年)春季第52回応用物理学関係連合講演会,
Vol. 29a-P1-1,
Mar. 2005.
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會澤康治,
田村哲朗,
有本由弘,
石原宏.
SBT/HfO2/Si構造デバイスにおけるデータ保持特性の温度依存性,
2005年(平成17年)春季第52回応用物理学関係連合講演会,
Vol. 31a-P4-2,
Mar. 2005.
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高橋憲弘,
會澤康治,
田村哲朗,
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石原宏.
(Bi,La)4Ti3O12/CVD-HfO2/p-Si 構造の作製と電気的特性評価,
2005年(平成17年)春季第52回応用物理学関係連合講演会,
Vol. 31a-P4-3,
Mar. 2005.
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小原秀一郎,
會澤康治,
石原宏.
Pt/Pb5Ge3O11/Pt構造とPt/Pb5Ge3O11/HfO2/Si構造デバイスの評価,
2005年(平成17年)春季第52回応用物理学関係連合講演会,
Vol. 31a-P4-4,
Mar. 2005.
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長谷川聡史,
田渕良志明,
加藤一実,
田村哲朗,
有本由弘,
石原宏.
(Bi,Nd)4Ti3O12/CVD HfO2構造を用いたMFISダイオードの作製と評価,
2005年(平成17年)春季第52回応用物理学関係連合講演会,
Vol. 31a-P4-9,
Mar. 2005.
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田渕良志明,
會澤康治,
田村哲朗,
高橋憲弘,
鉾宏真,
加藤一実,
有本由弘,
石原宏.
(Bi,Nd)4Ti3O12/HfO2/p-type Si 構造を用いたMFIS-FETの特性評価,
2005年(平成17年)春季第52回応用物理学関係連合講演会,
Vol. 31a-P4-12,
Mar. 2005.
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小原秀一郎,
田村哲朗,
石原宏.
Pt/(Sr0.8Bi2.2Ta2)x(Bi1.05FeO3)(1-x)/Pt構造デバイスの評価,
2005年(平成17年)秋季第66回応用物理学会学術講演会,
Vol. 9a-L-6,
Sept. 2005.
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田渕良志明,
長谷川聡史,
田村哲朗,
鉾宏真,
加藤一実,
有本由弘,
石原宏.
(Bi,Nd)4Ti3O12/HfO2/Si構造を用いたMFIS-FETの多値メモリ化の検討,
2005年(平成17年)秋季第66回応用物理学会学術講演会,
Vol. 9a-L-7,
Sept. 2005.
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長谷川聡史,
田渕良志明,
田村哲朗,
加藤一実,
有本由弘,
石原宏.
Pt/BNT((Bi,Nd)4Ti3O12)/HfO2/Siキャパシタのメモリ特性におけるBNT膜厚の影響,
2005年(平成17年)秋季第66回応用物理学会学術講演会,
Vol. 9a-L-8,
Sept. 2005.
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林大祐,
S. K. Singh,
小菅博明,
大島憲明,
石原宏.
CVD法により形成したRu電極を用いたBiFeO3キャパシタの評価,
2005年(平成17年)秋季第66回応用物理学会学術講演会,
Vol. 9p-L-12,
Sept. 2005.
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Young uk Song,
Shun-ichiro Ohmi,
Hiroshi Ishiwara.
Investigation of n-type properties of pentacene based on MOS diodes utilizing ultra thin metal interlayer,
春季第57回応用物理学関係連合講演会,
春季第57回応用物理学関係連合講演会予稿集,
応用物理学会,
p. 12-435,
Mar. 2010.
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Lee Gwang Geun,
Hoowon Yoon,
Yosihisa Fujisaki,
Hiroshi Ishiwara,
Eisuke Tokumitsu.
Ferroelectric Behaviors of P(VDF-TrFE) Thin Films on Transparent ITO Electrode,
第70回 応用物理学会学術講演会,
第70回 応用物理学会学術講演会,
11p-L-2,
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Joo-Won Yoon,
Shun-ichiro Ohmi,
Hiroshi Ishiwara.
Retention Characteristics of poly(vinylidenefluoride-trifluoroethylene)MFIS diodes,
春季第56回応用物理学関係連合講演会,
春季第56回応用物理学関係連合講演会予稿集,
応用物理学会,
Mar. 2009.
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J. S. Cross,
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Effect of Ba and Zr Doping in Sr0.8Bi2.2Ta2O9 Thin Films,
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No. PC07,
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尹珠元,
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石原宏.
Ferroelectrics Characteristics of poly (vinylidene fluoride - trifluoroethylene) MFIS diodes,
第55回応用物理学関係連合講演会講演予稿集,
第55回応用物理学関係連合講演会講演予稿集,
応用物理学会,
No. 2,
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尹珠元,
大見俊一郎,
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Characteristics of metal-ferroelectric-insulartor-semiconductor structures based on poly(vinylidene fluoride-trifluoroethylene),
電子情報通信学会SDM研究会,
電子情報通信学会技術研究報告,
電子情報通信学会,
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Mar. 2008.
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齋藤貢一,
石原宏.
シリケート添加によるSBT薄膜の比誘電率制御,
2006年(平成18年)秋季第67回応用物理学会学術講演会,
Vol. 31a-V-4/II,
Aug. 2006.
-
Byung-Eun Park,
Hiroshi Ishiwara.
Characterization of Polyvinylidene fluoride thin films by sol-gel method,
2006年(平成18年)秋季第67回応用物理学会学術講演会,
Vol. 30p-V-20/II,
Aug. 2006.
-
鉾宏真,
田渕良志明,
丸山研二,
石原宏.
SrBi2Ta2O9とHfSiONを強誘電体膜とバッファ層に用いたMFIS-FETの特性評価,
2006年(平成18年)秋季第67回応用物理学会学術講演会,
Vol. 31a-V-6/II,
Aug. 2006.
-
田渕良志明,
長谷川聡志,
田村哲朗,
鉾宏真,
加藤一実,
有本由弘,
石原宏.
弱電界におけるPt/(Bi,Nd)4Ti3O12/Ptキャパシタの疲労現象,
2006年(平成18年)秋季第67回応用物理学会学術講演会,
Vol. 31p-V-15/II,
Aug. 2006.
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梅山将志,
石原宏,
丸山研二,
田村哲朗.
Pt/Sr0.8Bi2.2Ta2O9/HfO2/Si構造MFISダイオードにおけるバッファ層膜厚の最適化,
2006年(平成18年)秋季第67回応用物理学会学術講演会,
Vol. 31a-V-5/II,
Aug. 2006.
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鉾宏真,
田渕良志明,
田村哲朗,
丸山研二,
石原宏.
HfSiON膜バッファ層を用いたPt/(Bi,La)4Ti3O12/HfSiON/Si構造の強誘電体ゲートFETの特性,
2006年(平成18年)春季第53回応用物理学関係連合講演会,
Vol. 25p-S-7/II,
Mar. 2006.
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小原秀一郎,
田村哲朗,
丸山研二,
石原宏.
Sr2(Ta,Nb)2O7/HfO2/Si構造デバイスの作製と評価,
2006年(平成18年)春季第53回応用物理学関係連合講演会,
Vol. 25p-S-12/II,
Mar. 2006.
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林大祐,
S.K.Singh,
大島憲昭,
丸山研二,
石原宏.
PtならびにRu電極上へのMnドープBiFeO3膜の形成,
2006年(平成18年)春季第53回応用物理学関係連合講演会,
Vol. 26p-S-5/II,
Mar. 2006.
-
田渕良志明,
長谷川聡志,
田村哲朗,
鉾宏真,
加藤一実,
有本由弘,
石原宏.
MFIS-FETのメモリウィンドウ測定による分極状態の評価,
2006年(平成18年)春季第53回応用物理学関係連合講演会,
Vol. 25p-S-8/II,
Mar. 2006.
-
金泫秀,
山本修一郎,
石川徹,
大木博,
石原宏.
1T2C型強誘電体メモリアレイの作製と評価,
第65回応用物理学会学術講演会講演予稿集,
Vol. 2,
pp. 496,
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Sung-ming YOON,
Yuji KURITA,
Eisuke TOKUMITSU,
Hiroshi ISHIWARA.
Electrical Characteristics of Neuron Oscillation Circuits Composed of MOSFETs and Complementary Unijunction Transistors,
Japanese Journal Applied Physics,
Vol. 37,
No. 3B,
pp. 1110-1115,
Mar. 1998.
その他の論文・著書など
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石原宏.
トランジスタ型強誘電体メモリ開発の現状と将来展望,
電子情報通信学会誌,
Vol. 88,
No. 4,
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石原宏.
トランジスタ型強誘電体メモリの現状と展望,
応用物理,
Vol. 75,
No. 5,
pp. 546-552,
May 2006.
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神保武人,
佐野春行,
舟窪浩,
徳光永輔,
石原宏.
プラズマプロセスを用いた溶液気化MOCVD法によるSrBi2Ta2O9薄膜の作製,
社団法人 電気通信学会 信学技報,
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pp. 7-12,
1999.
特許など
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石原宏,
丸山 研二,
川嶋 将一郎,
鉾 宏真.
強誘電体メモリ.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2008/03/25.
特願2008-078090.
2009/10/08.
特開2009-230835.
2009.
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石原宏,
丸山 研二,
川嶋 将一郎,
鉾 宏真.
強誘電体メモリセルおよび強誘電体メモリ.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2008/03/25.
特願2008-078089.
2009/10/08.
特開2009-230834.
2009.
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石原宏,
スシル クマル シン,
鉾 宏真,
杉山 芳弘.
半導体装置及びその製造方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2008/03/18.
特願2008-069338.
2009/10/01.
特開2009-224668.
2009.
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石原宏,
スシル クマル シン,
丸山 研二,
近藤 正雄.
半導体装置及びその製造方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2007/03/30.
特願2007-092413.
2008/10/16.
特開2008-251907.
2008.
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石原宏,
スシル クマル シン,
丸山 研二,
近藤 正雄.
半導体装置及びその製造方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2006/09/19.
特願2006-253569.
2008/04/03.
特開2008-078248.
2008.
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石原宏,
丸山 研二,
田村 哲朗,
鉾 宏真.
半導体素子及びそれを用いた半導体記憶装置、及びそのデータ書込み方法、データ読出し方法、及びそれらの製造方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2006/08/25.
特願2006-229896.
2007/08/23.
特開2007-214532.
2007.
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石原宏,
Singh Kumar Sushil,
丸山 研二,
近藤 正雄,
佐藤 桂輔.
半導体装置および半導体装置の製造方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2006/02/20.
特願2006-042921.
2007/08/30.
特開2007-221066.
2007.
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石原宏,
會澤康治,
青木 千恵子,
鉾 宏真,
田村 哲朗,
丸山 研二.
強誘電体キャパシタ、強誘電体メモリ、及びそれらの製造方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2005/10/18.
特願2005-302611.
2007/05/10.
特開2007-115733.
2007.
-
石原宏,
田渕 良志明,
高橋 憲弘,
長谷川 聡志,
會澤康治,
有本 由弘,
田村 哲朗,
鉾 宏真,
山口 正臣,
奈良 安雄.
強誘電体メモリ、多値データ記録方法、および多値データ読出し方法.
特許.
公開.
国立大学法人東京工業大学, 富士通株式会社.
2005/08/31.
特願2005-252504.
2006/04/20.
特開2006-108648.
2006.
学位論文
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